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Nanotechnology

Nanometrology

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Displaying 601 - 625 of 855

Real-Time Image Composition with Correction of Drift Distortion

September 20, 2011
Author(s)
Petr Cizmar, Andras Vladar, Michael T. Postek
In this article, a new scanning electron microscopy (SEM) image composition technique is de- scribed, which can significantly reduce drift-distortion related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images. Such

Effect of AlN Buffer Layer Properties on the Morphology and Polarity of GaN Nanowires Grown by Molecular Beam Epitaxy

September 8, 2011
Author(s)
Matthew D. Brubaker, Kristine A. Bertness, Norman A. Sanford, Albert Davydov, Igor Levin, Devin M. Rourke, Victor M. Bright
Low temperature AlN buffer layers grown by plasma-assisted Molecular Beam Epitaxy (MBE) on Si (111) were found to significantly affect the subsequent growth morphology of GaN nanowires. The AlN buffer layers exhibited nanowire-like columnar protrusions

Measuring agglomerate size distribution and dependence of localized surface plasmon resonance absorbance on gold nanoparticle agglomerate size using analytical ultracentrifugation

September 3, 2011
Author(s)
Justin M. Zook, Vinayak Rastogi, Robert I. MacCuspie, Athena M. Keene, Jeffrey A. Fagan
Nanoparticles frequently agglomerate when dispersed into relevant biological and environmental media, with the resulting change to the effective size distribution dramatically affecting the potential nanotoxicity and the absorbance for biosensor

Accurate Nanometer-Scale Imaging and Measurements with SEM

August 18, 2011
Author(s)
Bradley N. Damazo, Bin Ming, Premsagar P. Kavuri, Andras Vladar, Michael T. Postek
Scanning electron microscopes (SEMs) are incredibly versatile instruments for millimeter to nanometer scale imaging and measurements of size and shape. New methods to improve repeatability and accuracy have been implemented on the so-called Reference SEMs

Controlling Formation of Atomic Step Morphology on Micro-patterned Si (100)

August 9, 2011
Author(s)
Kai Li, Pradeep Namboodiri, Sumanth B. Chikkamaranahalli, Gheorghe Stan, Ravikiran Attota, Joseph Fu, Richard M. Silver
Micro scale features are fabricated on Si (100) surfaces using lithographic techniques and then thermally processed in an ultra high vacuum (UHV) environment. Samples are flash heated at 1200 °C and further annealed at 1050 °C for 18 hours. The surface

Advanced Image Composition with Intra-Frame Drift Correction

July 19, 2011
Author(s)
Petr Cizmar, Andras Vladar, Michael T. Postek
Drift Corrected Image Composition (DCIC) is a real-time technique that allows for acquiring significantly more accurate images compare to traditional slow or fast imaging methods.[Ref.] It is especially useful in nanometer-scale imaging and metrology

Dimensional Analysis of Through Silicon Vias Using the TSOM Method

July 12, 2011
Author(s)
Ravikiran Attota, Andrew Rudack
There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that provides

Electrical Characterization of Photoconductive GaN Nanowire Devices from 50 MHz to 33 GHz

July 1, 2011
Author(s)
Thomas M. Wallis, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Paul T. Blanchard, Norman A. Sanford, Kristine A. Bertness, Christpher Smith
The electrical response of two-port., photoconductive GaN nanowire devices was measured from 50 MHz to 33 GHz. The admittance of individual contacted nanowires showed an increase on the order of 10% throughout the measured frequency range after exposure to

Evaluating the characteristics of multiwall carbon nanotubes

July 1, 2011
Author(s)
John H. Lehman, M. Terrones, Elisabeth Mansfield, Katie Hurst, Vincent Muenier
During the past 20 years, multiwall carbon nanotubes (MWCNTs) have become an important industrial material. Hundreds of tons are produced each year. This review is a survey of the scientific literature, motivated by industrial requirements and guidelines

Graphene: Materials to devices

July 1, 2011
Author(s)
Jungseok Chae, Jeonghoon Ha, H. Baek, Young Kuk, Suyong S. Jung, Young J. Song, Nikolai B. Zhitenev, Joseph A. Stroscio, S.J. Woo, Y.-W. Son

Guided three-dimensional catalyst folding during Metal assisted Chemical Etching of Silicon

June 28, 2011
Author(s)
Konrad Rykaczewski, Owen J. Hildreth, Ching P. Wong, Andrei G. Fedorov, John H. Scott
In order to fabricate truly complex three-dimensional (3D) silicon nanostructures fabrication methods which expand beyond the concept of creation of straight 3D structures by direct extension of two dimensional (2D) patterns need to be developed. In recent

Quantitative Determination of Competitive Molecular Adsorption on Gold Nanoparticles Using Attenuated Total Reflectance-Fourier Transform Infrared Spectroscopy

June 28, 2011
Author(s)
De-Hao D. Tsai, Melissa Davila-Morris, Frank W. DelRio, Suvajyoti S. Guha, Vincent A. Hackley, Michael R. Zachariah
Surface-sensitive quantitative studies of competitive molecular adsorption on nanoparticles were conducted using a modified Attenuated attenuated Total total Reflectionreflectance-Fourier Transform transform Infrared infrared (ATR-FTIR) spectroscopy method

Parametric study of micropillar array solar cells

June 19, 2011
Author(s)
Heayoung Yoon, Yu A. Yuwen, Haoting Shen, Nikolas J. Podraza, Thomas E. Mallouk, Elizabeth C. Dickey, Joan A. Redwing, Christopher R. Wronski, Theresa S. Mayer
Micro/nano pillar arrays can be a promising architecture for high efficiency solar cells based on less expensive photovoltaic materials with short minority carrier diffusion lengths (Ln, p). To investigate design tradeoffs of the radial junction array

Imaging of nanoscale charge transport in bulk heterojunction solar cells

June 17, 2011
Author(s)
Behrang H. Hamadani, Nadine E. Gergel-Hackett, Paul M. Haney, Nikolai B. Zhitenev
We have studied the local charge transport properties of organic bulk heterojunction solar cells based on the blends of poly(3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) with a photoconductive atomic force microscope (PCAFM). We

PDH-locked, frequency-stabilized cavity ring-down spectrometer

June 16, 2011
Author(s)
Joseph T. Hodges, A. Cygan, Piotr Maslowski, Katarzyna E. Bielska, S. Wojtewicz, J. Domyslawska, Hisashi Abe, R.S. Trawinski, R. Ciurylo
We describe a high sensitivity and high spectral resolution laser absorption spectrometer based upon the frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) technique. We used the Pound-Drever-Hall (PDH) method to lock the probe laser to the high

Hydrodynamic Fractionation of Finite Size Nano Gold Clusters

June 15, 2011
Author(s)
De-Hao D. Tsai, Tae Joon Cho, Frank W. DelRio, Julian S. Taurozzi, Michael R. Zachariah, Vincent A. Hackley
We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission scanning

Comparison of segmentation algorithms for fluorescence microscopy images of cells

June 14, 2011
Author(s)
Alden A. Dima, John T. Elliott, James J. Filliben, Michael W. Halter, Adele P. Peskin, Javier Bernal, Marcin Kociolek, Mary C. Brady, Hai C. Tang, Anne L. Plant
Segmentation results from nine different segmentation techniques applied to two different cell lines and five different sets of imaging conditions were compared. Significant variability in the results of segmentation was observed that was due solely to

CAVITY OPTOMECHANICAL SENSORS

June 5, 2011
Author(s)
Houxun H. Miao, Kartik A. Srinivasan, Matthew T. Rakher, Marcelo I. Davanco, Vladimir A. Aksyuk
We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality factor
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