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Displaying 59476 - 59500 of 74225

Analysis of Persistent Photoconductivity Due to Potential Barriers

December 31, 1992

Author(s)

J R. Lowney, Santos D. Mayo

Analysis of the Happyland Social Club Fire With HAZARD I

December 31, 1992

Author(s)

Richard W. Bukowski, Robert C. Spetzler

The paper presents the reconstruction of the Happyland Social Club fire using the HAZARD I fire hazard assessment method along with an examination of four potential mitigation strategies: automatic sprinklers, a door at the base of the stairway to the

Application of CMOS-Compatible Micro-Hotplates for In-Situ Process Monitors

December 31, 1992

Author(s)

John S. Suehle, Michael Gaitan

Charge Trapping and Breakdown Mechanism in SIMOX

December 31, 1992

Author(s)

Santos D. Mayo, John S. Suehle, Peter Roitman

Charge Trapping in Cubic Silicon Carbide MIS Capacitors

December 31, 1992

Author(s)

Joseph J. Kopanski

Controlled Interface Roughness in GaAs/AlAs Superlattices

December 31, 1992

Author(s)

W. Wyatt Miller, William J. Boettinger, W. F. Tseng, Joseph G. Pellegrino, J. Comas

Design and Operation of Series-Array Josephson Voltage Standards

December 31, 1992

Author(s)

Richard L. Kautz

Design Methodology for Micromechanical Systems at Commercial CMOS Foundries Through MOSIS

December 31, 1992

Author(s)

Michael Gaitan, A. Parameswaran, Mona E. Zaghloul, Janet M. Cassard, Donald B. Novotny, John S. Suehle

Distributed-Feedback Vertical-Cavity Semiconductor Micro-Lasers with Quantum Well Gain Layers

December 31, 1992

Author(s)

David H. Christensen, Joseph G. Pellegrino, Robert K. Hickernell, W. F. Tseng

Effect of Intermediate Thermal Processing on Microstructural Changes of Oxygen Implanted Silicon-on-Insulator Material

December 31, 1992

Author(s)

J. H. Lee, J Park, S. J. Krause, Peter Roitman, M. K. El-Ghor

Effect of Microstructure on Phase Formation in the Reaction of Nb/Al Multilayer Thin Films

December 31, 1992

Author(s)

K. Barmak, K. R. Coffey, David A. Rudman, S. Foner

Effect of Thermal Ramping Conditions on Defect Formation in Oxygen Implanted Silicon-on-Insulator Material

December 31, 1992

Author(s)

S. J. Krause, J Park, J. H. Lee, M. K. El-Ghor, Peter Roitman

Effects of Heavy Doping on Numerical Simulations of Gallium Arsenide Bipolar Transistors

December 31, 1992

Author(s)

M. Tomizawa, T. Ishibashi, Herbert S. Bennett, J R. Lowney

Electrical and Infrared Properties of Thin Niobium Microbolometers Near Tc

December 31, 1992

Author(s)

Erich N. Grossman, J. E. Sauvageau, Donald G. McDonald

Electron Traps, Structural Change, and Hydrogen-Related SIMOX Defects

December 31, 1992

Author(s)

J. F. Conley, Patrick M. Lenahan, Peter Roitman

Elimination of Effects Due to Patterning Imperfections in Electrical Test Structures for Submicrometer Feature Metrology

December 31, 1992

Author(s)

Richard A. Allen, Michael W. Cresswell

First Phase Formation Kinetics in the Reaction of Nb/Al

December 31, 1992

Author(s)

K. R. Coffey, K. Barmak, S. Foner

Growth and Characterization of Ternary and Quaternary Compounds of Iny(A lx G a1-x ) 1-y As on (100) InP

December 31, 1992

Author(s)

W. F. Tseng, J. Comas, B. Steiner, G. Metze, A. Cornfeld, P. B. Klein, D. K. Gaskill, W. Xia, S. S. Lau

High Level Mobility Controller for a Remotely Operated Unmanned Land Vehicle

December 31, 1992

Author(s)

Sandor S. Szabo, Harry A. Scott, Karl Murphy, Steven Legowik, Roger V. Bostelman

High Spatial Resolution Mapping of Resistivity Variations in Semiconductors

December 31, 1992

Author(s)

Joseph Kopanski, G. P. Carver, J R. Lowney, D. S. Miles, Donald B. Novotny

Imaging of Passivated III-V Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air

December 31, 1992

Author(s)

John A. Dagata, W. F. Tseng, J. Bennett, J. Schneir, Howard H. Harary

Interface Roughness Studies of AlAs/GaAs Superlattices Using X-Ray Diffraction

December 31, 1992

Author(s)

S. B. Qadri, Joseph G. Pellegrino

Interface Roughness, Composition, and Alloying of Low-Order AlAs/GaAs Superlattices Studied by X-Ray Diffraction

December 31, 1992

Author(s)

W. Wyatt Miller, Joseph G. Pellegrino, J. Comas

Interface Sharpness in Low-Order III-V Superlattices

December 31, 1992

Author(s)

Joseph G. Pellegrino, S. B. Qadri, Paul M. Amirtharaj, Nhan Van Nguyen, J. Comas

Majority and Minority Mobilities in Heavily Doped Silicon for Device Simulations

December 31, 1992

Author(s)

Herbert S. Bennett, J R. Lowney

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