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Investigations of Noise in Measurements of Electronic Voltage Standards

Published

Author(s)

Thomas J. Witt, Yi-hua D. Tang

Abstract

We have studied the voltage noise of electronic voltage standards based on Zener diode references (Zeners). Ten volt Zener outputs were compared to NIST Josephson standards using a DVM to record voltage differences. The data were analyzed using the Allan variance. We have characterized the 1/f noise of 22 Zeners of three types. We also present evidence of enhanced white noise in Zeners.
Proceedings Title
CPEM Digest
Conference Dates
June 27-July 2, 2004
Conference Location
London, 1, UK
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

1/f noise, Allan variance, Josephson voltage standard, power spectral density, Zener standard

Citation

Witt, T. and Tang, Y. (2004), Investigations of Noise in Measurements of Electronic Voltage Standards, CPEM Digest, London, 1, UK, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31597 (Accessed May 26, 2024)

Issues

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Created May 31, 2004, Updated October 12, 2021