Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Data Analysis Considerations in Probing Single Quantum Dot Fluorescence Intermittency

Published

Author(s)

J R. Krogmeier, Jeeseong C. Hwang

Abstract

The fluorescence intermittency of single, bare, CdSe/ZnS quantum dots were probed using single molecule confocal microscopy and found to demonstrate power law kinetics. Various threshold values and line fitting parameters are employed in the data analysis and their effects on the extracted power law exponents, moff and mon, are presented. The threshold is found to be critical in determining moff while having no significant effect on mon. The 2sigma threshold results in a more negative moff slope in comparison to the 3sigma or 4sigma thresholds and is likely due to the 2sigma threshold lying within the background noise outliers which mimic short on events. In contrast, the 4sigma threshold is sufficiently above the noise outliers while adequately below the fluorescent signal. Additionally, it is found that fitting only the most probable data in the log-log probability density graphs results in no significant change in moff and mon.
Proceedings Title
Proceedings of SPIE| Nano/Biophotonics and Biomedical Applications
Volume
5705
Conference Dates
January 22-17, 2005
Conference Location
, US
Conference Title
SPIE

Keywords

blinking, fluorescence intermittency, quantum dots, single molecule microscopy, threshold analysis

Citation

Krogmeier, J. and Hwang, J. (2005), Data Analysis Considerations in Probing Single Quantum Dot Fluorescence Intermittency, Proceedings of SPIE| Nano/Biophotonics and Biomedical Applications, , US (Accessed October 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 27, 2005, Updated October 12, 2021