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Conferences

Total Hadamard Variance: Application to Clock Steering by Kalman Filtering

March 1, 2001

Author(s)

David A. Howe, Ron Beard, Chuck Greenhall, Francois Vernotte, Bill Riley

The Total variance approach has been developed for increasing the conﬁdence of the estimation of the classical Allan variance, particularly for large...

Precision Measurements of Transport Properties for an Energy Level Fan Diagram of GaAs/AlGaAs in the Integer Quantum Hall Regime

March 1, 2001

Author(s)

J. Matthews, Marvin E. Cage

We present temperature and current dependent measurements of sigma xx} and sigma xy} in the integer quantum Hall effect regime, with a GaAs/AlGaAs...

Evaluating Collaborative Enterprises - A Workshop Report

March 1, 2001

Author(s)

Robert Allen, Michelle P. Steves

As part of the WETICE 2001 conference, the workshop on Evaluating Collaborative Enterprises continued from its debut last year exploring the issues surrounding...

Fast and Accurate Measurement of the Dispersion of Cascaded Components

March 1, 2001

Author(s)

Shellee D. Dyer, Allen Rose, Kent B. Rochford

We show that the dispersion of multiple cascaded components can be determined from a single low-coherence interferometric measurement. This measurement is not...

Wavelength References for 1300 nm and L-Band WDM

March 1, 2001

Author(s)

Tasshi Dennis, William C. Swann, Sarah L. Gilbert

We have surveyed potential references for 1300 nm and L-band wavelength calibration. We have developed a 1314 nm methane reference for our internal calibration...

Second Harmonic Magneto-Resistive Imaging to Authenticate and Recover Data From Magnetic Storage Media

March 1, 2001

Author(s)

David P. Pappas, C S. Arnold, G Shalev, C Eunice, D Stevenson, Steven Voran, Mike E. Read, Erin M. Gormley, James Cash, Ken Marr, James Ryan

A scanning magneto-resistive microscope was developed that allows for high resolution imaging of magnetic tapes and digital media. By using second harmonic...

Use of Electrical Test Structures to Characterize Trench Profiles Etched on SOI Wafers

March 1, 2001

Author(s)

Nadine Guillaume, J. Kiihamaki, J. Karttunen, H. Kattelus

Interferometric Testing of Photomask Blank Flatness

February 28, 2001

Author(s)

Christopher J. Evans, R E. Parks, L Z. Shao, Tony L. Schmitz, Angela Davies

Conventional interferometric testing of the flatness of photomask blanks is rendered difficult by the long coherence length of the HeNe laser sources typically...

Applying X-Ray Topography and Diffractometry to Improve Protein Crystal Growth

February 21, 2001

Author(s)

David R. Black, L Arnowitz, David T. Gallagher

In order to obtain adequate diffraction data to determine the structure of the protein of interest, crystal quality is important. Although in this context there...

Superconducting Nb DHEB Mixer Arrays for Far-Infrared Spectroscopy

February 12, 2001

Author(s)

Eyal Gerecht, Carl D. Reintsema, Erich N. Grossman, A. L. Betz, R. T. Boreiko

We are developing a heterodyne focal plane array with up to eight elements to study lines with frequencies of 2 THz and above. It is intended for studies of the...

Characterization of a Residential Fire Sprinkler Using Phase Doppler Interferometry.

February 7, 2001

Author(s)

J F. Widmann

The results of a feasibility study to determine if the water sprays produced by residential fire sprinklers can be accurately characterized using phase Doppler...

Test Chip for Electrical Linewidth of Copper-Interconnection Features and Related Parameters

February 6, 2001

Author(s)

Michael W. Cresswell, N. Arora, Richard A. Allen, Christine E. Murabito, Curt A. Richter, Ashwani K. Gupta, Loren W. Linholm, D. Pachura, P. Bendix

This paper reports a new electrical test structure for measuring the barrier-layer thickness and total physical linewidth of copper-cored interconnect features...

The NIST Manufacturing Engineering Laboratory: Promoting a Healthy U.S. manufacturing Sector Through Measurements and Standards

February 5, 2001

Author(s)

David C. Stieren

The research, measurement and standards activities of the Manufacturing Engineering Laboratory (MEL) at the National Institute of Standards and Technology (NIST...

Characterization of Coating System Interphases With Phase Imaging AFM.

February 1, 2001

Author(s)

Tinh Nguyen, Xiaohong Gu, M Giraud, M R. VanLandingham, R Dutruc-Rosset, R Ryntz, D Nguyen

The interphase between a polymer film and a substrate controls the adhesion and durability of a variety of polymeric systems including adhesives and coatings on...

Analysis on Data Stream Model of Network Image Fire Detection System.

February 1, 2001

Author(s)

Weiguo Song, T Chen, L Wu, W Fan

Fabrication, Derivatization and Applications of Plastic Microfluidic Devices

February 1, 2001

Author(s)

S L. Barker, Michael J. Tarlov, David J. Ross, T J. Johnson, E A. Waddell, Laurie E. Locascio

Control of the polymer surface chemistry is a crucial aspect of development of plastic microfluidic devices. When commercially available plastic substrates are...

Ab Initio Structure of the Active Site of Phosphotriesterase

February 1, 2001

Author(s)

Morris Krauss

This research exploits two recent developments to obtain a fundamental understanding of the metalloenzyme active site using the bi-metallic enzyme...

Current Projects of ISO Technical Committee 201 on Surface Chemical Analysis

February 1, 2001

Author(s)

Cedric J. Powell

An overview is given of current work projects of Technical Committee 201 on Surface Chemical Analysis of the International Organization for Standardization (ISO...

Effect of Burst-Splitting Events on Phase Doppler Interferometry Measurements

February 1, 2001

Author(s)

J F. Widmann, Cary Presser, Stefan D. Leigh

Evanescent-Wave Cavity Ring-down Spectroscopy for Trace Water Detection

February 1, 2001

Author(s)

A C. Pipino, Joseph T. Hodges

We explore the use of evanescent wave cavity ring-down spectroscopy (EW-CRDS) for water detection through a signal-to-noise ratio analysis. Cavity ring-down...

Intensity Artifacts in Gas Phase FTIR Spectroscopy: Focus on the Aperture

February 1, 2001

Author(s)

S W. Sharpe, R L. Sams, T J. Johnson, Pamela M. Chu

Effects of Stoichiometry and Epoxy Molecular Mass on Wettability and Interfacial Microstructures of Amine-Cured Epoxies

February 1, 2001

Author(s)

M Giraud, Tinh Nguyen, Xiaohong Gu, Mark R. VanLandingham

The effects of stoichiometry and epoxy molecular mass on surface and interfacial microstructures and wettability of amine-cured epoxies have been investigated...

Characterization of Coating System Interphases with Phase Imaging AFM

February 1, 2001

Author(s)

Tinh Nguyen, Xiaohong Gu, Mark R. VanLandingham, M Giraud, R Dutruc-Rosset, R Ryntz, D Nguyen

The interphase between a polymer film and a substrate controls the adhesion and durability of a variety of polymeric systems including adhesives, coatings on...

Nanomechanical Characterization of Polymers Using Scanning Probe Microscopes

February 1, 2001

Author(s)

Mark R. VanLandingham

Scanning probe microscopy (SPM) has been used to study polymeric materials with nanometer spatial resolution. Indentation methods based on SPM technology...

Research on Sealant at the National Institute of Standards and Technology: Past and Present

February 1, 2001

Author(s)

Christopher C. White

The standard test method for evaluating sealant performance is the ASTM C719, which resulted from the pioneering work of NIST researcher Authur Hockman. This...

Exploring Site Quality Above 1 GHz Using Double Ridged Horns

February 1, 2001

Author(s)

Dennis G. Camell, Robert T. Johnk, K. R. Hall

This is a summary of recent exploratory efforts conducted by the American National Standards Institute (ANSI) Accredited Standards Committee C63, Sub-Committee...

Imaging of Multi-Fiber, Micro-Mechanical Testing Specimens Using Optical Coherence Tomography

February 1, 2001

Author(s)

Joy P. Dunkers, Gale A. Holmes, Walter G. McDonough

In this initial work, we interfaced a micro-mechanical testing stage with the optical coherence tomography (OCT) instrument. We then demonstrated the...

Fabrication and Electron Microprobe Characterization of Barium-Strontium-Titanate (BST) Films

February 1, 2001

Author(s)

Ryna B. Marinenko, J T. Armstrong, Debra L. Kaiser, Joseph J. Ritter, Peter K. Schenck, C P. Bouldin, J Blendell, Igor Levin

Barium strontium titanate (BST) thin films of varying composition and thickness (5nm to 400nm) on (100)Si or Pt/(100)Si substrates were measured using an...

A Novel Microshear Test to Measure Dental Adhesion

February 1, 2001

Author(s)

Joseph M. Antonucci, Walter G. McDonough, Gary E. Schumacher, Y Shimada

A key factor in determining the strength and durability of polymeric dental restorative composites, sealants and adhesives is the quality of their interfaces...

Analysis of Behavioral Requirements for Component-Based Machine Controllers

February 1, 2001

Author(s)

Frederick M. Proctor, John L. Michaloski, S Birla, G Weinert

Machine controllers built from standardized software components have the greatest potential to reap open architecture benefits - including plug-and-play...

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