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Interface Roughness Studies of AlAs/GaAs Superlattices Using X-Ray Diffraction

Published

Author(s)

S. B. Qadri, Joseph G. Pellegrino
Proceedings Title
Extended Abstract, Annual Report, National Synchrotron Light Source Proceedings
Conference Location
Upton, NY, USA

Citation

Qadri, S. and Pellegrino, J. (1992), Interface Roughness Studies of AlAs/GaAs Superlattices Using X-Ray Diffraction, Extended Abstract, Annual Report, National Synchrotron Light Source Proceedings, Upton, NY, USA (Accessed May 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1992, Updated October 12, 2021