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PUBLICATIONS

Advanced Capacitance Metrology for Nanoscale Device Characterization

Published

Author(s)

Joseph L. Tedesco, Nadine E. Gergel-Hackett, Laurie A. Stephey, Christina A. Hacker, Curt A. Richter
Proceedings Title
Posters and Presentations (CD)
Conference Dates
April 26-29, 2010
Conference Location
McLean, VA
Conference Title
Tenth Annual IC Postdoctoral Research Fellowship Program Colloquium
Pub Type
Conferences

Keywords

TiO2, Memristors, I-V, C-V, Nanoscale
Nanoelectronics and Nanometrology

Citation

Tedesco, J. , Gergel-Hackett, N. , Stephey, L. , Hacker, C. and Richter, C. (2010), Advanced Capacitance Metrology for Nanoscale Device Characterization, Posters and Presentations (CD), McLean, VA (Accessed October 27, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created April 29, 2010, Updated February 19, 2017
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