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Nanoscale Measurements With the TSOM Optical Method

Published

Author(s)

Ravikiran Attota

Abstract

A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions will be presented. This technique has potential to identify which dimension is changing between two nanosized targets and to determine the dimension using a library-matching method. This methodology has utility for a wide range of target geometries and application areas, including nanomanufacturing, defect analysis, semiconductor process control, and biotechnology.
Citation
OTHER -

Keywords

TSOM, optical microscope, nanometrology, nanomeasurement, particle analysis, semiconductor metrology

Citation

Attota, R. (2010), Nanoscale Measurements With the TSOM Optical Method, Other, National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904673 (Accessed June 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 4, 2010, Updated February 19, 2017