U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Measuring Internal Geometry of Fiber Ferrules

Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
The focus of this paper is on the metrology of microstructures. Traditional Coordinate Measuring Machines (CMM) are limited to measuring holes of 300 m

Results From the NIST 2004 DNA Quantitation Study

Author(s)
Margaret C. Kline, David L. Duewer, Janette W. Redman, John M. Butler
For optimal DNA Short Tandem Repeat (STR) typing results, the DNA concentration ([DNA]) of the sample must be accurately determined prior to the polymerase

High-resolution Optical Metrology

Author(s)
Richard M. Silver, Ravikiran Attota, Michael T. Stocker, M R. Bishop, Lowell P. Howard, Thomas A. Germer, Egon Marx, M P. Davidson, Robert D. Larrabee
Recent advances in optical imaging techniques have unveiled new possibilities for optical metrology and optical-based process control measurements of features

IPv6: Hope, Hype, and (Red) Herrings

Author(s)
Douglas C. Montgomery
We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric

Wavelet-Based Enveloping for Spindle Health Diagnosis

Author(s)
Li Zhang, Robert Gao, Kang B. Lee
A new method for identifying structural defect-induced vibration signals was developed based on the analytic wavelet transform. The advantage of this method is

Micro-Feature Metrology

Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
This presentation focuses on three aspects of micro-feature metrology novel applications that drive research and commercialization, capabilities and limitations

Unbiased Estimation of Linewidth Roughness

Author(s)
John S. Villarrubia, B Bunday
Line width roughness (LWR) is usually estimated simply as three standard deviations of the line width. The effect of image noise upon this metric includes a

Mobility Open Architecture Simulation and Tools Environment

Author(s)
Stephen B. Balakirsky, Christopher J. Scrapper Jr, Elena R. Messina
This paper will describe the Mobility Open Architecture Tools and Simulation (MOAST) environment. This environment conforms to the NIST 4D/RCS architecture [3]

Microfabricated atomic frequency references

Author(s)
John Kitching, Svenja A. Knappe, Li-Anne Liew, John Moreland, Hugh Robinson, P Schwindt, V Shah, Leo W. Hollberg
We describe a design for a microfabricated atomic frequency reference with a volume of several cubic millimetres and a power dissipation in the range ot tens of
Was this page helpful?