Investigations of Noise in Measurements of Electronic Voltage Standards
Thomas J. Witt, Yi-hua D. Tang
We have studied the voltage noise of electronic voltage standards based on Zener diode references (Zeners). Ten volt Zener outputs were compared to NIST Josephson standards using a DVM to record voltage differences. The data were analyzed using the Allan variance. We have characterized the 1/f noise of 22 Zeners of three types. We also present evidence of enhanced white noise in Zeners.
June 27-July 2, 2004
London, 1, UK
Conference on Precision Electromagnetic Measurements
1/f noise, Allan variance, Josephson voltage standard, power spectral density, Zener standard
and Tang, Y.
Investigations of Noise in Measurements of Electronic Voltage Standards, CPEM Digest, London, 1, UK, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31597
(Accessed June 3, 2023)