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Advanced Capacitance Metrology for Nanoscale Device Characterization

Published

Author(s)

Joseph L. Tedesco, Nadine E. Gergel-Hackett, Laurie A. Stephey, Christina A. Hacker, Curt A. Richter
Proceedings Title
Posters and Presentations (CD)
Conference Dates
April 26-29, 2010
Conference Location
McLean, VA
Conference Title
Tenth Annual IC Postdoctoral Research Fellowship Program Colloquium

Keywords

TiO2, Memristors, I-V, C-V, Nanoscale

Citation

Tedesco, J. , Gergel-Hackett, N. , Stephey, L. , Hacker, C. and Richter, C. (2010), Advanced Capacitance Metrology for Nanoscale Device Characterization, Posters and Presentations (CD), McLean, VA (Accessed June 12, 2024)

Issues

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Created April 29, 2010, Updated February 19, 2017