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EUV Spectroscopy of Xenon Ions Created Using an Electron Beam Ion Trap, ed. by H.J. Byrne
Published
Author(s)
K Fahy, E Sokell, G O'Sullivan, A Cummings, A Aguilar, John D. Gillaspy, Joshua M. Pomeroy, Joseph N. Tan
Proceedings Title
Opt. Sensing and Spectrosc
Conference Dates
July 14, 2005
Conference Location
Bellingham, WA, USA
Conference Title
Proc. SPIE 5826
Pub Type
Conferences
Citation
Fahy, K.
, Sokell, E.
, O'Sullivan, G.
, Cummings, A.
, Aguilar, A.
, Gillaspy, J.
, Pomeroy, J.
and Tan, J.
(2005),
EUV Spectroscopy of Xenon Ions Created Using an Electron Beam Ion Trap, ed. by H.J. Byrne, Opt. Sensing and Spectrosc, Bellingham, WA, USA
(Accessed October 7, 2025)