NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Cedric J. Powell, Aleksander Jablonski, A Naumkin, A Kraut-Vass, Joseph M. Conny, J R. Rumble
A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an XPS Database, an Electron Elastic-Scattering Cross-Section Database, and an Electron Inelastic-Mean-Free-Path Database. NIST also offers Standard Test Data (STD) for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet. The XPS database and the XPS-STD are available over the internet.
ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure
Journal of Electron Spectroscopy and Related Phenomena
August 8-12, 2000
Auger-electron spectroscopy, databases, electron elastic-scattering cross sectio, electron inelastic mean free paths, standard test data, surface analysis, x-ray photoelectron spectroscopy
, Jablonski, A.
, Naumkin, A.
, Kraut-Vass, A.
, Conny, J.
and Rumble, J.
NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy, ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure
Journal of Electron Spectroscopy and Related Phenomena, Berkeley, CA
(Accessed October 2, 2023)