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Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development

Published

Author(s)

Michael J. Fasolka, D Julthongpiput, Wenhua Zhang, Alamgir Karim, Eric J. Amis
Conference Location
Washington, DC
Conference Title
Pmse Preprint

Keywords

Combinatorial and THE Methods, Dewetting, Microscopy, SPM, Scanned Probe Microscopy, Thin Films, chemical micropatterns, combinatorial, high-throughput, surface energy gradient

Citation

Fasolka, M. , Julthongpiput, D. , Zhang, W. , Karim, A. and Amis, E. (2005), Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development, Pmse Preprint, Washington, DC , [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853967 (Accessed December 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2004, Updated October 12, 2021