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Conferences

Settling Times of High-Value Standard Resistors

Author(s)
Dean G. Jarrett, Randolph Elmquist
An investigation of the response of high-value resistance standards and elements to applied potential has showed that the processes used to prepare and

Reference Metrology Using a Next Generation CD-AFM

Author(s)
Ronald G. Dixson, Angela Guerry
International SEMATECH (ISMT and the National Institute of Standards and Technology (NIST) are working together to improve the traceability of AFM dimensional

Evaluation of New In-Chip and Arrayed Line Overlay Target Designs

Author(s)
M P. Davidson, M R. Bishop, Robert D. Larrabee, Michael T. Stocker, Jay S. Jun, Egon Marx, Richard M. Silver, Ravikiran Attota
Two types of overlay targets have been designed and evaluated for the study of optical overlay metrology. They are in-chip and arrayed overlay targets. In-chip

Precision tests of femtosecond laser optical frequency synthesizers

Author(s)
Long-Sheng Ma, Lennart Robertsson, Massimo Zucco, Zhiyi Bi, Robert Windeler, A Bartels, G Wilpers, Christopher W. Oates, Leo W. Hollberg, Scott Diddams
We compare the accuracy of femtosecond laser optical frequency synthesizers that employ microstructured fibers with those that directly generate a broadband

Cavity ring-down spectroscopy of semiconductor quantum dots

Author(s)
Joseph J. Berry, Todd E. Harvey, Richard Mirin, A Marian, Jun Ye
We employ cavity ringdown to perform absorption experiments of InGaAs/GaAs QDs. Integrating an AlAs/GaAs DBR incorporating InGaAs QD?s into a Fabry-Perot cavity

Photoluminescence from an Nd3+ doped AlGaAs semiconductor structure

Author(s)
Kirk Ullmann, Mark Su, Kevin L. Silverman, Joseph J. Berry, Todd E. Harvey, Richard Mirin
We report room temperature photoluminescence from a Nd3+ doped AlGaAs semiconductor. Oxidation of the AlGaAs greatly improves the luminescence efficiency of the

Absolute frequency measurements with a stabilized near-infrared optical frequency comb from a Cr:forsterite laser

Author(s)
Kristan L. Corwin, I Thomann, Tasshi Dennis, R W. Fox, William C. Swann, E. A. Curtis, C. W. Oates, G Wilpers, A Bartels, Sarah L. Gilbert, Leo W. Hollberg, Scott Diddams, Nathan R. Newbury, Jeffrey W. Nicholson, M. Yan
A Cr:forsterite laser-based frequency comb is stabilized simultaneously to two NIST frequency references. Methane lines from 1315 nm - 1330 nm are measured with