Mayo, S.
, Suehle, J.
and Roitman, P.
(1992),
Charge Trapping and Breakdown Mechanism in SIMOX, Extended Abstract, Proc., 1992 IEEE International SOI Conference, Ponte Vedra Beach, FL, USA
(Accessed April 21, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Charge Trapping and Breakdown Mechanism in SIMOX
Published
Author(s)
, ,
Proceedings Title
Extended Abstract, Proc., 1992 IEEE International SOI Conference
Conference Dates
October 6-8, 1992
Conference Location
Ponte Vedra Beach, FL, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1992, Updated October 12, 2021