U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Advanced Capacitance Metrology for Nanoscale Device Characterization

Published

Author(s)

Joseph L. Tedesco, Nadine E. Gergel-Hackett, Laurie A. Stephey, Christina A. Hacker, Curt A. Richter
Proceedings Title
Posters and Presentations (CD)
Conference Dates
April 26-29, 2010
Conference Location
McLean, VA
Conference Title
Tenth Annual IC Postdoctoral Research Fellowship Program Colloquium
Pub Type
Conferences

Keywords

TiO2, Memristors, I-V, C-V, Nanoscale
Nanoelectronics and Nanometrology

Citation

Tedesco, J. , Gergel-Hackett, N. , Stephey, L. , Hacker, C. and Richter, C. (2010), Advanced Capacitance Metrology for Nanoscale Device Characterization, Posters and Presentations (CD), McLean, VA (Accessed October 7, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 29, 2010, Updated February 19, 2017