In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Jason P. Killgore, Roy H. Geiss, Donna C. Hurley
Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes in contact radius is directly detected in situ. We find that in-situ results agree well with existing ex-situ techniques, while providing additional robust wear information that would not be resolved ex situ. Additionally, we find that CR-FM mapping does not affect the wear mechanism compared to standard contact scanning.
, Geiss, R.
and Hurley, D.
In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy, Small, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907208
(Accessed June 9, 2023)