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Conferences

Metrology for High-Voltage, High-Speed Silicon-Carbide Power Devices

April 4, 2005

Author(s)

Allen R. Hefner Jr., David W. Berning, Colleen E. Hood

Performance metrics and test instrumentation needs for emerging high-voltage, high-speed SiC power devices are described. Unique power device and package...

Comparison of SEM and HRTEM CD-Measurements Extracted From Monocrystalline Tes-Structures Having Feature Linewidths From 40 nm to 240 nm

April 4, 2005

Author(s)

W Tan, Robert Allen, Michael W. Cresswell, Christine E. Murabito, B C. Park, Ronald G. Dixson, William F. Guthrie

CD measurements have been extracted from SEM and HRTEM images of the same set of monocrystalline silicon features having linewidths between 40 and 200 nm. The...

A Rapid-Setting TTCP-DCPD Cement Study of the Setting Reaction as a Function of Time

April 1, 2005

Author(s)

Elena F. Burguera, F Guitian, Laurence C. Chow

The progression of the setting reaction of a TTCP-DCPD rapid setting cement was investigated as a function of time. Compressive strength and extent of...

Magnetic Method to Characterize the Current Densities in a Breaker Arc

April 1, 2005

Author(s)

Nadia Machkour-Deshayes

The purpose of this research was to use magnetic induction measurements from a low voltage electric arc, to reconstruct the arc''s current density. The...

Combinatorial Methods to Access Cellular Response to Bis-GMA/TEGDMA Vinyl Conversion Levels

April 1, 2005

Author(s)

Nancy J. Lin, L A. Bailey, N Washburn

To facilitate the evaluation of dental composites, high throughput methods to fabricate dental resins with varying conversion levels were developed. Resins of 2...

A B C of Engineering Statistics and a Reference Benchmark Approach to Verification and Validation (V & V) of Multi-Physics Simulations of High-Consequence Engineering Systems

April 1, 2005

Author(s)

Jeffrey T. Fong

We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in...

Real-time Applications for Sensor Networks

April 1, 2005

Author(s)

Hamid Gharavi

We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the...

Software Assurance Metrics and Tool Evaluation (SAMATE)

April 1, 2005

Author(s)

Michael J. Kass

The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and...

A Model Driven Standards Process

April 1, 2005

Author(s)

Arthur Griesser

Explains how and why UML models fit into a robust formal standardization process based on the best practices of software development.

Optical Flatness Metrology for 300 mm Silicon Wafers

April 1, 2005

Author(s)

Ulf Griesmann, Quandou (. Wang, T D. Raymond

At the National Institute of Standards and Technology (NIST), we are developing two interferometric methods for measuring the thickness variation and flatness...

Experiments Toward Non-Contact Safety Standards for Automated Industrial Vehicles

April 1, 2005

Author(s)

Roger V. Bostelman, Tsai Hong Hong, Rajmohan Madhavan

The performance evaluation of an obstacle detection and segmentation algorithm for Automated Guided Vehicle (AGV) navigation in factory-like environments using...

Inverter Dynamic Electro-Thermal Modeling and Simulation with Experimental Verification

April 1, 2005

Author(s)

John V. Reichl, Allen R. Hefner Jr., Ty R. McNutt, David W. Berning

Microstructure Evolution during Electric Current Induced Thermomechanical Fatigue of Interconnects

April 1, 2005

Author(s)

Robert Keller, Roy H. Geiss, Yi-Wen Cheng, David T. Read

We demonstrate the evolution of microstructure and deformation associated with the use of electrical methods for evaluating mechanical reliability of patterned...

TEM Analysis of Deformation in Thin Films of Aluminum after both AC Thermomechanical and Tensile Deformation

April 1, 2005

Author(s)

Roy H. Geiss, Robert Keller, David T. Read, Yi-Wen Cheng

Thin films of sputtered aluminum were deformed by two distinctly different experimental techniques. One experiment comprised of passing high electrical AC...

Software Assurance Common Body of Knowledge Development Event|||April 4-6, 2005|National Defense University|Washington, DC.

April 1, 2005

Author(s)

M Koo

The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and...

Investigation of the Effect of Using Different Material Models on Finiste Element Simulations of Machining

April 1, 2005

Author(s)

A H. Adibi-Sedeh, M Vaziri, V Pednekar, V Madhavan, Robert W. Ivester

Choosing the appropriate constitutive model is important in finite element analysis (FEA) of different metal forming processes. Due to the presence of high...

Targeted Search: Reducing the Time and Cost for Searching for Objects in Multiple-Server Networks

April 1, 2005

Author(s)

G Perara, K Christensen, Allen L. Roginsky

In many applications - including P2P file sharing, content distribution networks, and grid computing - a single object will be searched for in multiple servers...

Mechanisms of Osteoblast Adhesion on 3D Polymer Scaffolds Made by Rapid Prototyping

April 1, 2005

Author(s)

T DuttaRoy, Francis W. Wang, J J. Stone, E H. Cho, S J. Lockett

In this study, we looked at the adhesion of osteoblasts on 3D polycaprolactone (PCL) scaffolds compared to 2D PCL films and glass coverlsips. This adhesion was...

Pub. 16 - Committee Reports for the 90th National Conference on Weights and Measures Meeting Agenda

March 30, 2005

Author(s)

Linda D. Crown, K M. Dresser, Steven E. Cook, Juana S. Williams, R C. Suiter, Tina G. Butcher

This is the Annual Meeting agenda for the standing committees of the National Conference on Weights and Measures. This meeting is cheduled to take place July 10...

Simultaneous Visible and Thermal Imaging of Metals During Machining

March 28, 2005

Author(s)

Eric P. Whitenton, Robert W. Ivester, Howard W. Yoon

In order to investigate temperatures reached during orthogonal metal cutting, a novel approach for measuring temperatures at the tool-chip interface has been...

HEB heterodyne focal plane arrays: a terahertz technology for high sensitivity near-range security imaging systems*

March 28, 2005

Author(s)

Eyal Gerecht, Dazhen Gu, Sigfrid Yngvesson, Fernando Rodriquez-Morales, Ric Zannoni, John Nicholson

We have achieved the first demonstation of alow-noise heterodyne array for a frequency above 1 THz (1.6THz). The prototype array has three elements consisting...

Determination of surface barrier height and surface state density in GaN films grown on sapphire substrates

March 24, 2005

Author(s)

Seong-Eun Park, Joseph Kopanski, Youn-Seon Kang, Larry Robins, Hyun-Keel Shin

Photoreflectance (PR) modulation spectroscopy was performed to investigate surface properties of GaN films grown on sapphire substrates. From the period of the...

Stereoscopic Particle Image Velocimetry Measurements of Flow Through a Doorway of an Enclosure Fire Analogue

March 23, 2005

Author(s)

Rodney A. Bryant

A fire within a room or enclosure acts as a pump, pulling ambient air in while pushing combustion products mixed with air out. The openings through which the...

Intrinsic Surface States in Semiconductor Nanocrystals: HgS Quantum Dots

March 23, 2005

Author(s)

James S. Sims, Garnett W. Bryant, Howard Hung

Confined states in typical nanocrystals are localized to the dot interior. Surface states are extrinsic states localized at unsaturated dangling bonds or...

Frequency Biases Associated with Distributed Cavity Phase and Microwave Leakage in the Atomic Fountian Primary Frequency Standards IEN-CSF1 and NIST-F1

March 21, 2005

Author(s)

Steven R. Jefferts, Jon H. Shirley, Neil Ashby, Thomas P. Heavner, Elizabeth A. Donley, F Levi, Eric A. Burt, G J. Dick

The subject of frequency shifts in atomic frequency standards caused either by distributed cavity phase or microwave leakage goes back to the earliest days of...

Time and Frequency Comparisons Between Four European Timing Institutes and NIST Using Multiple Techniques

March 21, 2005

Author(s)

Andreas Bauch, Joseph Achkar, R Dach, R Hlavac, Luca Lorini, Thomas E. Parker, G. Petit, P Uhrich

Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), National Institute of Standards and Technology (NIST), National Physical Laboratory (NPL), Laboratoire...

Chip-Scale Atomic Frequency References: Fabrication and Performance

March 21, 2005

Author(s)

John E. Kitching, Svenja A. Knappe, Li-Anne Liew, John Moreland, Hugh Robinson, P Schwindt, V Shah, Vladislav Gerginov, Leo W. Hollberg

The physics package for a chip-scale atomic frequency standard was constructed and tested. The device has a total volume of 9.5 mm 3, dissipates 75 mW of...

Benchmark Experimental Database for Multiphase Combustion Model Input and Validation: A Users Follow-Up.

March 20, 2005

Author(s)

Cary Presser

Optimization of the performance of industrial combustion systems is relying increasingly on computational models and simulations to provide relevant process...

Transport of Gases in Charring Solids.

March 20, 2005

Author(s)

Howard R. Baum, A A. Atreya

Urban-Wildland Fires: On the Ignition of Surfaces by Embers.

March 20, 2005

Author(s)

Samuel L. Manzello, Thomas G. Cleary, John R. Shields, Jiann C. Yang

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