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Conferences

Numerical Study of Opposed-Flow Flame Spread Over Charring Solids.

March 20, 2005

Author(s)

W Park, A A. Atreya, Howard R. Baum

Coupled Thermal-Elastic Response of Structures to Fires.

March 20, 2005

Author(s)

Kuldeep R. Prasad, Howard R. Baum

Experimental Study on Effects of Sample Orientation on Non-Piloted Ignition of Thin PMMA Sheets.

March 20, 2005

Author(s)

Hiroshi Gotoda, Samuel L. Manzello, Takashi Kashiwagi

Oxidation of Large Molecular Weight Hydrocarbons in a Pressurized Flow Reactor.

March 20, 2005

Author(s)

David B. Lenhert, N P. Cernansky, D. L. Miller

Stereoscopic Particle Image Velocimetry Measurements of Flow Through a Doorway of an Enclosure Fire Analogue.

March 20, 2005

Author(s)

Rodney A. Bryant

Flame Extinguishment in a Cup-Burner Apparatus.

March 20, 2005

Author(s)

F Takahashi, Gregory T. Linteris, Vishwanath R. Katta

Radio Propagation Measurements During a Building Collapse: Applications for First Responders

March 3, 2005

Author(s)

Christopher L. Holloway, Galen H. Koepke, Dennis G. Camell, Catherine A. Remley, Dylan F. Williams

The National Institute of Standards and Technology is involved in a research project to improve wireless communications for first responders (firefighters and

Influence of Focus Variation on Linewidth Measurements

March 3, 2005

Author(s)

M Tanaka, John S. Villarrubia, Andras Vladar

The influence of spatial resolution on line width measurements in the critical dimension scanning electron microscope (CD-SEM) was investigated experimentally

Troubleshooting Key Comparisons: A Survey of Design, Analysis, and Reporting of Results in Key Comparisons

March 1, 2005

Author(s)

Adriana Hornikova, William F. Guthrie

Key comparisons are international interlaboratory studies used to establish the degree of equivalence between national measurement standards. These studies

Mitochondrial DNA Typing Screens With Control Region and Coding Region SNPs

March 1, 2005

Author(s)

Margaret C. Kline, Peter M. Vallone, Janette W. Redman, David L. Duewer, C D. Calloway, John M. Butler

Mitochondrial DNA (mtDNA) analysis has found an important niche in forensic DNA typing. It is used with highly degraded samples or low-copy number materials

Soft-Decision Metrics for Coded Orthogonal Signaling in Symmetric Alpha-Stable Noise

March 1, 2005

Author(s)

Michael R. Souryal, E G. Larsson, B M. Peric, B R. Vojcic

This paper derives new soft decision metrics for coded orthogonal signaling in symmetric a-stable noise, which has been used to model impulsive noise. In

Interfacial Structure of Photoresist Thin Films in Developer Solutions

March 1, 2005

Author(s)

Vivek M. Prabhu, B D. Vogt, Wen-Li Wu, Jack F. Douglas, Sushil K. Satija, D M. Goldfarb, H Ito

The development step is critical to the fabrication of nanostructures in chemically amplified photoresist technology. With critical dimensions (CD) shrinking to

Testing BIOS Interrupt 0x13 Based Software Write Blockers

March 1, 2005

Author(s)

James R. Lyle, Paul E. Black

We report observations and experience in the Computer Forensics Tool Testing (CFTT) project while developing methodologies to test interrupt 0x13 based software

Technology for the Information Commons in a Special Library

March 1, 2005

Author(s)

Nancy Allmang, Rosa Liu

Recently, Information Commons has become a buzzword with two meanings--a gathering place for collaborating and sharing new technologies, or a virtual spot for

Measurement of Weak Signals Using a Communications Receiver System

March 1, 2005

Author(s)

Marc Rutschlin, Kate Remley, Robert T. Johnk, Dylan Williams, Galen H. Koepke

We describe the calibration of an inexpensive, reliable system for use in weak-signal detection. The calibration procedure described allows the conversion of

Web-Based 3D Visualization in a Digital Library of Mathematical Functions

March 1, 2005

Author(s)

Qiming Wang, Bonita V. Saunders

The National Institute of Standards and Technology (NIST) is developing a digital library of mathematical functions to replace the widely used National Bureau

Flame Extinguishment in a Cup-Burner Apparatus

March 1, 2005

Author(s)

F Takahashi, Gregory T. Linteris, V Katta

Unsteady extinguishment phenomena of laminar methane-air co-flow diffusion flames formed in a cup-burner apparatus at normal earth gravity have been studied

Electric Current Induced Thermomechanical Fatigue Testing of Interconnects

March 1, 2005

Author(s)

Robert Keller, Roy H. Geiss, Yi-Wen Cheng, David T. Read

We demonstrate the use of electrical methods for evaluating the thermomechanical fatigue properties of patterned aluminum and copper interconnects on silicon

Characterizing the Risks and Costs of BGP Insecurity/Security

March 1, 2005

Author(s)

Douglas Montgomery, Kotikalapudi Sriram, Oliver Borchert, Okhee Kim, D. Richard Kuhn

We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric

Novel Electrostatic Discharge Protection Structure for a Monolithic Gas Sensor Systems-On-A-Chip

March 1, 2005

Author(s)

Javier A. Salcedo, Juin J. Liou, Muhammad Afridi, Allen R. Hefner Jr.

A new On-Chip Electrostatic Discharge (ESD) protection scheme is demonstrated for MicroElectroMechanical Systems (MEMS)-based Embedded Sensor (ES) System-on-a

Challenges in Supporting Product Design and Manufacturing in a Networked Economy: A PLM Perspective

March 1, 2005

Author(s)

Eswaran Subrahmanian, Sudarsan Rachuri, Steven J. Fenves, Sebti Foufou, Ram D. Sriram

In this paper, we provide an overview of the changing design and manufacturing landscape in the 21st century that has come about because of the arrival of

A Core Product Model for PLM with an Illustrative XML Implementation

March 1, 2005

Author(s)

Sebti Foufou, Steven J. Fenves, Conrad Bock, Sudarsan Rachuri, Ram D. Sriram

We propose a Core Product Model (CPM) for modeling product information suitable for supporting the information needs of Product Lifecycle Management (PLM)

Content-Level Conformance Testing: An Information Mapping Case Study

March 1, 2005

Author(s)

Boonserm Kulvatunyou, Nenad Ivezic, Albert T. Jones

Content-level conformance testing is a key to achieving interoper-able data exchange among applications deployed across collaborating, yet in-dependent

NIST Optoelectronic Measurements for Fiber Optic Applications

March 1, 2005

Author(s)

Kent B. Rochford, Paul D. Hale, Nathan R. Newbury

We describe current measurement capabilities as well as research focused on two areas: improving temporal and frequency response characterization of detectors

CD-AFM Reference Metrology at NIST and SEMATECH

February 27, 2005

Author(s)

Ronald G. Dixson, Jing Fu, Ndubuisi G. Orji, William F. Guthrie, Richard A. Allen, Michael W. Cresswell

Temperature Dependence of the Ordering of Semiconducting Fluorene Thiophene Copolymers on Rubbed Polyimide Alignment Layers

February 18, 2005

Author(s)

L R. Pattison, A Hexemer, E K. Kramer, P Petroff, Daniel A. Fischer

There has been great interest in recent years in using solution processible conjugated organic polymers as the active layers in semiconducting devices including

Metrology Applications of Reverberation Chambers for Electromagnetic Field Probe Calibrations and Antenna Efficiency Measurements

February 13, 2005

Author(s)

Dennis Lewis, John M. Ladbury

This paper gives a brief introduction of current methods used to calibrate electric field probes as defined by IEEE Standard 1309 as well as a brief discussion

Challenges in Using a Reverberation Chamber for Probe Calibration

February 13, 2005

Author(s)

John M. Ladbury, Dennis Lewis, Galen H. Koepke, Randy Direen

We discuss some of the challenges associated with attempts to calibrate electromagnetic field probes in a reverberation chamber. These include immunity issues

The Development of a High-Throughput Axisymmetric Adhesion Test

February 13, 2005

Author(s)

Aaron M. Forster, Wenhua Zhang, Christopher Stafford

There has been a growing effort to extend combinatorial and high throughput (C&HT) methods into many aspects of material science, including material property

Toward chip-scale atomic clocks

February 7, 2005

Author(s)

C. T-C. Nguyen, John Kitching

This paper describes work towards the use of integrated microelectromechanical systems (MEMS) technology to shrink atomic clocks from their present-day table

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