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PUBLICATIONS

Wavelet-Based Enveloping for Spindle Health Diagnosis

Published

Author(s)

Li Zhang, Robert Gao, Kang B. Lee

Abstract

A new method for identifying structural defect-induced vibration signals was developed based on the analytic wavelet transform. The advantage of this method is that it extracts defect-related impulse signal and constructs its envelope in a single step, eliminating the need for intermediate operations. Theoretical background of the analytic wavelet transform is studied. Analysis of numerically simulated and experimental vibration signals have confirmed that the developed method can successfully detect the small defect-induced impulses that are buried in the main vibration and noise signals.
Conference Dates
May 17-19, 2005
Conference Location
Ottawa, CA
Conference Title
IMTC 2005 Conference
Pub Type
Conferences

Keywords

analytic wavelet, spindle health diagnosis, wavelet enveloping
Sensors

Citation

Zhang, L. , Gao, R. and Lee, K. (2005), Wavelet-Based Enveloping for Spindle Health Diagnosis, IMTC 2005 Conference, Ottawa, CA (Accessed May 6, 2024)

Created May 1, 2005, Updated February 19, 2017