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Nanotechnology

Nanometrology

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Displaying 576 - 600 of 855

Polymer Dynamics in Constrained Geometries

February 1, 2012
Author(s)
Christopher Soles, Ryan Nieuwendaal, Huagen H. Peng
The wide-spread interest in the dynamical property of organic materials under strong states of confinement largely began with differential scanning calorimeter (DSC) measurements in the early 90's of the glass transition and heat capacity of glass forming

Direct Observation of Hydrogen Spillover in Ni-Loaded Pr-Doped Ceria

January 17, 2012
Author(s)
Vaneet Sharma, Peter A. Crozier, Renu Sharma, James B. Adams
Hydrogen-spillover in Ni-loaded Pr-doped ceria (PDC) was directly observed using an environmental transmission electron microscope (ETEM). Localized reduction of ceria in a H2 atmosphere was observed and attributed to gas-Ni-ceria interactions at the three

Size Measurement of Nanoparticles Using Atomic Force Microscopy, ASTM E2859-11

January 2, 2012
Author(s)
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike electron

Through-focus Scanning Optical Microscopy

December 31, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) method provides three-dimensional information (i.e. the size, shape and location) about micro- and nanometer-scale structures. TSOM, based on a conventional optical microscope, achieves this by acquiring and

Nanometrology Using Through-Focus Scanning Optical Microscopy Method

December 21, 2011
Author(s)
Ravikiran Attota, Richard M. Silver
We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is scanned

Three-dimensional Nanometrology with TSOM Optical Method

December 10, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement sensitivity using conventional optical microscopes; measurement sensitivities are comparable to what is typical when using scatterometry

TSOM Method for Nanoelectronics Dimensional Metrology

November 18, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquiring and

Carbon Nanotube Nucleation Driven by Catalyst Morphology Dynamics

November 14, 2011
Author(s)
Elena Pigos, Evgeni S. Penev, Morgana A. Ribas, Renu Sharma, Boris I. Yakobson, Avetik R. Harutyunyan
In situ observation of carbon nanotube nucleation process accompanied by catalyst particle dynamic morphology reconstruction is considered within a thermodynamic approach, and reveals the driving force for the liftoff—a crucial event in the nanotube growth

Fundamental Limits of Optical Patterned Defect Metrology

November 14, 2011
Author(s)
Richard M. Silver, Bryan Barnes, Martin Sohn, Hui Zhou, Jing Qin
The semiconductor manufacturing industry is now facing serious challenges in achieving defect detection rates with acceptable throughput and accuracy. With conventional bright-field and dark-field inspection methods now at their limits, it has become

Viscoelastic Property Mapping with Contact Resonance Force Microscopy

November 4, 2011
Author(s)
Jason P. Killgore, Donna C. Hurley, Dalia Yablon, Joseph Turner, Philip Yuya, Roger Proksch, Anil Gannepalli, Andy Tsou
We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonance

Method for Determining the Absolute Number Concentration of Nanoparticles from Electrospray

October 27, 2011
Author(s)
Mingdong M. Li, Suvajyoti S. Guha, Rebecca A. Zangmeister, Michael J. Tarlov, Michael R. Zachariah
We have developed a simple, fast, and accurate method to measure the absolute number concentration of nanoparticles in solution. The method combines electrospray-differential mobility analysis (ES-DMA) with a statistical analysis of droplet induced

Nanoscale Focused Ion Beam from Laser-cooled Lithium Atoms

October 26, 2011
Author(s)
Brenton J. Knuffman, Adam V. Steele, Jon Orloff, Jabez J. McClelland
To advance the capabilities of focused ion beam (FIB) technology, we have created a low-energy FIB from photoionized lithium atoms collected in a magneto-optical trap (MOT). This magneto-optical trap ion source relies on both the low temperature of the

High Frequency Characterization of Contact Resistance and Conductivity of Platinum Nanowires*

October 1, 2011
Author(s)
Kichul Kim, Paul Rice, Thomas M. Wallis, Dazhen Gu, SangHyun S. Lim, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Abstract— Individual platinum (Pt) nanowires (NWs) with 100 nm and 250 nm diameters, embedded in coplanar waveguide (CPW) structures are investigated. Three approaches for characterization of their contact resistance and conductivity at high frequencies
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