Killgore, J.
, Geiss, R.
and Hurley, D.
(2011),
In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy, Small, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907208
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published
Author(s)
, ,
Abstract
Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes in contact radius is directly detected in situ. We find that in-situ results agree well with existing ex-situ techniques, while providing additional robust wear information that would not be resolved ex situ. Additionally, we find that CR-FM mapping does not affect the wear mechanism compared to standard contact scanning.Citation
Small
Pub Type
Journals
Download Paper
Keywords
Contact Resonance Force Microscopy, Atomic Force Microscope, Tip Wear, tribology, nanotribology
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 15, 2011, Updated February 19, 2017