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Gaithersburg

ASML Stepper User Seminar

Tue, Sep 9 2014

The ASML 275D I-line stepper, an advanced projection photolithography tool, has been serving NanoFab users for 2 years

Polymer Physics 2.0: Exploiting Programmable Nanomaterials to Control Phase and Material Properties of Soft Matter

Fri, Sep 5 2014

Biologically evolved materials are often used as inspiration in the both the development of new materials as well as

Atomic Surface Structures of Oxide Nanocrystals and Their Catalytic Applications

Thu, Aug 28 2014

Oxide nanoparticles are widely used in heterogeneous catalysis. The surface structures of oxide nanoparticles are of

Custom bird home by Thomas Burke, Wilmington Del.

BIRDS Is for Sustainability: New NIST Tool for Evaluating Building Performance, Trade-offs

October 7, 2014

Designing a building that simply meets local code requirements is not necessarily the optimal way to do it when you consider all the long-term costs. Now...

NIST's Material Data Division provides modern data infrastructure, data science capabilities, and modeling and simulation expertise to enable the Material Measurement Laboratory's technical staff to carry out NIST’s mission.

Introducing the League of SI Superheroes: The New Champions of Metric

October 6, 2014

To celebrate Metric Week (Oct. 5-11), the National Institute of Standards and Technology would like to introduce you to the League of SI Superheroes. The League...

Eligibility Requirements Revised for 2015 Baldrige Award

October 6, 2014

The Baldrige Performance Excellence Program, the component of the National Institute of Standards and Technology (NIST) that manages the Malcolm Baldrige...

Forensics@NIST 2014

Wed, Dec 3 - Thu, Dec 4 2014

On December 3-4, 2014, NIST will host a two-day symposium showcasing forensic science research being performed at NIST

Fundamentos de Metrología

Mon, Mar 2 - Fri, Mar 6 2015

El seminario Fundamentos de Metrología presenta al participante los conceptos de sistemas de medición, unidades de

NIST to Hire New Manufacturing Extension Partnership Director

October 2, 2014

The National Institute of Standards and Technology (NIST) is about to hire a new director for the NIST Hollings Manufacturing Extension Partnership(MEP), a...

Statistical Friction Ridge Analysis (SFRA)

This project aims to develop a statistical measure of the uncertainty of the decisions made on the friction ridge evidence (i.e., evidential value of

NIST Releases Final Version of Smart Grid Framework, Update 3.0

October 1, 2014

The National Institute of Standards and Technology (NIST) has published its NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0, a...

Simultaneous Imaging of Ferromagnetic and Ferroelectric Domains

October 1, 2014

An international team led by researchers from the NIST Center for Nanoscale Science and Technology have discovered a new way to simultaneously image both the...

Document Control and Record Keeping

Thu, Aug 27 2015

This 2 hour webinar will introduce the fundamentals of Laboratory Management System Document Control and Record Keeping

NIST Exhibits at the American Indian Science and Engineering Society (AISES) National Conference 2014

Thu, Nov 13 - Sat, Nov 15 2014

Held annually since 1978, the AISES National Conference is a one-of-a-kind, three-day event convening high school

NIST Scientists Improve Microscopic Batteries with Homebuilt Imaging Analysis

September 26, 2014

In a rare case of having their cake and eating it too, scientists from the National Institute of Standards and Technology (NIST) and other institutions have...

US-Korea Workshop on Quantum Information

Mon, Nov 17 - Wed, Nov 19 2014

This a joint US-Republic of Korea workshop on quantum information science and supporting technologies aimed at fostering

Photons by the Numbers

September 25, 2014

A NIST team is at work on what promises to be one of the world's most accurate methods for generating a specified number of photons, and has devised a method to...

A structural model of a typical silicon nanocrystal stabilized within an organic shell of cyclohexane.

World's Smallest Reference Material is Big Plus for Nanotechnology

September 24, 2014

If it's true that good things come in small packages, then the National Institute of Standards and Technology (NIST) can now make anyone working with...

Effect of Partial Charge Calculation Method on Adsorption Thermodynamics in Metal-organic Frameworks

In classical molecular simulations, electrostatic contributions to the potential energy are typically accounted for by assigning partial charges to some or all

NIST Awards Contract to MITRE to Support Cybersecurity Center of Excellence

September 24, 2014

The U.S. Commerce Department's National Institute of Standards and Technology (NIST) has awarded a contract to operate its first Federally Funded Research and...

Past and current work on image-based tattoo recognition

The following is a working list of publications related to tattoo matching and retrieval methods. A. K. Jain, J.-E. Lee, and R. Jin, "Tattoo...

Three-Dimensional Nanometer Metrology

We use physics theories to understand and simulate the interaction of electrons, light, and mechanical probes with nanometer-scale structures, devices and

Schematic diagram of a 3D stacked integrated circuit (3D-SIC), achieved using copper through-silicon via interconnects.

Metrology for Emerging Integrated Systems

This program aims to develop the metrology to enable quantitative assessment of performance limiting reliability issues, and to describe the physics of failure

Custom-built wafer level probes in position to perform EDMR measurements on fully processed transistors.

Magnetic Resonance Spectroscopy

Many, if not all, of the performance and reliability metrics of semiconductor devices (power electronics through advanced electronics) have macroscale

Thin Film Electronics (Archived)

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and innovation of

A micromechanical bulk acoustic resonator that uses phononic crystal tethers to achieve a quality factor approaching the fundamental dissipation limit (fxQ can be as large as 1.2 x 1013 Hz)

Micro- and Nanoelectromechanical Systems

Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical diagnostics, and

The Diversity Crisis in Higher Education--A great danger to our Nation's competitiveness

Fri, Dec 12 2014

Image Credit: John Everett Photography Internationally known for his outstanding research in the computational and

A Personal Perspective on Human Space Flight: the science and the future

Fri, Nov 14 2014

A condensed matter physicist by training, Dr. Godwin is a veteran of four shuttle flights and has logged over 915 hours

TOP: Image of fluorescent reference material on microscope. BOTTOM: Charting of microscope control parameters.

How are you establishing long-term measurement assurance in fluorescence microscopy?

September 24, 2014

Would your laboratory or company benefit from having an easy method to track fluorescence microscopy performance? Can you compare your imaging results to those...

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