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Conferences

Gate Oxide Formation under Mild Conditions for Scanning Capacitance Microscopy

February 1, 2001

Author(s)

Duncan McBride, Joseph Kopanski

Scanning Capacitance Microscopy (SCM) can be used to measure doping density in silicon with a spatial resolution of about 10 nm. In order to make such...

Local Electrode Atom Probes: Prospects for 3D Atomic-Scale Metrology Applications in the Semiconductor and Data Storage Industries

February 1, 2001

Author(s)

T F. Kelly, T T. Gribb, R L. Martens, D J. Larson, N Tabat, R J. Matyi, Thomas J. Shaffner

Optical and Electrical Thickness Measurements of Alternate Gate Dielectrics: a Fundamental Difference

February 1, 2001

Author(s)

Curt A. Richter, Nhan Van Nguyen, Evgeni Gusev, T H. Zabel, G A. Alers

We will describe a fundamental difference between the interpretation of optical and electrical measurements of gate dielectric thickness. This difference has...

Light Measuring Device Diagnostics for the Photometric and Colorimetric Measurement of Flying-spot Displays

January 30, 2001

Author(s)

Paul A. Boynton, Edward F. Kelley

Flying-spot displays use narrow-spectrum high-power sources that scan the image across the display screen. They can provide a bright display with a large color...

A Standard Illumination Source for the Evaluation of Display Measurement Methods and Instruments

January 30, 2001

Author(s)

John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno, Farshid Manoocheri

A prototype display measurement assessment transfer standard (DMATS) is being developed by the National Institute of Standards and Technology (NIST) to assist...

Characterization of BPSG films using Neutron Depth Profiling and Neutron/X-ray Reflectometry

January 29, 2001

Author(s)

Huaiyu H. Chen-Mayer, George P. Lamaze, Sushil K. Satija

Energy Dispersive X-ray Analysis using a Microcalorimeter Detector

January 29, 2001

Author(s)

W. Harris, L. Le Tarte, H. Bakhru, W. Gibson, D. Wu, Robert E. Geer, David A. Wollman

Energy dispersive X-ray analysis (EDX) is widely used within the semiconductor community for chemical analysis and identification of features observed in...

Development of a Fire Hazard Assessment Method to Evaluate the Fire Safety of Passenger Trains

January 22, 2001

Author(s)

Richard D. Peacock, Richard W. Bukowski, Paul A. Reneke, Jason D. Averill, S. H. Markos

U.S. passenger train fire safety has historically been addressed primarily through the citation of small-scale flammability and smoke emission tests and...

Recent Advances in Flame Retardant Polymer Nanocomposites

January 22, 2001

Author(s)

Jeffrey W. Gilman, Takashi Kashiwagi, A B. Morgan, Richard H. Harris Jr., L D. Brassell, W H. Awad, Rick D. Davis, L Chyall, T E. Sutto, Paul C. Trulove, H DeLong

A new approach to address the ever increasing demand for higher performance flame retarded products has recently focused on use of mica-type clays nano...

Improved Range Resistors for AC-DC Transfer Measurements

January 18, 2001

Author(s)

H. O. Wolcott, Joseph R. Kinard Jr., Thomas E. Lipe Jr.

This paper discusses the factors contributing to the ac-dc differences of high-voltage thermal converters. A novel resistor designed to minimize these...

CASSCF Investigation of Electronic Excited States of 2-Aminopurine

January 11, 2001

Author(s)

E L. Rachofsky, J B. Ross, Morris Krauss, R Osman

2-aminopurine is a highly fluorescent analog of adenine that can be incorporated synthetically into DNA with little perturbation of the native double-helical...

Long-Term Charge Offset Noise in Coulomb-Blockade Devices

January 9, 2001

Author(s)

William Huber, S Martin, Neil M. Zimmerman

While Coulomb-Blockade devices have shown promise as qubit systems or qubit state detectors, large scale parallelization of these devices is severely hampered...

Toxic Yield

January 7, 2001

Author(s)

William M. Pitts

It is generally recognized that the vast majority of deaths associated with accidental enclosure fires are due to smoke inhalation. Older reviews of autopsy...

Standards of Current and Capacitance Based on Single-Electron Tunneling Devices

January 1, 2001

Author(s)

Mark W. Keller

Fundamental standards of current and capacitance based on the transfer of electrons one-by-one are described. The current status of several schemes for...

Tools and Diagnostics for Projection Display Metrology

January 1, 2001

Author(s)

Paul A. Boynton

Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation...

Recent Results in Trapped-Ion Quantum Computing at NIST,

January 1, 2001

Author(s)

D Kielpinski, A Ben-kish, Joseph W. Britton, V Meyer, M A. Rowe, C A. Sackett, Wayne M. Itano, C Monroe, David J. Wineland

We review recent experiments on entanglement, Bell's inequality, and decoherence-free subspaces in a quantum register of trapped 9Be+ ions.

A Refinement-Tree Based Partioning Method for Adaptively Refined Grids

January 1, 2001

Author(s)

William F. Mitchell

The partitioning of an adaptive grid for distribution over parallel processors is considered in the context of adaptive multilevel methods for solving partial...

All Optical Atomic Clocks Based on a Single Mercury Ion and Calcium Atoms

January 1, 2001

Author(s)

Scott A. Diddams, K R. Vogel, Christopher W. Oates, E A. Curtis, W D. Lee, Wayne M. Itano, Robert E. Drullinger, James C. Bergquist, Leo W. Hollberg

Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy

January 1, 2001

Author(s)

E Landree, Terrence J. Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C. Diebold

To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material...

Quantifying Measurement Uncertainty in Analytical Chemistry A Simplified Practical Approach

January 1, 2001

Author(s)

Thomas W. Vetter

Sources of Uncertainty in UV Radiation Measurements

January 1, 2001

Author(s)

Thomas C. Larason, Christopher L. Cromer

Increasing commercial, scientific, and technical applications involving ultraviolet (UV) radiation has led to the demand for improved understanding of the...

An Analysis of Combined CFD and Multizone IAQ Model Assembly Issues

January 1, 2001

Author(s)

Amy Musser

This study considers the situation of two isothermal rooms linked to one another via an opening of varying size. Air and a neutrally buoyant contaminant are...

Measurement Considerations for the Determination of Central Plant Efficiency

January 1, 2001

Author(s)

Stephen J. Treado, Todd W. Snouffer

Concerns about maintaining optimum operating conditions for central plants in order to minimize energy usage and cost have highlighted the need for accurate...

A Metamodeling Approach to Evolution

January 1, 2001

Author(s)

M N. Terrasse

With the increasing complexity of systems being modeled, analysis and design move towards more and more abstract methodologies. Most of them rely on...

Sapphire Statistical Characterization and Risk Reduction Program

January 1, 2001

Author(s)

Donald McClure, Robert Cayse, David R. Black, Steven Goodrich, K Lagerloef, D Peter, Daniel C. Harris, Dale McCullum, Daniel H. Platus, Charles E. Patty, Robert S. Polvani

The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different...

Empirical Mode Decomposition/Hilbert-Huang Transform Analysis and Machine Tool Prognostics

January 1, 2001

Author(s)

Gary G. Leisk

Economic competition in the manufacturing industry is generating demand for more advanced diagnostic and prognostic capabilities in machine tools. While machine...

NIST Time and Frequency Broadcasts from Radio Stations WWVB, WWV, and WWVH

January 1, 2001

Author(s)

Matthew J. Deutch, E Farrow, John P. Lowe, Glenn K. Nelson, Dean T. Okayama, D Patterson, Douglas D. Sutton, William C. Yates

Regenerative Stablity Analysis of Highly Interrupted Machining

January 1, 2001

Author(s)

Matthew A. Davies, Jon R. Pratt, Brian S. Dutterer, Timothy J. Burns

We discuss theoretical and experimental work that supports the use of very low radia immersion in the high-speed milling of difficult-to-machine materials, such...

A Careful Consideration of the Calibration Concept

January 1, 2001

Author(s)

Steven D. Phillips, William T. Estler, Theodore D. Doiron, K Eberhardt, M. Levenson

This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under...

Precision Measurements in the New Millennium: Predictions, Opportunity and Progress

January 1, 2001

Author(s)

Steven D. Phillips

As the theme of this year''s International Dimensional Metrology Workshop is Dimensional Metrology - Precision Measurements in the New Millennium, it is...

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