Stroscio, J.
, Yang, H.
, Chae, J.
, Baek, H.
, Ha, J.
, Kuk, Y.
, Jung, S.
, Song, Y.
, Zhitenev, N.
, Woo, S.
and Son, Y.
(2011),
Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope, International Journal of High Speed Electronics and Systems, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908985
(Accessed October 12, 2024)
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Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope
Published
Author(s)
, H.J. Yang, , H. Baek, , Young Kuk, , , , S.J. Woo, Young-Woo Son
Citation
International Journal of High Speed Electronics and Systems
Volume
20
Issue
01
Pub Type
Journals
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 28, 2011, Updated October 12, 2021