TY  - JOUR
AU  - Joseph Stroscio
AU  - H.J. Yang
AU  - Jungseok Chae
AU  - H. Baek
AU  - Jeonghoon Ha
AU  - Young Kuk
AU  - Suyong Jung
AU  - Young Song
AU  - Nikolai Zhitenev
AU  - S.J. Woo
AU  - Young-Woo Son
C2  - International Journal of High Speed Electronics and Systems
DA  - 2011-03-01 00:03:00
LA  - en
M1  - 20
PB  - International Journal of High Speed Electronics and Systems
PY  - 2011
TI  - Charge Puddles and Edge Effect in a Graphene Device as Studied by a Scanning Gate Microscope
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908985
ER  -