Miller, W.
, Pellegrino, J.
and Comas, J.
(1992),
Interface Roughness, Composition, and Alloying of Low-Order AlAs/GaAs Superlattices Studied by X-Ray Diffraction, Proc., Materials Research Society Symposium, Boston, MA, USA
(Accessed January 20, 2025)
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Interface Roughness, Composition, and Alloying of Low-Order AlAs/GaAs Superlattices Studied by X-Ray Diffraction
Published
Author(s)
, Joseph G. Pellegrino, J. Comas
Proceedings Title
Proc., Materials Research Society Symposium
Volume
280
Conference Location
Boston, MA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1992, Updated October 12, 2021