Mayo, S.
, Suehle, J.
and Roitman, P.
(1992),
Charge Trapping and Breakdown Mechanism in SIMOX, Extended Abstract, Proc., 1992 IEEE International SOI Conference, Ponte Vedra Beach, FL, USA
(Accessed March 3, 2025)
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Charge Trapping and Breakdown Mechanism in SIMOX
Published
Author(s)
, ,
Proceedings Title
Extended Abstract, Proc., 1992 IEEE International SOI Conference
Conference Dates
October 6-8, 1992
Conference Location
Ponte Vedra Beach, FL, USA
Pub Type
Conferences
Citation
Issues
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Created December 30, 1992, Updated October 12, 2021