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Conferences

A High-Speed Thermal Imaging System for Semiconductor Device Analysis

Author(s)
Allen R. Hefner Jr., David W. Berning, David L. Blackburn, Christophe C. Chapuy, Sebastien Bouche
A new high-speed transient thermal imaging system is presented that provides the capability to measure the transient temperature distributions on the surface of...

A Genetic Programming Ecosystem

Author(s)
J E. Devaney, John G. Hagedorn, O P. Nicolas, G Garg, A Samson, Martial Michel
Algorithms are needed in every aspect of parallel computing. Genetic Programmingis an evolutionary technique for automating the design of algorithms...

Sublethal Effects of Smoke on Survival and Health

Author(s)
Richard G. Gann, Jason D. Averill, Kathryn M. Butler, Walter W. Jones, George W. Mulholland, J L. Neviaser, Thomas J. Ohlemiller, Richard D. Peacock, Paul A. Reneke, J R. Hall

Dielectric Properties of Materials for Packaging from 1 to 60 GHz

Author(s)
Y. Kantor, Michael D. Janezic, Pavel Kabos, Billy F. Riddle, James R. Baker-Jarvis
Measurements of the complex permittivity of commonly used packaging materials, as a function of temperature, in the frequency range of 1-60 GHz are presented...

Nanomechanical Measurements of Polymeric Systems

Author(s)
Mark R. VanLandingham, Christopher C. White, Xiaohong Gu, Tinh Nguyen
Durability, in terms of service life, is often related to the failure due to service conditions of an unacceptable percentage of a product population. In many...

Toward Next-Generation Construction Machines

Author(s)
Roger V. Bostelman, James S. Albus, William C. Stone
Construction equipment is typically massive and operated manually with minimal use of sensors or computers for measurement or control. Research in the...

Laser Scanning for Construction Metrology

Author(s)
Geraldine S. Cheok, William C. Stone, Robert R. Lipman, Christoph J. Witzgall, Javier Bernal
This paper summarizes work at the National Institute of Standards and Technology (NIST) in the Non-Intrusive Scanning Technologies for Construction Assessment...

Noncontact Thermometry in the Optical Technology Division at NIST

Author(s)
Charles E. Gibson, Howard W. Yoon, Benjamin K. Tsai, Bettye C. Johnson, Robert D. Saunders
The Optical Technology Division (OTD) at the National Institute of Standards and Technology (NIST) maintains the thermodynamic temperature scale above the...
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