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In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy

Published

Author(s)

Jason P. Killgore, Roy H. Geiss, Donna C. Hurley

Abstract

Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes in contact radius is directly detected in situ. We find that in-situ results agree well with existing ex-situ techniques, while providing additional robust wear information that would not be resolved ex situ. Additionally, we find that CR-FM mapping does not affect the wear mechanism compared to standard contact scanning.
Citation
Small

Keywords

Contact Resonance Force Microscopy, Atomic Force Microscope, Tip Wear, tribology, nanotribology
Created March 15, 2011, Updated February 19, 2017