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Conferences

Content-Level Conformance Testing: An Information Mapping Case Study

March 1, 2005

Author(s)

Boonserm Kulvatunyou, Nenad Ivezic, Albert T. Jones

Content-level conformance testing is a key to achieving interoper-able data exchange among applications deployed across collaborating, yet in-dependent...

NIST Optoelectronic Measurements for Fiber Optic Applications

March 1, 2005

Author(s)

Kent B. Rochford, Paul D. Hale, Nathan R. Newbury

We describe current measurement capabilities as well as research focused on two areas: improving temporal and frequency response characterization of detectors...

CD-AFM Reference Metrology at NIST and SEMATECH

February 27, 2005

Author(s)

Ronald G. Dixson, Jing Fu, Ndubuisi G. Orji, William F. Guthrie, Richard A. Allen, Michael W. Cresswell

Temperature Dependence of the Ordering of Semiconducting Fluorene Thiophene Copolymers on Rubbed Polyimide Alignment Layers

February 18, 2005

Author(s)

L R. Pattison, A Hexemer, E K. Kramer, P Petroff, Daniel A. Fischer

There has been great interest in recent years in using solution processible conjugated organic polymers as the active layers in semiconducting devices including...

Metrology Applications of Reverberation Chambers for Electromagnetic Field Probe Calibrations and Antenna Efficiency Measurements

February 13, 2005

Author(s)

Dennis Lewis, John M. Ladbury

This paper gives a brief introduction of current methods used to calibrate electric field probes as defined by IEEE Standard 1309 as well as a brief discussion...

Challenges in Using a Reverberation Chamber for Probe Calibration

February 13, 2005

Author(s)

John M. Ladbury, Dennis Lewis, Galen H. Koepke, Randy Direen

We discuss some of the challenges associated with attempts to calibrate electromagnetic field probes in a reverberation chamber. These include immunity issues...

The Development of a High-Throughput Axisymmetric Adhesion Test

February 13, 2005

Author(s)

Aaron M. Forster, Wenhua Zhang, Christopher Stafford

There has been a growing effort to extend combinatorial and high throughput (C&HT) methods into many aspects of material science, including material property...

Toward chip-scale atomic clocks

February 7, 2005

Author(s)

C. T-C. Nguyen, John Kitching

This paper describes work towards the use of integrated microelectromechanical systems (MEMS) technology to shrink atomic clocks from their present-day table...

Application of a Heat Release Criterion for Noncombustible Materials.

February 1, 2005

Author(s)

Marc R. Nyden, Michael R. Smith, Richard G. Gann, Richard N. Walters

Fire Performance of Flame Retarded Polymers Used in Consumer Electronics.

February 1, 2005

Author(s)

Matthew F. Bundy, Thomas J. Ohlemiller

Dynamic 3D Visualizations of High Level Mathematical Functions

February 1, 2005

Author(s)

Bonita V. Saunders

Seamless and Secure Mobility

February 1, 2005

Author(s)

Nada T. Golmie

We examine the performance of multimodal biometric authentication systems using state-of-the-art Commercial Off-the-Shelf (COTS) fingerprint and face biometric...

Metrologies for Quantitative Nanomechanical Testing and Quality Control in Semiconductor Manufacturing

February 1, 2005

Author(s)

Jon R. Pratt, John A. Kramar, David B. Newell, Douglas T. Smith

If nanomechanical testing is to evolve into a tool for process and quality control in semiconductor fabrication, great advances in throughout, repeatability...

Water Distribution Within Immersed Polymer Films

February 1, 2005

Author(s)

B D. Vogt, Christopher Soles, Vivek Prabhu, Sushil K. Satija, Eric K. Lin, Wen-Li Wu

The emergence of immersion lithography as a potential alternative for the extension of current lithography tools will require a fundamental understanding of the...

Influence of Tip Wear on Atomic Force Acoustic Microscopy Experiments

January 31, 2005

Author(s)

Malgorzata Kopycinska-Mueller, Roy H. Geiss, Paul Rice, Donna C. Hurley

Tip wear and its corresponding change in geometry is a major impediment for quantifying atomic force acoustic microscopy (AFAM). To better understand the...

Microfabricated Atomic Clocks

January 30, 2005

Author(s)

John E. Kitching, Svenja A. Knappe, Li-Anne Liew, P Schwindt, V Shah, John Moreland, Leo W. Hollberg

We summarize the development of microfabricated atomic frequency references at NIST. The physics packages of these devices have volumes near 10 mm3, power...

Physical Mechanisms of Ultra-thin Silicon Dioxide Degradation and Breakdown

January 30, 2005

Author(s)

Eric M. Vogel

The physical mechanisms responsible for the degradation and breakdown of silicon dioxide have been studied for over three decades. Although a large body of...

Single Molecule Fluorescence Resonance Energy Transfer of a RNA Kissing Complex

January 27, 2005

Author(s)

Peter Yim, Xiaoyi Y. Zhang, E S. DeJong, J M. Carroll, John P. Marino, Lori S. Goldner

We used single molecular fluorescence resonance energy transfer (FRET) to understand the conformation of a RNA loop to loop complex, termed a kissing complex...

Spectral responsivity of pyroelectric detectors coated with carbon nanotubes

January 26, 2005

Author(s)

John H. Lehman

We have begun to demonstrate the next generation of coatings for laser power and energy measurement standards, which are based on carbon nanotubes on a variety...

LEAD-FREE SOLDER DATA: COLLECTION AND DEVELOPMENT

January 10, 2005

Author(s)

Thomas A. Siewert, David R. Smith, Yi-Wen Cheng, Juan C. Madeni, S X. Liu

The rising interest in lead-free solders creates a need for complete property data on the various lead-free solder compositions. Various types of data are...

Bayesian Analysis of Ceria Nanoparticles from Line Profile Data

January 8, 2005

Author(s)

Nicholas G. Armstrong, A Dowd, James P. Cline, W Kalceff

Effect of Plastic Strain on Modulus and Springback Predictions of an Aluminum Alloy

January 4, 2005

Author(s)

Li Ma, Richard E. Ricker

This paper examines the hypothesis that the under-prediction errors of current finite element analysis (FEA) springback models would be eliminated by the...

Infrared and Raman Spectroscopy Characterization of Biological Products

January 1, 2005

Author(s)

Vytautas Reipa

Both infrared and Raman are increasingly applied in biomolecular structure characterization, thus getting acceptance alongside traditional bioanalytical...

A Simple Ball Averager for Reference Sphere Calibrations

January 1, 2005

Author(s)

Ulf Griesmann, Quandou (. Wang, Johannes A. Soons, Remi Carakos

When measuring the form errors of precision optics with an interferometer, the calibration of the reference wavefront is of central importance. Ball averaging...

Modal Reconstruction of Aspheric Surfaces from Experimental Second Derivatives

January 1, 2005

Author(s)

Nadia Machkour-Deshayes, Ulf Griesmann, Byoung C. Kim

A method for the measurement of precise aspheric optical surfaces based on measurements of the second derivatives of the surface is evaluated. A compact phase...

2D and 3D Surface Texture Comparisons Using Autocorrelation Functions

January 1, 2005

Author(s)

Jun-Feng Song, Li Ma, Eric P. Whitenton, Theodore V. Vorburger

Autocorrelation and cross-correlation functions are proposed for 2D and 3D surface texture comparisons. At the maximum correlaton point of the two correlated...

Simulation of Optical Microscope Images for Photomask Feature Size Measurements

January 1, 2005

Author(s)

Egon Marx, James E. Potzick

Features on photomasks used in the semiconductor industry have steadily decreased in size to fit more elements on a wafer. When the size becomes smaller than...

Measurement Uncertainty, CMMs, and Standards: Today and the Future

January 1, 2005

Author(s)

Steven D. Phillips

Over the past decade modern measurement uncertainty evaluation has evolved from an obscure art practiced at National Measurement Institutes (NMIs) to an...

Linewidth Measurement from a Stitched AFM Image

January 1, 2005

Author(s)

Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger, C Nguyen

Image stitching is a technique that combines two or more images to form one composite image, which provides a field of view that the originals cannot. It has...

New Capabilities At NIST In Dimensional Metrology

January 1, 2005

Author(s)

Theodore D. Doiron, Eric S. Stanfield, Bryon S. Faust, John R. Stoup, Mary Abbott

A number of new or revised services in dimensional metrology are presented. Included are: a lower cost, high accuracy calibration for sphere diameter; reduced...

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