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Conferences

Application of a Heat Release Criterion for Noncombustible Materials.

February 1, 2005

Author(s)

Marc R. Nyden, Michael R. Smith, Richard G. Gann, Richard N. Walters

Fire Performance of Flame Retarded Polymers Used in Consumer Electronics.

February 1, 2005

Author(s)

Matthew F. Bundy, Thomas J. Ohlemiller

Dynamic 3D Visualizations of High Level Mathematical Functions

February 1, 2005

Author(s)

Bonita V. Saunders

Seamless and Secure Mobility

February 1, 2005

Author(s)

Nada T. Golmie

We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric

Metrologies for Quantitative Nanomechanical Testing and Quality Control in Semiconductor Manufacturing

February 1, 2005

Author(s)

Jon R. Pratt, John A. Kramar, David B. Newell, Douglas T. Smith

If nanomechanical testing is to evolve into a tool for process and quality control in semiconductor fabrication, great advances in throughout, repeatability

Water Distribution Within Immersed Polymer Films

February 1, 2005

Author(s)

B D. Vogt, Christopher Soles, Vivek Prabhu, Sushil K. Satija, Eric K. Lin, Wen-Li Wu

The emergence of immersion lithography as a potential alternative for the extension of current lithography tools will require a fundamental understanding of the

Influence of Tip Wear on Atomic Force Acoustic Microscopy Experiments

January 31, 2005

Author(s)

Malgorzata Kopycinska-Mueller, Roy H. Geiss, Paul Rice, Donna C. Hurley

Tip wear and its corresponding change in geometry is a major impediment for quantifying atomic force acoustic microscopy (AFAM). To better understand the

Microfabricated Atomic Clocks

January 30, 2005

Author(s)

John E. Kitching, Svenja A. Knappe, Li-Anne Liew, P Schwindt, V Shah, John Moreland, Leo W. Hollberg

We summarize the development of microfabricated atomic frequency references at NIST. The physics packages of these devices have volumes near 10 mm3, power

Physical Mechanisms of Ultra-thin Silicon Dioxide Degradation and Breakdown

January 30, 2005

Author(s)

Eric M. Vogel

The physical mechanisms responsible for the degradation and breakdown of silicon dioxide have been studied for over three decades. Although a large body of

Single Molecule Fluorescence Resonance Energy Transfer of a RNA Kissing Complex

January 27, 2005

Author(s)

Peter Yim, Xiaoyi Y. Zhang, E S. DeJong, J M. Carroll, John P. Marino, Lori S. Goldner

We used single molecular fluorescence resonance energy transfer (FRET) to understand the conformation of a RNA loop to loop complex, termed a kissing complex

Spectral responsivity of pyroelectric detectors coated with carbon nanotubes

January 26, 2005

Author(s)

John H. Lehman

We have begun to demonstrate the next generation of coatings for laser power and energy measurement standards, which are based on carbon nanotubes on a variety

LEAD-FREE SOLDER DATA: COLLECTION AND DEVELOPMENT

January 10, 2005

Author(s)

Thomas A. Siewert, David R. Smith, Yi-Wen Cheng, Juan C. Madeni, S X. Liu

The rising interest in lead-free solders creates a need for complete property data on the various lead-free solder compositions. Various types of data are

Bayesian Analysis of Ceria Nanoparticles from Line Profile Data

January 8, 2005

Author(s)

Nicholas G. Armstrong, A Dowd, James P. Cline, W Kalceff

Effect of Plastic Strain on Modulus and Springback Predictions of an Aluminum Alloy

January 4, 2005

Author(s)

Li Ma, Richard E. Ricker

This paper examines the hypothesis that the under-prediction errors of current finite element analysis (FEA) springback models would be eliminated by the

Infrared and Raman Spectroscopy Characterization of Biological Products

January 1, 2005

Author(s)

Vytautas Reipa

Both infrared and Raman are increasingly applied in biomolecular structure characterization, thus getting acceptance alongside traditional bioanalytical

A Simple Ball Averager for Reference Sphere Calibrations

January 1, 2005

Author(s)

Ulf Griesmann, Quandou (. Wang, Johannes A. Soons, Remi Carakos

When measuring the form errors of precision optics with an interferometer, the calibration of the reference wavefront is of central importance. Ball averaging

Modal Reconstruction of Aspheric Surfaces from Experimental Second Derivatives

January 1, 2005

Author(s)

Nadia Machkour-Deshayes, Ulf Griesmann, Byoung C. Kim

A method for the measurement of precise aspheric optical surfaces based on measurements of the second derivatives of the surface is evaluated. A compact phase

2D and 3D Surface Texture Comparisons Using Autocorrelation Functions

January 1, 2005

Author(s)

Jun-Feng Song, Li Ma, Eric P. Whitenton, Theodore V. Vorburger

Autocorrelation and cross-correlation functions are proposed for 2D and 3D surface texture comparisons. At the maximum correlaton point of the two correlated

Simulation of Optical Microscope Images for Photomask Feature Size Measurements

January 1, 2005

Author(s)

Egon Marx, James E. Potzick

Features on photomasks used in the semiconductor industry have steadily decreased in size to fit more elements on a wafer. When the size becomes smaller than

Measurement Uncertainty, CMMs, and Standards: Today and the Future

January 1, 2005

Author(s)

Steven D. Phillips

Over the past decade modern measurement uncertainty evaluation has evolved from an obscure art practiced at National Measurement Institutes (NMIs) to an

Linewidth Measurement from a Stitched AFM Image

January 1, 2005

Author(s)

Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger, C Nguyen

Image stitching is a technique that combines two or more images to form one composite image, which provides a field of view that the originals cannot. It has

New Capabilities At NIST In Dimensional Metrology

January 1, 2005

Author(s)

Theodore D. Doiron, Eric S. Stanfield, Bryon S. Faust, John R. Stoup, Mary Abbott

A number of new or revised services in dimensional metrology are presented. Included are: a lower cost, high accuracy calibration for sphere diameter; reduced

Standardized Interfaces and WEB Enablement for Homeland and Security Sensor Networks

January 1, 2005

Author(s)

Kang B. Lee, Mark E. Reichardt

Sensors and networks, both wired and wireless, are key components in building distributed sensor networks nation-wide for monitoring and protecting critical

Combinatorial Methods for the Characterization of Dental Materials

January 1, 2005

Author(s)

Sheng Lin-Gibson, Elizabeth A. Wilder, Forrest A. Landis, Peter Drzal

Quantitative Analysis of a Candidate Porosity Reference Scaffold: Type 1

January 1, 2005

Author(s)

Joy P. Dunkers, John A. Tesk, David Dean, M Cooke, Richard Ketcham, Marcus T. Cicerone

2005 Variable Pressure/Environmental Scanning Electron Microscopy: Application to Photomask Dimensional Metrology

January 1, 2005

Author(s)

Michael T. Postek

2005 Metrology for a New Science: Advanced Metrology Needs

January 1, 2005

Author(s)

Michael T. Postek

Advanced Metrology Needs for Nanotechnology and Nanomanufacturing

January 1, 2005

Author(s)

Michael T. Postek

Elastic Instability of Multilayer Films Coated on Substrates

January 1, 2005

Author(s)

Shu Guo, Martin Y. Chiang, Christopher M. Stafford

Mechanical properties of ultra-thin (submicrometer) films coated on a substrate are paramount in many applications. One question arises as to whether the

Stress Analysis for Combinatorial Buckling-Based Metrology of Thin Film Modulus

January 1, 2005

Author(s)

Shu Guo, Christopher M. Stafford, Martin Y. Chiang

We recently reported on a new buckling-based metrology for probing the elastic modulus of thin polymer films. In this experimental geometry, a thin film of

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