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Conferences

Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy

January 1, 2001

Author(s)

E Landree, Terrence J. Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C. Diebold

To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material...

Quantifying Measurement Uncertainty in Analytical Chemistry A Simplified Practical Approach

January 1, 2001

Author(s)

Thomas W. Vetter

Sources of Uncertainty in UV Radiation Measurements

January 1, 2001

Author(s)

Thomas C. Larason, Christopher L. Cromer

Increasing commercial, scientific, and technical applications involving ultraviolet (UV) radiation has led to the demand for improved understanding of the...

An Analysis of Combined CFD and Multizone IAQ Model Assembly Issues

January 1, 2001

Author(s)

Amy Musser

This study considers the situation of two isothermal rooms linked to one another via an opening of varying size. Air and a neutrally buoyant contaminant are...

Measurement Considerations for the Determination of Central Plant Efficiency

January 1, 2001

Author(s)

Stephen J. Treado, Todd W. Snouffer

Concerns about maintaining optimum operating conditions for central plants in order to minimize energy usage and cost have highlighted the need for accurate...

A Metamodeling Approach to Evolution

January 1, 2001

Author(s)

M N. Terrasse

With the increasing complexity of systems being modeled, analysis and design move towards more and more abstract methodologies. Most of them rely on...

Sapphire Statistical Characterization and Risk Reduction Program

January 1, 2001

Author(s)

Donald McClure, Robert Cayse, David R. Black, Steven Goodrich, K Lagerloef, D Peter, Daniel C. Harris, Dale McCullum, Daniel H. Platus, Charles E. Patty, Robert S. Polvani

The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different...

Empirical Mode Decomposition/Hilbert-Huang Transform Analysis and Machine Tool Prognostics

January 1, 2001

Author(s)

Gary G. Leisk

Economic competition in the manufacturing industry is generating demand for more advanced diagnostic and prognostic capabilities in machine tools. While machine...

NIST Time and Frequency Broadcasts from Radio Stations WWVB, WWV, and WWVH

January 1, 2001

Author(s)

Matthew J. Deutch, E Farrow, John P. Lowe, Glenn K. Nelson, Dean T. Okayama, D Patterson, Douglas D. Sutton, William C. Yates

Regenerative Stablity Analysis of Highly Interrupted Machining

January 1, 2001

Author(s)

Matthew A. Davies, Jon R. Pratt, Brian S. Dutterer, Timothy J. Burns

We discuss theoretical and experimental work that supports the use of very low radia immersion in the high-speed milling of difficult-to-machine materials, such...

A Careful Consideration of the Calibration Concept

January 1, 2001

Author(s)

Steven D. Phillips, William T. Estler, Theodore D. Doiron, K Eberhardt, M. Levenson

This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under...

Precision Measurements in the New Millennium: Predictions, Opportunity and Progress

January 1, 2001

Author(s)

Steven D. Phillips

As the theme of this year''s International Dimensional Metrology Workshop is Dimensional Metrology - Precision Measurements in the New Millennium, it is...

Effects of Cleaning on the US Prototype Kilograms

January 1, 2001

Author(s)

Zeina J. Kubarych, R S. Davis

This paper dicusses the stability of national prototype kilograms No. 4 and No. 20, belonging to the United States. Calibration history, changes in mass with...

Uncertainties in Interferometric Measurements of Radius of Curvature

January 1, 2001

Author(s)

Tony L. Schmitz, Angela Davies, Christopher J. Evans

The radius of curvature of spherical surfaces may be determined using the well-known radius, or optical, bench. In this method, a figure measuring...

A Single ¹⁹⁹Hg⁺ Ion Optical Clock

January 1, 2001

Author(s)

James C. Bergquist, Christopher W. Oates, E A. Curtis, Leo W. Hollberg, Robert E. Drullinger, Wayne M. Itano, David J. Wineland, T Udem

Technologies for Condition-Based Maintenance of Machine Tools

January 1, 2001

Author(s)

M A. Donmez, Kari K. Harper, Kang B. Lee

NIST has embarked upon a research effort to advance the capabilities and promote the continued growth of condition-based maintenance (CBM) technologies for the...

Evaluation of Load Cells for Legal Metrology at NIST

January 1, 2001

Author(s)

Kevin L. Chesnutwood

Load cells for use in legal metrology issues are evaluated in accordance with the National Type Evaluation Program (NTEP) and the International Organization of...

Embedded Power Quality Solutions for Computer Numerical Control Machine Tools

January 1, 2001

Author(s)

Bradley N. Damazo, M Stephens, Johannes A. Soons, M A. Donmez

Electric Power Research Institute (EPRI) research and testing, conducted over many years, has indicated that variations in electric power quality can negatively...

Strengths and Limitations of Surface Texture Characterization Techniques

January 1, 2001

Author(s)

Theodore V. Vorburger

Surface finish is important to the function of a wide range of industrial components including highways, ship hulls and propellers, mechanical parts...

Establishment of a Virtual/Physical Standard for Bullet Signature Measurements

January 1, 2001

Author(s)

Jun-Feng Song, Theodore V. Vorburger, M Ols

The National Integrated Ballistics Information Network (NIBIN) is currently under development by the Bureau of Alcohol, Tobacco and Firearms (ATF) and the...

Establishment of a Virtual / Physical Standard for Bullet Signature Measurements

January 1, 2001

Author(s)

Jun-Feng Song, Theodore V. Vorburger, M Ols

The National Integrated Ballistics Information Network (NIBIN) is currently under development by the Bureau of Alcohol, Tobacco and Firearms (ATF) and the...

Cluster Primary Ion Beam Secondary Ion Mass Spectrometry for Semiconductor Characterization

January 1, 2001

Author(s)

John G. Gillen, S V. Roberson, Albert J. Fahey, Marlon L. Walker, J Bennett, R Lareau

We are evaluating the use of polyatomic and cluster primary ion beams for characterization of semiconductor materials by secondary ion mass spectrometry using...

Epoxy Clay Hybrid (ECH) Nanocomposites: Strategies for the Dispersion of Clay Platelets in Amine-Cured Epoxy Resins

January 1, 2001

Author(s)

Gale A. Holmes, Karen Ford

Process Monitoring at the National Institute of Standards and Technology: Celebrating 100 Years of Measurement Excellence

January 1, 2001

Author(s)

Anthony J. Bur, Kalman D. Migler, S C. Roth

Temperature Monitoring of Capillary Rheometry Using a Fluorescence Technique

January 1, 2001

Author(s)

Anthony J. Bur, S C. Roth, H Lobo

A non-contact temperature monitoring technique based on fluorescence spectroscopy was used to measure the temperature of a polymer resin during capillary...

Molecular Measuring Machine Design and Performance

January 1, 2001

Author(s)

John A. Kramar, Jay S. Jun, William B. Penzes, Vincent P. Scheuerman, Fredric Scire, E C. Teague

We have developed a metrology instrument called the Molecular Measuring Machine (M3) with the goal of performing two-dimensional point-to-point measurements...