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Viscoelastic Property Mapping with Contact Resonance Force Microscopy

Published

Author(s)

Jason P. Killgore, Donna C. Hurley, Dalia Yablon, Joseph Turner, Philip Yuya, Roger Proksch, Anil Gannepalli, Andy Tsou

Abstract

We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: pixel-by-pixel point mapping and continuous scanning. With point mapping and low-velocity scanning, the relative loss and storage modulus values are in good agreement with time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.
Citation
Langmuir

Keywords

Atomic Force Microscopy, AFM, Contact Resonance Force Microscopy, Viscoelasticity

Citation

Killgore, J. , Hurley, D. , , D. , Turner, J. , Yuya, P. , Proksch, R. , Gannepalli, A. and Tsou, A. (2011), Viscoelastic Property Mapping with Contact Resonance Force Microscopy, Langmuir, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=909102 (Accessed June 21, 2024)

Issues

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Created November 4, 2011, Updated February 19, 2017