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NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

Published

Author(s)

Cedric J. Powell, Aleksander Jablonski, A Naumkin, A Kraut-Vass, Joseph M. Conny, J R. Rumble

Abstract

A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an XPS Database, an Electron Elastic-Scattering Cross-Section Database, and an Electron Inelastic-Mean-Free-Path Database. NIST also offers Standard Test Data (STD) for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet. The XPS database and the XPS-STD are available over the internet.
Proceedings Title
ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure
Journal of Electron Spectroscopy and Related Phenomena
Volume
114-116
Conference Dates
August 8-12, 2000
Conference Location
Berkeley, CA

Keywords

Auger-electron spectroscopy, databases, electron elastic-scattering cross sectio, electron inelastic mean free paths, standard test data, surface analysis, x-ray photoelectron spectroscopy

Citation

Powell, C. , Jablonski, A. , Naumkin, A. , Kraut-Vass, A. , Conny, J. and Rumble, J. (2001), NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy, ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure Journal of Electron Spectroscopy and Related Phenomena, Berkeley, CA (Accessed May 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 1, 2001, Updated February 19, 2017