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Conferences

Efficiently Generation of Correlated Photon Pairs in Microstructure Fibers

May 22, 2005

Author(s)

Jingyun Fan, Alan L. Migdall, L Wang

We report the efficient generation of correlated photon pairs by four-wave mixing in a 1.8 meter long microstructure fiber. The detected coincidence rate is 10...

Optical Atomic Clocks: A Revolution in Perfomance

May 22, 2005

Author(s)

Leo W. Hollberg

Optical atomic clocks using cold atoms, stable lasers and femtosecond laser frequency combs provide high accurace and stability from RF to the ultraviolet. They...

The Performance of Chip-Scale Atomic Clocks

May 22, 2005

Author(s)

Svenja A. Knappe, P Schwindt, Leo W. Hollberg, John E. Kitching, V Shah, Vladislav Gerginov

We compare the performance of two chip-scale atomic clock physics packages, one based on excitation using the D 2 line if Cs and the other using the D 1 line of...

Ultra-high Stability Optical Frequency Standard Based on Laser-Cooled Neutral Calcium

May 22, 2005

Author(s)

G Wilpers, Christopher W. Oates, Scott A. Diddams, A Bartels, Windell Oskay, James C. Bergquist, Leo W. Hollberg

A beatnote between the Ca and Hg+ optical frequency standards via a mode-locked fs-laser frequency comb demonstrates the highest frequency stability measured to...

Enhanced mode extraction in AlOx/GaAs microcavity pillars and circular gratings

May 22, 2005

Author(s)

Mark Su, Richard P. Mirin

Micropillars and deep circular gratings etched into planar aluminum oxide/GaAs microcavities display small mode volumes, enhanced spontaneous emission, and...

Frequency Comb Dynamics of a Solitonic Fiber Laser: Theory

May 22, 2005

Author(s)

Nathan R. Newbury, Brian Washburn

The effects of Raman, self-steepening and higher-order dispersion on a fiber-laser frequency comb are analyzed using perturbation theory. Transfer functions are...

A variable repetition rate frequency comb for infrared frequency metrology

May 22, 2005

Author(s)

Brian Washburn, R W. Fox, William C. Swann, Nathan R. Newbury, Jeffrey W. Nicholson, K Feder, Paul S. Westbrook

A frequency comb generated by a variable repetition rate mode-locked fiber laser is presented. The spacing of the frequency comb can be scanned while one comb...

Laser Cooling of Erbium Atoms

May 21, 2005

Author(s)

Jabez J. McClelland, H Y. Ban, Marcus Jacka, James L. Hanssen, Joseph Reader

We have identified five closed, or nearly-closed, J ? J + 1 transitions in atomic erbium at wavelengths of 401 nm, 583 nm, 631 nm, 841 nm, and 1299 nm. These...

Direct Measurement of the Counterion Distribution Within Swollen Polyelectrolyte Films

May 20, 2005

Author(s)

Vivek M. Prabhu, B D. Vogt, Wen-Li Wu, Jack F. Douglas, Eric K. Lin, Sushil K. Satija, D M. Goldfarb, H Ito

A depth profile of the counterion concentration within thin polyelectrolyte films was measured in-situ using contrast variant specular neutron reflectivity to...

NIST Facility for Color Rendering Simulation, ed. by, J.L. Nieves and J.H-Andres

May 20, 2005

Author(s)

Wendy L. Davis, J L. Gardner, Yoshihiro Ohno

Holographic microantenna array metrology

May 19, 2005

Author(s)

Erich N. Grossman, Arttu Luukanen, Aaron J. Miller

We describe a holographic or "phaseless" technique for measurement of complex antenna patterns that is particularly suited to planar antennas at very high...

Passive hyperspectral terahertz imagery for security screening using a cryogenic microbolometer

May 19, 2005

Author(s)

Arttu Luukanen, Aaron J. Miller, Erich N. Grossman

We present passive indoor imagery of human subjects in the 100 - 1000 GHz band. In order to obtain adequate ensitivity, a cryogenically cooled (4 K), broadband...

Software Interoperability: Enabling New Technologies

May 19, 2005

Author(s)

John V. Messina, Matthew L. Aronoff, Eric D. Simmon

New and potentially disruptive technologies are constantly being introduced into the electronic interconnection industry as companies seek to improve their...

Sensor Location Through Linear Programming With Triangle Inequality Constraints

May 16, 2005

Author(s)

Camillo A. Gentile

Interest in dense sensor networks due to falling price and reduced size has motivated research in sensor location in recent years. While many algorithms can be...

Machining Cracks in Finished Ceramics

May 16, 2005

Author(s)

George D. Quinn, L K. Ives, S Jahanmir

Well prepared strength test specimens and components break from a material s inherent flaws and machining damage has no effect on strength. On the other hand...

Realization and Application of a Detector-Based Tristimulus Color Scale at the National Institute of Standards and Technology, USA

May 13, 2005

Author(s)

George P. Eppeldauer, Steven W. Brown, Keith R. Lykke, Yoshihiro Ohno

The recently introduced detector-based calibration method for tristimulus colorimeters has been realized. The NIST reference colorimeter has been calibrated for...

NIST Facility for Color Rendering Simulation

May 13, 2005

Author(s)

Wendy L. Davis, J L. Gardner, Yoshihiro Ohno

The color rendering index (CRI) does not adequately assess the color rendering properties of solid-state light sources. An improved metric will be critical to...

A Flexible Bandpass Correction Method for Spectrometers

May 13, 2005

Author(s)

Yoshihiro Ohno

An improved method for the correction of bandpass errors in spectrometers has been developed. This method is an improvement over the Stearns and Stearns method...

EUV component and system characterization at NIST for the support of extreme-ultraviolet lithography, ed. by R.S. Mackay

May 13, 2005

Author(s)

S Grantham, Shannon B. Hill, Charles Tarrio, Robert E. Vest, Thomas B. Lucatorto

Opportunities and Challenges for Indium Phosphide and Related Materials: The International Technology Roadmap for Semiconductors Perspective

May 12, 2005

Author(s)

Herbert S. Bennett, Julio Costa, Anthony A. Immorlica, Charles E. Weitzel

Selected opportunities and technical challenges for indium phosphide and related materials from the perspective of the International Technology Roadmap for...

On the Ignition of Fuel Beds by Firebrands.

May 11, 2005

Author(s)

Samuel L. Manzello, Thomas G. Cleary, John R. Shields, Jiann C. Yang

An experimental apparatus has been built to investigate the ignition of fuel beds as a result of impact with burning firebrands. The apparatus allowed for the...

Developments in the NIST Special Test for Spatial Uniformity of Laser and Optical Fiber Power Meters (or Detectors Used with Lasers)

May 11, 2005

Author(s)

David J. Livigni

Detector uniformity is measured using a specially designed system which provides a small beam of laser radiation (at nominal wavelengths of 850 nm, 1300 nm, or...

Display Metrology Concerns International Standards

May 11, 2005

Author(s)

Paul A. Boynton

An alphabet soup of display standards addresses the various needs and applications of display manufactures, integrators, and users. Unfortunately, when it comes...

Variable-Radius Source Method to Separate Specular Component from Haze Peak

May 11, 2005

Author(s)

Edward F. Kelley

People in the electronic display industry enjoy simple apparatus configurations in order to characterize reflection properties of displays. Generally...

High-power nonlinearity of optical fiber power meters at 1474 nm

May 11, 2005

Author(s)

Igor Vayshenker, Ralph Swafford, Shao Yang

We have developed a system to measure the nonlinearity of optical fiber power meters (OFPMs) at a maximum power of 0.6 W at 1474 nm. The system is based on the...

Identification of a strongly nonlinear device compact model based on vectorial large signal measurements

May 11, 2005

Author(s)

M Camprini, Alessandro Cidronali, I. Magrini, Giovanni Loglio, G. Collodi, Jeffrey Jargon, Gianfranco Manes

This paper deals with the identification of equivalent circuit models for strongly nonlinear devices by taking advantage of the so-called "Vectorial Large...

Nonlinearity of Response of Silicon Photodiodes at 193 nm

May 11, 2005

Author(s)

Shao Yang, Darryl A. Keenan, Marla L. Dowell

We have developed a measurement system based on a correlation method to characterize the nonlinearity response of silicon photodiodes to pulsed-laser radiation...

A Color Gamut Assessment Standard: An Inter-Laboratory Measurement Comparison

May 11, 2005

Author(s)

Paul A. Boynton, Libert M. John, Edward F. Kelley

In earlier papers, NIST proposed a standard illumination source and optical filter targets to with which to assess the state-of-the-art of display measurement...

Challenges in Automotive Display Standards

May 11, 2005

Author(s)

Edward F. Kelley, Silviu Pala

We review the goals, accomplishments, and directions of the Society for Automotive Engineers (SAE) J1757 Vehicular Flat Panel Display Metrology Committee. The...

NIST Reference Colorimeter

May 9, 2005

Author(s)

Maria E. Nadal, Robert R. Bousquet, Gael Obein

The Optical Technology Division at the National Institute of Standards and Technology (NIST) developed a reference instrument for measuring the surface color of...

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