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PUBLICATIONS

Settling Times of High-Value Standard Resistors

Published

Author(s)

Dean G. Jarrett, Randolph Elmquist

Abstract

An investigation of the response of high-value resistance standards and elements to applied potential has showed that the processes used to prepare and construct high-value resistance standards can effect the settling times of these standards. Improvements made to the processes used at NIST to fabricate high-value resistance standards will be discussed.
Proceedings Title
CPEM Digest
Conference Dates
June 27-July 2, 2004
Conference Location
London, 1, UK
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences

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Keywords

fabrication, measurement, settling time, standard resistor, uncertainty

Citation

Jarrett, D. and Elmquist, R. (2004), Settling Times of High-Value Standard Resistors, CPEM Digest, London, 1, UK, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31606 (Accessed December 3, 2023)

Created May 31, 2004, Updated October 12, 2021