Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Imaging of Passivated III-V Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air

Published

Author(s)

John A. Dagata, W. F. Tseng, J. Bennett, J. Schneir, Howard H. Harary
Citation
Ultramicroscopy
Volume
42-44

Citation

Dagata, J. , Tseng, W. , Bennett, J. , Schneir, J. and Harary, H. (1992), Imaging of Passivated III-V Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air, Ultramicroscopy (Accessed December 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1992, Updated October 12, 2021