Killgore, J.
, Hurley, D.
, , D.
, Turner, J.
, Yuya, P.
, Proksch, R.
, Gannepalli, A.
and Tsou, A.
(2011),
Viscoelastic Property Mapping with Contact Resonance Force Microscopy, Langmuir, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=909102
(Accessed October 3, 2024)
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Viscoelastic Property Mapping with Contact Resonance Force Microscopy
Published
Author(s)
, , Dalia Yablon, Joseph Turner, Philip Yuya, Roger Proksch, Anil Gannepalli, Andy Tsou
Abstract
We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: pixel-by-pixel point mapping and continuous scanning. With point mapping and low-velocity scanning, the relative loss and storage modulus values are in good agreement with time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.Citation
Langmuir
Pub Type
Journals
Download Paper
Keywords
Atomic Force Microscopy, AFM, Contact Resonance Force Microscopy, Viscoelasticity
Citation
Issues
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Created November 4, 2011, Updated February 19, 2017