Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Quantification and Compensation of Unintentional Analyte Aggregation in Electrospray Sampling

Published

Author(s)

Mingdong M. Li, Suvajyoti S. Guha, Rebecca A. Zangmeister, Michael J. Tarlov, Michael R. Zachariah

Abstract

Electrospray (ES) sources are commonly used to introduce non-volatile materials (e.g. nanoparticles, proteins, etc.) in to the gas phase for characterization by mass spectrometry and ion mobility. Recent studies in our group using electrospray ion mobility to characterize protein aggregation in solution have raised the question as to whether the electrospray itself induces aggregation and thus corrupts the results. In this paper we develop a statistical model to determine the extent to which the ES process induces the formation of dimers and higher order aggregates. The model is validated through ES- differential mobility experiments using gold nanoparticles. The results show that the extent of droplet induced aggregation is quite severe, and that previously reported cut-off criterion are inadequate. We use the model in conjunction with experiment to show the true dimer concentration in a protein solution as a function of concentration. The model is extendable to any ES source-analytical system and to higher aggregation states.
Citation
Analytical Chemistry
Volume
45
Issue
7

Keywords

Electrospray, Aggregation, Protein

Citation

Li, M. , Guha, S. , Zangmeister, R. , Tarlov, M. and Zachariah, M. (2011), Quantification and Compensation of Unintentional Analyte Aggregation in Electrospray Sampling, Analytical Chemistry, [online], https://doi.org/10.1080/02786826.2011.566901 (Accessed May 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 30, 2011, Updated June 3, 2020