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Nanometrology

News and Updates

NIST Study Aims to Improve Utility of the Scanning Electron Microscope

Microwave Detectors and Multiplexing: NIST Researchers Help Astronomers Examine the Early Universe

NIST Scientists Develop Novel CT Scan Device for Integrated Circuits

Blog Posts

What To Do When Measurement Methods Produce Different Answers

Carbon Nanotubular: SURFing into the Sciences

View nanometrology publications View nanometrology research projects View nanometrology patents
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