Seiler, D.
, Diebold, A.
, McDonald, R.
, , C.
, Herr, D.
, Khosla, R.
and Secula, E.
(2009),
Frontiers of Characterization and Metrology for Nanoelectronics: 2009, American Institute of Physics, Melville, NY
(Accessed October 6, 2024)
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Frontiers of Characterization and Metrology for Nanoelectronics: 2009
Published
Author(s)
, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla,
Citation
Frontiers of Characterization and Metrology for Nanoelectronics: 2009
Volume
1173
Publisher Info
American Institute of Physics, Melville, NY
Pub Type
Books
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 5, 2009, Updated February 19, 2017