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Conferences

NIST Experiments in Gas Atomization 1986-1999

Author(s)
Steven P. Mates, Frank S. Biancaniello, S D. Riddle
Research at the National Bureau of Standards (now the National Institute of Standards and Technology or NIST) involving the gas atomization of liquid metals has

Software for Optimizing Protection of Constructed Facilities

Author(s)
Amy S. Rushing, C J. Leng, Robert E. Chapman, Harold E. Marshall
Owners and managers of constructed facilities need help in optimizing protection against low-probability, extreme events, such as natural hazards and terrorist

Flat-Spot Measurements for an AC Josephson Voltage Standard

Author(s)
Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Yonuk Chong
Recent advances in circuit design and fabrication of superconducting integrated circuits have enabled us to demonstrate for the first time an ac Josephson

Settling Times of High-Value Standard Resistors

Author(s)
Dean G. Jarrett, Randolph Elmquist
An investigation of the response of high-value resistance standards and elements to applied potential has showed that the processes used to prepare and

Digital Forensics - Using Perl to Harvest Hash Sets

Author(s)
Douglas R. White, John M. Tebbutt
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and

Digital Forensics ¿ Using Perl to Harvest Hash Sets

Author(s)
Douglas R. White, John M. Tebbutt
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and

Cryogenic Transfer Line Chilldown

Author(s)
N T. Van Dresar, James D. Siegwarth
The transient behavior of a small-scale cryogenic transfer line was investigated during chilldown to cryogenic temperatures. The vacuum-jacketed apparatus

Reference Metrology Using a Next Generation CD-AFM

Author(s)
Ronald G. Dixson, Angela Guerry
International SEMATECH (ISMT and the National Institute of Standards and Technology (NIST) are working together to improve the traceability of AFM dimensional

Evaluation of New In-Chip and Arrayed Line Overlay Target Designs

Author(s)
M P. Davidson, M R. Bishop, Robert D. Larrabee, Michael T. Stocker, Jay S. Jun, Egon Marx, Richard M. Silver, Ravikiran Attota
Two types of overlay targets have been designed and evaluated for the study of optical overlay metrology. They are in-chip and arrayed overlay targets. In-chip