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EUV Spectroscopy of Xenon Ions Created Using an Electron Beam Ion Trap, ed. by H.J. Byrne

Published

Author(s)

K Fahy, E Sokell, G O'Sullivan, A Cummings, A Aguilar, John D. Gillaspy, Joshua M. Pomeroy, Joseph N. Tan
Proceedings Title
Opt. Sensing and Spectrosc
Conference Dates
July 14, 2005
Conference Location
Bellingham, WA, USA
Conference Title
Proc. SPIE 5826

Citation

Fahy, K. , Sokell, E. , O'Sullivan, G. , Cummings, A. , Aguilar, A. , Gillaspy, J. , Pomeroy, J. and Tan, J. (2005), EUV Spectroscopy of Xenon Ions Created Using an Electron Beam Ion Trap, ed. by H.J. Byrne, Opt. Sensing and Spectrosc, Bellingham, WA, USA (Accessed May 21, 2024)

Issues

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Created December 31, 2004, Updated October 12, 2021