Conley, J.
, Lenahan, P.
and Roitman, P.
(1992),
Electron Traps, Structural Change, and Hydrogen-Related SIMOX Defects, Proc., IEEE International SOI Conference, Ponte Vedra Beach, FL, USA
(Accessed May 9, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Electron Traps, Structural Change, and Hydrogen-Related SIMOX Defects
Published
Author(s)
J. F. Conley, Patrick M. Lenahan,
Proceedings Title
Proc., IEEE International SOI Conference
Conference Dates
October 6-8, 1992
Conference Location
Ponte Vedra Beach, FL, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1992, Updated October 12, 2021