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PUBLICATIONS

ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION

Published

Author(s)

Vincent A. Hackley, Martin Fritts, James F. Kelly, Anil K. Patri, Alan F. Rawle

Abstract

A two-day international workshop was convened recently in order to scope out and address the urgent need for standards to accurately characterize the physico-chemical and biological properties of engineered nanomaterials. These standards are needed by industry and regulatory bodies in order to meet requirements for the production, application and lifecycle risk management of nanomaterial-based products ranging from cancer therapeutics to high-tech coatings and composites. The current deficiency in the availability of such standards, including both documentary and reference artifacts, is perceived as limiting the widespread adoption and implementation of nanoscale technologies. Herein is given a brief summary of that workshop, its findings and recommendations.
Citation
INFOSIM INFORMATIVE BULLETIN OF THE INTERAMERICAN METROLOGY SYSTEM
Pub Type
Others

Keywords

nanotechnology, standards, nanomaterial, nanobiotechnology, metrology
Nanometrology

Citation

Hackley, V. , Fritts, M. , Kelly, J. , Patri, A. and Rawle, A. (2009), ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION, INFOSIM INFORMATIVE BULLETIN OF THE INTERAMERICAN METROLOGY SYSTEM (Accessed October 14, 2025)

Issues

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Created August 13, 2009, Updated February 19, 2017
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