Witt, T.
and Tang, Y.
(2004),
Investigations of Noise in Measurements of Electronic Voltage Standards, CPEM Digest, London, 1, UK, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31597
(Accessed October 14, 2025)
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Investigations of Noise in Measurements of Electronic Voltage Standards
Published
Author(s)
Thomas J. Witt,
Abstract
We have studied the voltage noise of electronic voltage standards based on Zener diode references (Zeners). Ten volt Zener outputs were compared to NIST Josephson standards using a DVM to record voltage differences. The data were analyzed using the Allan variance. We have characterized the 1/f noise of 22 Zeners of three types. We also present evidence of enhanced white noise in Zeners.Proceedings Title
CPEM Digest
Conference Dates
June 27-July 2, 2004
Conference Location
London, 1, UK
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Download Paper
Keywords
1/f noise, Allan variance, Josephson voltage standard, power spectral density, Zener standard
Citation
Issues
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Created May 31, 2004, Updated October 12, 2021