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Interface Roughness, Composition, and Alloying of Low-Order AlAs/GaAs Superlattices Studied by X-Ray Diffraction

Published

Author(s)

W. Wyatt Miller, Joseph G. Pellegrino, J. Comas
Proceedings Title
Proc., Materials Research Society Symposium
Volume
280
Conference Location
Boston, MA, USA

Citation

Miller, W. , Pellegrino, J. and Comas, J. (1992), Interface Roughness, Composition, and Alloying of Low-Order AlAs/GaAs Superlattices Studied by X-Ray Diffraction, Proc., Materials Research Society Symposium, Boston, MA, USA (Accessed May 29, 2024)

Issues

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Created December 30, 1992, Updated October 12, 2021