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Conferences

Characterization of Structural Quality of Bonded Silicon-On-Insulator Wafers by Spectroscopic Ellipsometry and Raman Spectroscopy

May 9, 2005

Author(s)

Nhan Van Nguyen, James E. Maslar, Junghyeun Kim, Jin-Ping Han, Jin-Won Park, Deane Chandler-Horowitz, Eric M. Vogel

The crystalline quality of bonded Silicon-On-Insulator (SOI) wafers were examined by spectroscopic ellipsometry and Raman spectroscopy. Both techniques detect...

Temperature Control of Microfluidic Systems by Microwave Heating

May 5, 2005

Author(s)

Siddarth Sundaresan, Brian J. Polk, Darwin Reyes-Hernandez, M Rao, Michael Gaitan

Hierarchical Control and Performance Evaluation of Multi-Vehicle Autonomous Systems

May 4, 2005

Author(s)

Stephen B. Balakirsky, Christopher J. Scrapper Jr, Elena R. Messina

This paper will describe how the Mobility Open Architecture Tools and Simulation (MOAST) framework can facilitate performance evaluations of RCS compliant multi...

Particle Size Metrology: Comparison Between Aerosol Electrical Mobility and Laser Surface Light Scattering Techniques

May 2, 2005

Author(s)

Thomas A. Germer, George W. Mulholland

Two different methods used to determine the size of polystyrene spheres were found to disagree by about 5 %. One of the methods, differential mobility analysis...

Air-Bridge Integrated Slot-Ring Antennas for HEB Devices: New Fabrication Techniques

May 2, 2005

Author(s)

Dazhen Gu, Eyal Gerecht, Xin Zhao, Sigfrid Yngvesson

In order to develop multi-pixel focal plane arrays at terahertz frequencies based on HEB technology, special consideration must be given to the power coupling...

Measuring Internal Geometry of Fiber Ferrules

May 1, 2005

Author(s)

Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup

The focus of this paper is on the metrology of microstructures. Traditional Coordinate Measuring Machines (CMM) are limited to measuring holes of 300 m...

Broad Spectrum Capabilities for CW Laser Power Measurements at NIST

May 1, 2005

Author(s)

Joshua A. Hadler

Recent improvements for mid-level laser power measurements (1 μW to 1 W) have increased the range of calibrations available to customers of our CW laser power...

Results From the NIST 2004 DNA Quantitation Study

May 1, 2005

Author(s)

Margaret C. Kline, David L. Duewer, Janette W. Redman, John M. Butler

For optimal DNA Short Tandem Repeat (STR) typing results, the DNA concentration ([DNA]) of the sample must be accurately determined prior to the polymerase...

High-resolution Optical Metrology

May 1, 2005

Author(s)

Richard M. Silver, Ravikiran Attota, Michael T. Stocker, M R. Bishop, Lowell P. Howard, Thomas A. Germer, Egon Marx, M P. Davidson, Robert D. Larrabee

Recent advances in optical imaging techniques have unveiled new possibilities for optical metrology and optical-based process control measurements of features...

IPv6: Hope, Hype, and (Red) Herrings

May 1, 2005

Author(s)

Douglas C. Montgomery

We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric...

Wavelet-Based Enveloping for Spindle Health Diagnosis

May 1, 2005

Author(s)

Li Zhang, Robert Gao, Kang B. Lee

A new method for identifying structural defect-induced vibration signals was developed based on the analytic wavelet transform. The advantage of this method is...

Comparison of Measurements and Simulations for Machining of Aluminum

May 1, 2005

Author(s)

Robert W. Ivester, Eric P. Whitenton, Laurent Deshayes

This paper compares experimental measurements and model-based simulations of cutting temperature, force, and chip thickness for machining of aluminum. Cutting...

A Simulation System with Neutral Data Interface for Shipbuilding Operation

May 1, 2005

Author(s)

Guodong Shao, Charles R. McLean, Swee K. Leong

Simulation technology is underutilized in the shipbuilding industry. The development of neutral data interfaces between simulation and other software...

Micro-Feature Metrology

May 1, 2005

Author(s)

Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup

This presentation focuses on three aspects of micro-feature metrology novel applications that drive research and commercialization, capabilities and limitations...

Second Primages on n-bit Hash Functions for Much Less than 2n Work

May 1, 2005

Author(s)

John M. Kelsey, B Schneier

We expand a previous result of Dean[Dea99] to provide a second preimage attack on all n-bit iterated hash functions with Damgard-Merkle strengthening and n-bit...

Toward Computer-Aided Conceptual Design of Mechatronic Devices with Multiple Interaction-States

May 1, 2005

Author(s)

Chong Xu, Satyandra K. Gupta, Z Yao, Michael Gruninger, Ram D. Sriram

In multiple interaction-state mechatronic devices the interactions between elements of use-environment and elements of the device can have different qualitative...

Unbiased Estimation of Linewidth Roughness

May 1, 2005

Author(s)

John S. Villarrubia, B Bunday

Line width roughness (LWR) is usually estimated simply as three standard deviations of the line width. The effect of image noise upon this metric includes a...

Application of Machine Shop Data Model in Manufacturing Simulation

May 1, 2005

Author(s)

Yan Luo, Yung-Tsun Lee

Simulation technology holds tremendous promise for the manufacturing industry. A machine shop data model has been developed at the National Institute of...

Next Generation Simulation-based Design Technologies for Electronics Product Realization

May 1, 2005

Author(s)

Manas Bajaj, Dirk Zwemer, Russell Peak, Mike Dickerson, Thomas Thurman, Kevin G. Brady, John V. Messina

The realm of electronics product realization is marked by an extremely fast-paced market, stringent demands for product reliability and high importance to...

Data Analysis Considerations in Probing Single Quantum Dot Fluorescence Intermittency

April 28, 2005

Author(s)

J R. Krogmeier, Jeeseong C. Hwang

The fluorescence intermittency of single, bare, CdSe/ZnS quantum dots were probed using single molecule confocal microscopy and found to demonstrate power law...

Development of Bioreactor for In Situ Optical Imaging

April 27, 2005

Author(s)

J S. Stephens, James A. Cooper, Joy P. Dunkers

Mobility Open Architecture Simulation and Tools Environment

April 21, 2005

Author(s)

Stephen B. Balakirsky, Christopher J. Scrapper Jr, Elena R. Messina

This paper will describe the Mobility Open Architecture Tools and Simulation (MOAST) environment. This environment conforms to the NIST 4D/RCS architecture [3]...

The Contribution of HfO2 Bulk Oxide Traps to Dynamic NBTI in pMOSFETs

April 20, 2005

Author(s)

Baozhong Zhu, John S. Suehle, Eric M. Vogel, Joseph B. Berstein

NBTI of HfO2 and SiO2 devices are studied and compared. The pulsed stress frequency responses of DVth and acceleration parameters are quite different for them...

Extraction of Critical Dimension Reference Feature CDs from New Test Structure Using HRTEM Imaging

April 18, 2005

Author(s)

Richard A. Allen, Amy Hunt, Christine E. Murabito, Brandon Park, William F. Guthrie, Michael W. Cresswell

NIST has an ongoing effort to provide the semiconductor industry with critical dimension CD reference materials, using the silicon (111) lattice spacing as a...

Comparison of SEM and HRTEM CD-Measurements Extracted from Monocrystalline Tes-Structures Having Feature Linewidths from 40 nm to 240 nm

April 18, 2005

Author(s)

Michael W. Cresswell, Brandon Park, Richard A. Allen, William F. Guthrie, Ronald G. Dixson, Wei Tan, Christine E. Murabito

CD measurements have been extracted from SEM and HRTEM images of the same set of monocrystalline silicon features having linewidths between 40 and 200 nm. The...

Application of Combinatorial Methods for the Testing of Adhesives

April 10, 2005

Author(s)

Christopher M. Stafford

This presentation will focus on the development and application of novel high-throughput platforms for both adhesion and mechanical property testing. For...

Ultrasonic Estimation of Mechanical Properties of Pulmonary Arterial Wall under Normoxic and Hypoxic Conditions

April 9, 2005

Author(s)

Kendall Waters, O M. Mukdadi

Secondary pediatric pulmonary hypertension is a disease that could benefit from improved ultrasonic diagnostic techniques. We perform high-frequency in vitro...

Microfabricated atomic frequency references

April 5, 2005

Author(s)

John Kitching, Svenja A. Knappe, Li-Anne Liew, John Moreland, Hugh Robinson, P Schwindt, V Shah, Leo W. Hollberg

We describe a design for a microfabricated atomic frequency reference with a volume of several cubic millimetres and a power dissipation in the range ot tens of...

Out-of-Plane Polarimetric Imaging of Skin: Surface and Subsurface Effects

April 4, 2005

Author(s)

J C. Ramella-Roman, D Duncan, Thomas A. Germer

True borders of certain skin cancers are hard to detect by the human eye. For this reason, techniques such as polarized light imaging have been used to enhance...

Autonomy Levels for Unmanned Systems (ALFUS) Framework: An Update

April 4, 2005

Author(s)

Hui-Min Huang, K Pavek, James S. Albus, Elena R. Messina

The initial construct of the framework for the Autonomy Levels of Unmanned Systems (ALFUS) was presented in the 2004 SPIE Defense and Security Symposium. This...

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