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Many publishing houses are moving to online manuscript submissions and processing systems to manage the work of receiving, reviewing, and publishing scholarly
Many publishing houses are moving to online manuscript submissions and processing systems to manage the work of receiving, reviewing, and publishing scholarly
Steven P. Mates, Frank S. Biancaniello, S D. Riddle
Research at the National Bureau of Standards (now the National Institute of Standards and Technology or NIST) involving the gas atomization of liquid metals has
Wide-ranging viscosity measurements of the blends RA410A (0.5 R32+0.5R125 by mass) and R507A (0.5 R143a+ 0.5R125 by mass) were carried out in a torsional
Lili Wang, Adolfas K. Gaigalas, Y Zong, S Zhang, J Shi, Yunda Wang
Efficient hybridization of complementary strands of DNA is the underlying principle of all microarray-based techniques for gene expression analysis. Recently
Amy S. Rushing, C J. Leng, Robert E. Chapman, Harold E. Marshall
Owners and managers of constructed facilities need help in optimizing protection against low-probability, extreme events, such as natural hazards and terrorist
Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Weston L. Tew, D. R. White, John M. Martinis
We describe our progress towards a high-precision measurement of temperature using Johnson noise. Using a Quantized Voltage Noise Source (QVNS) based on the
Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Yonuk Chong
Recent advances in circuit design and fabrication of superconducting integrated circuits have enabled us to demonstrate for the first time an ac Josephson
An investigation of the response of high-value resistance standards and elements to applied potential has showed that the processes used to prepare and
R L. Rusby, Christopher W. Meyer, Weston L. Tew, D I. Head, K D. Hill, O Tamura, P A. de Groot, B Fellmuth, A Storm, A Peruzzi, J Engert, D N. Astrov, Y Dedikov, G A. Kytin
At its meeting in 1996 the CCT initiated five Key Comparisons to test the equivalence of realisations of the ITS-90 between National Measurement Institutes. CCT
Mayumi Ishizaki, Hirotake Yamamori, A. Shoji, Paul Dresselhaus, Samuel Benz
A programmable Josephson voltage standard chip using arrays of NbN/TiN/NbN/TiN/NbN double-junction stacks was fabricated and operated at 10 K. The circuit with
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and
The transient behavior of a small-scale cryogenic transfer line was investigated during chilldown to cryogenic temperatures. The vacuum-jacketed apparatus
Yi-hua D. Tang, Michael A. Lombardi, David A. Howe
The uncertainty in voltage measurement in a Josephson voltage standard (JVS) is proportional to the uncertainty of frequency measurement. The 10 MHz time-base
Randolph Elmquist, Emmanouel S. Hourdakis, Dean G. Jarrett, Neil M. Zimmerman
We describe the operation of a cryogenic current comparator (CCC) bridge that attains high current sensitivity while maintaining stability under a range of
We have studied the voltage noise of electronic voltage standards based on Zener diode references (Zeners). Ten volt Zener outputs were compared to NIST
The United States Government as well as the industrial controls sector has come to realize that securing computer systems that control industrial production and
Andras Vladar, Crossley E. Jayewardene, Bradley N. Damazo, William J. Keery, Michael T. Postek
The development of a very fast, very accurate laser stage measurement system facilitates a new method to enhance the image and line scan resolution of scanning
International SEMATECH (ISMT and the National Institute of Standards and Technology (NIST) are working together to improve the traceability of AFM dimensional
M P. Davidson, M R. Bishop, Robert D. Larrabee, Michael T. Stocker, Jay S. Jun, Egon Marx, Richard M. Silver, Ravikiran Attota
Two types of overlay targets have been designed and evaluated for the study of optical overlay metrology. They are in-chip and arrayed overlay targets. In-chip
S Wetzel, Charles M. Guttman, Kathleen M. Flynn, James J. Filliben
One of the most significant issues in any analytical practice is optimization. Optimization and calibration are key factors in quantitation. In matrix-assisted
Tilt is the slope in waveform values that occurs before and/or after a waveform transition. Tilt causes a bias in the computed values of waveform state levels
Donald R. Larson, Nicholas Paulter, David I. Bergman
The pulse parameters of amplitudes and transition duration (10% to 90%) are examined as a function of the epoch and position of the transition edge in the epoch
A Bartels, Scott A. Diddams, Christopher W. Oates, G Wilpers, Windell Oskay, James C. Bergquist, Leo W. Hollberg
A femtosecond laser frequency comb transfers the low phase and frequency noise of a cavity-stabilized CW laser to the microwave domain. Phase noise of -115 dBc