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Conferences

Nonlinearity of Response of Silicon Photodiodes at 193 nm

Author(s)
Shao Yang, Darryl A. Keenan, Marla L. Dowell
We have developed a measurement system based on a correlation method to characterize the nonlinearity response of silicon photodiodes to pulsed-laser radiation...

Challenges in Automotive Display Standards

Author(s)
Edward F. Kelley, Silviu Pala
We review the goals, accomplishments, and directions of the Society for Automotive Engineers (SAE) J1757 Vehicular Flat Panel Display Metrology Committee. The...

NIST Reference Colorimeter

Author(s)
Maria E. Nadal, Robert R. Bousquet, Gael Obein
The Optical Technology Division at the National Institute of Standards and Technology (NIST) developed a reference instrument for measuring the surface color of...

Measuring Internal Geometry of Fiber Ferrules

Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
The focus of this paper is on the metrology of microstructures. Traditional Coordinate Measuring Machines (CMM) are limited to measuring holes of 300 m...

Results From the NIST 2004 DNA Quantitation Study

Author(s)
Margaret C. Kline, David L. Duewer, Janette W. Redman, John M. Butler
For optimal DNA Short Tandem Repeat (STR) typing results, the DNA concentration ([DNA]) of the sample must be accurately determined prior to the polymerase...

High-resolution Optical Metrology

Author(s)
Richard M. Silver, Ravikiran Attota, Michael T. Stocker, M R. Bishop, Lowell P. Howard, Thomas A. Germer, Egon Marx, M P. Davidson, Robert D. Larrabee
Recent advances in optical imaging techniques have unveiled new possibilities for optical metrology and optical-based process control measurements of features...

IPv6: Hope, Hype, and (Red) Herrings

Author(s)
Douglas C. Montgomery
We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric...

Wavelet-Based Enveloping for Spindle Health Diagnosis

Author(s)
Li Zhang, Robert Gao, Kang B. Lee
A new method for identifying structural defect-induced vibration signals was developed based on the analytic wavelet transform. The advantage of this method is...

Micro-Feature Metrology

Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
This presentation focuses on three aspects of micro-feature metrology novel applications that drive research and commercialization, capabilities and limitations...

Unbiased Estimation of Linewidth Roughness

Author(s)
John S. Villarrubia, B Bunday
Line width roughness (LWR) is usually estimated simply as three standard deviations of the line width. The effect of image noise upon this metric includes a...

Mobility Open Architecture Simulation and Tools Environment

Author(s)
Stephen B. Balakirsky, Christopher J. Scrapper Jr, Elena R. Messina
This paper will describe the Mobility Open Architecture Tools and Simulation (MOAST) environment. This environment conforms to the NIST 4D/RCS architecture [3]...
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