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Nanotechnology

Nanometrology

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Displaying 576 - 600 of 866

Tumor Necrosis Factor Interaction with Gold Nanoparticles

March 14, 2012
Author(s)
De-Hao D. Tsai, Sherrie R. Elzey, Frank W. DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael R. Zachariah, Athena M. Keene, Jeffrey D. Clogston, Vincent A. Hackley
We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spectroscopic

Electrospray Differential Mobility Analysis as an Orthogonal Tool to Size Exclusion Chromatography for Characterization of Protein Aggregates

March 12, 2012
Author(s)
Suvajyoti S. Guha, Joshua R. Wayment, Michael J. Tarlov, Michael R. Zachariah
The biopharmaceutical industry characterizes and quantifies aggregation of protein therapeutics using multiple analytical techniques to cross validate results. Here we demonstrate the use of electrospray-differential mobility analysis (ES-DMA), a gas-phase

Optical microscope angular illumination analysis

March 7, 2012
Author(s)
Ravikiran Attota
For high precision applications of optical microscopes, it is critical to achieve symmetrical angular illumination intensity at the sample plane, in addition to uniform spatial intensity achieved by Köhler illumination. In this paper, first we demonstrate

Transmission EBSD from 10 nm domains in a scanning electron microscope

March 1, 2012
Author(s)
Robert R. Keller, Roy H. Geiss
The spatial resolution of electron diffraction within the scanning electron microscope (SEM) has progressed from channelling methods capable of measuring crystallographic characteristics from 10 μm regions to electron backscatter diffraction (EBSD) methods

VCI Simulation with Semiconductor Device Models: Test Report

February 29, 2012
Author(s)
John Villarrubia
JMONSEL, an electron beam imaging simulator, has been modified to permit conducting regions of a sample to be designated as unconnected to an external source or sink of charge (floating) or, alternatively, to be connected with a user-specified relaxation

Quantification of ligand packing density on gold nanoparticles using ICP-OES

February 18, 2012
Author(s)
Sherrie R. Elzey, De-Hao D. Tsai, Savelas A. Rabb, Lee L. Yu, Michael R. Winchester, Vincent A. Hackley
In this study, a prototypical thiolated organic ligand, 3-mercaptopropionic acid (MPA), was conjugated on gold nanoparticles (AuNPs), and packing density was measured on an ensemble-averaged basis using inductively coupled plasma optical emission

Direct observation of nucleation and early stages of growth of GaN nanowires

February 15, 2012
Author(s)
Rosa E. Diaz, Renu Sharma, Karalee Jarvis, Qinglei Zhang, Subhash Mahajan
We report for the first time direct observations of the nucleation and early stages of growth of GaN nanowires. The nanowires were formed by exposing Au + Ga droplets to ammonia. The formation process was observed in situ, and controlled in real time using

Formation and structure of 360 and 540 degree domain walls in thin magnetic stripes

February 10, 2012
Author(s)
Youngman Jang, Samuel R. Bowden, Mark Mascaro, John Unguris, Caroline Ross
360˚, 540˚ and other complex transverse domain walls have been created in narrow Co wires connected to injection pads by cycling a magnetic field perpendicular to the wire length. The composite walls, formed by impingement of 180˚ transverse walls of

Polymer Dynamics in Constrained Geometries

February 1, 2012
Author(s)
Christopher Soles, Ryan Nieuwendaal, Huagen H. Peng
The wide-spread interest in the dynamical property of organic materials under strong states of confinement largely began with differential scanning calorimeter (DSC) measurements in the early 90's of the glass transition and heat capacity of glass forming

Direct Observation of Hydrogen Spillover in Ni-Loaded Pr-Doped Ceria

January 17, 2012
Author(s)
Vaneet Sharma, Peter A. Crozier, Renu Sharma, James B. Adams
Hydrogen-spillover in Ni-loaded Pr-doped ceria (PDC) was directly observed using an environmental transmission electron microscope (ETEM). Localized reduction of ceria in a H2 atmosphere was observed and attributed to gas-Ni-ceria interactions at the three

Size Measurement of Nanoparticles Using Atomic Force Microscopy, ASTM E2859-11

January 2, 2012
Author(s)
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike electron

Through-focus Scanning Optical Microscopy

December 31, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) method provides three-dimensional information (i.e. the size, shape and location) about micro- and nanometer-scale structures. TSOM, based on a conventional optical microscope, achieves this by acquiring and

Nanometrology Using Through-Focus Scanning Optical Microscopy Method

December 21, 2011
Author(s)
Ravikiran Attota, Richard M. Silver
We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is scanned

Three-dimensional Nanometrology with TSOM Optical Method

December 10, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement sensitivity using conventional optical microscopes; measurement sensitivities are comparable to what is typical when using scatterometry

TSOM Method for Nanoelectronics Dimensional Metrology

November 18, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquiring and
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