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Settling Times of High-Value Standard Resistors

Published

Author(s)

Dean G. Jarrett, Randolph Elmquist

Abstract

An investigation of the response of high-value resistance standards and elements to applied potential has showed that the processes used to prepare and construct high-value resistance standards can effect the settling times of these standards. Improvements made to the processes used at NIST to fabricate high-value resistance standards will be discussed.
Proceedings Title
CPEM Digest
Conference Dates
June 27-July 2, 2004
Conference Location
London, 1, UK
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

fabrication, measurement, settling time, standard resistor, uncertainty

Citation

Jarrett, D. and Elmquist, R. (2004), Settling Times of High-Value Standard Resistors, CPEM Digest, London, 1, UK, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31606 (Accessed May 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2004, Updated October 12, 2021