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Nanotechnology

Nanometrology

News and Updates

molecules

Avoiding the Crack of Doom

Just as a journey of 1,000 miles begins with a single step, the deformations and fractures that cause catastrophic failure in materials begin with a few
single flux quantum illustration

Uncrunching the Frequency Spectrum

The squeeze is here, and the crunch is coming. Soon. Explosive demand for high-speed wireless communication is placing growing pressure on the limited frequency

Projects and Programs

EBIC Current

Neuromorphic Device Measurements

Neuromorphic computing is a radical new approach to information processing for artificial intelligence where, instead of using digital electronics, inspiration

Publications

Towards data-driven next-generation transmission electron microscopy

Author(s)
Steven R. Spurgeon, Colin Ophus, Lewys Jones, Amanda K. Petford-Long, Sergei Kalinin, Matthew J. Olszta, Rafal Dunin-Borkowski, Norman Salmon, Khalid Hattar, Wei-Chang D. Yang, Renu Sharma, Yingge Du, Ann C. Chiaramonti Debay, Haimei Zheng, Edgar C. Buck, Libor Kovarik, R. Lee Penn, Dongsheng Li, Xin Zhang, Mitsuhiro Murayama, Mitra D. Taheri
The rapidly evolving field of electron microscopy touches nearly every aspect of modern life, underpinning impactful materials discoveries in applications such

Software

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

HNL650-small

Focused Ion Beam (Helios 660)

The Helios 660 NanoLab(HNL660) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase

Analytical Electron Microscope

The Titan 80-300 is a transmission electron microscope (TEM) equipped with spectroscopic detectors to allow chemical, elemental, and other analytical
Examples of work in the Precision Imaging Facility.  (a) STEM image of a crack (dislocation) formed during growth of an AlGaN shell around a GaN nanowire, and (b) FIB fabrication of an AFM tip with a GaN nanowire contact point.

Precision Imaging Facility

The Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the