An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Confined states in typical nanocrystals are localized to the dot interior. Surface states are extrinsic states localized at unsaturated dangling bonds or...
Steven R. Jefferts, Jon H. Shirley, Neil Ashby, Thomas P. Heavner, Elizabeth A. Donley, F Levi, Eric A. Burt, G J. Dick
The subject of frequency shifts in atomic frequency standards caused either by distributed cavity phase or microwave leakage goes back to the earliest days of...
Andreas Bauch, Joseph Achkar, R Dach, R Hlavac, Luca Lorini, Thomas E. Parker, G. Petit, P Uhrich
Istituto Elettrotecnico Nazionale Galileo Ferraris (IEN), National Institute of Standards and Technology (NIST), National Physical Laboratory (NPL), Laboratoire...
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, John Moreland, Hugh Robinson, P Schwindt, V Shah, Vladislav Gerginov, Leo W. Hollberg
The physics package for a chip-scale atomic frequency standard was constructed and tested. The device has a total volume of 9.5 mm 3, dissipates 75 mW of...
Optimization of the performance of industrial combustion systems is relying increasingly on computational models and simulations to provide relevant process...
Christopher L. Holloway, Galen H. Koepke, Dennis G. Camell, Catherine A. Remley, Dylan F. Williams
The National Institute of Standards and Technology is involved in a research project to improve wireless communications for first responders (firefighters and...
The influence of spatial resolution on line width measurements in the critical dimension scanning electron microscope (CD-SEM) was investigated experimentally...
Key comparisons are international interlaboratory studies used to establish the degree of equivalence between national measurement standards. These studies...
Margaret C. Kline, Peter M. Vallone, Janette W. Redman, David L. Duewer, C D. Calloway, John M. Butler
Mitochondrial DNA (mtDNA) analysis has found an important niche in forensic DNA typing. It is used with highly degraded samples or low-copy number materials...
Michael R. Souryal, E G. Larsson, B M. Peric, B R. Vojcic
This paper derives new soft decision metrics for coded orthogonal signaling in symmetric a-stable noise, which has been used to model impulsive noise. In...
Vivek M. Prabhu, B D. Vogt, Wen-Li Wu, Jack F. Douglas, Sushil K. Satija, D M. Goldfarb, H Ito
The development step is critical to the fabrication of nanostructures in chemically amplified photoresist technology. With critical dimensions (CD) shrinking to...
We report observations and experience in the Computer Forensics Tool Testing (CFTT) project while developing methodologies to test interrupt 0x13 based software...
Recently, Information Commons has become a buzzword with two meanings--a gathering place for collaborating and sharing new technologies, or a virtual spot for...
Marc Rutschlin, Kate Remley, Robert T. Johnk, Dylan Williams, Galen H. Koepke
We describe the calibration of an inexpensive, reliable system for use in weak-signal detection. The calibration procedure described allows the conversion of...
The National Institute of Standards and Technology (NIST) is developing a digital library of mathematical functions to replace the widely used National Bureau...
Unsteady extinguishment phenomena of laminar methane-air co-flow diffusion flames formed in a cup-burner apparatus at normal earth gravity have been studied...
Robert Keller, Roy H. Geiss, Yi-Wen Cheng, David T. Read
We demonstrate the use of electrical methods for evaluating the thermomechanical fatigue properties of patterned aluminum and copper interconnects on silicon...
Douglas Montgomery, Kotikalapudi Sriram, Oliver Borchert, Okhee Kim, D. Richard Kuhn
We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric...
Javier A. Salcedo, Juin J. Liou, Muhammad Afridi, Allen R. Hefner Jr.
A new On-Chip Electrostatic Discharge (ESD) protection scheme is demonstrated for MicroElectroMechanical Systems (MEMS)-based Embedded Sensor (ES) System-on-a...
Eswaran Subrahmanian, Sudarsan Rachuri, Steven J. Fenves, Sebti Foufou, Ram D. Sriram
In this paper, we provide an overview of the changing design and manufacturing landscape in the 21st century that has come about because of the arrival of...
Sebti Foufou, Steven J. Fenves, Conrad Bock, Sudarsan Rachuri, Ram D. Sriram
We propose a Core Product Model (CPM) for modeling product information suitable for supporting the information needs of Product Lifecycle Management (PLM)...