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Projects/Programs

Displaying 1 - 25 of 57

Atom-based Silicon Quantum Electronics

Ongoing
To fabricate, measure, and model solid state implementations of atomically precise devices. Develop a robust infrastructure to fabricate prototype few-atom

Diffraction Metrology and Standards

Ongoing
Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for characterization of

Electronic Material Characterization

Ongoing
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Fundamentals of Deformation

Ongoing
This project provides new measurement methods, property data and simulations for areas critical to US manufacturing, describing the mechanisms responsible for

Magnetic Random Access Memory

Ongoing
The program on magnetic random-access memory develops metrology to determine how spin currents can be generated and used to control and manipulate magnetization

Metrology of Magnetic Materials

Ongoing
We are developing best practice metrology for characterization of magnetic nanoparticle systems (e.g. blocking temperature, anisotropy, property distributions

Metrology for Nanolithography

Ongoing
Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively evaluate