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PUBLICATIONS

Charge Trapping and Breakdown Mechanism in SIMOX

Published

Author(s)

Santos D. Mayo, John S. Suehle, Peter Roitman
Proceedings Title
Extended Abstract, Proc., 1992 IEEE International SOI Conference
Conference Dates
October 6-8, 1992
Conference Location
Ponte Vedra Beach, FL, USA
Pub Type
Conferences

Citation

Mayo, S. , Suehle, J. and Roitman, P. (1992), Charge Trapping and Breakdown Mechanism in SIMOX, Extended Abstract, Proc., 1992 IEEE International SOI Conference, Ponte Vedra Beach, FL, USA (Accessed April 16, 2024)

Created December 30, 1992, Updated October 12, 2021