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Whip together an industrial waste product and a bit of plastic and you might have the recipe for the next revolution in battery technology. Scientists from the
What sounds like fixings for a wizard's potion—a dash of clay, a dab of fiber from crab shells, and a dollop of DNA—actually are the ingredients of promising
Who is that stranger in your social media photo? A click on the face reveals the name in seconds, almost as soon as you can identify your best friend. While
This apparatus, developed at EL, has been constructed to generate a controlled and repeatable size and mass distribution of glowing firebrands. The purpose of
The National Institute of Standards and Technology (NIST) has published a second public draft of Supply Chain Risk Management Practices for Federal Information
Rodney Brooks, founder, chairman and chief technology officer of Rethink Robotics, Inc., has joined the Visiting Committee on Advanced Technology (VCAT), the
On May 29, the President's Council of Advisors on Science and Technology (PCAST) released a report to President Obama, Better Health Care and Lower Costs
On May 29, 2014, at the White House Healthy Kids and Safe Sports Concussion Summit, President Obama highlighted both the need for greater national awareness of
Quantum information can't break the cosmic speed limit, according to researchers from the National Institute of Standards and Technology (NIST) and the
The National Institute of Standards and Technology (NIST) has requested public comments on its newly proposed "Secure Hash Algorithm-3" (SHA-3) Standard, which
The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Winter/Spring 2014 edition of The CNST News. This
Secretary of Commerce Penny Pritzker recently appointed four new members to the Panel of Judges for the Malcolm Baldrige National Quality Award. The new judges
In order to enable studies of a range of indoor air quality and ventilation issues, EL maintains a highly instrumented three-bedroom test house. Previous
The Bruker Dektak 6M contact profilometer measures the thickness of patterned thin films by sensing the deflections of a fine stylus riding over feature steps
The J. A. Woollam M-2000 DI spectroscopic ellipsometer provides fast and accurate thin film characterization over a wide spectroscopic range. The high speed CCD
The First Ten Angstroms FTA125 is a general purpose goniometer that can measure the contact angle and surface tension of liquid droplets on a substrate's
The Olympus SZH10 is a long working distance stereo microscope that supports both reflected light and transmitted light modes for inspecting substrates and
The Nikon SMZ1500 is a long working distance stereo microscope that supports both reflected light and transmitted light modes for inspecting substrates and
The Nikon L200 is a compound optical microscope that supports both reflected light and transmitted light modes for inspecting substrates and samples. The
The Keithley 4200 SCS parametric test system provides in-line electrical characterization capabilities, including the ability to measure capacitance at multiple
The Bruker Dektak XT contact profilometer measures the thin film thickness of patterned features by sensing the deflection of a fine stylus that is raster
Angela Hight Walker of PML's Semiconductor and Dimensional Metrology Division and colleagues have succeeded in measuring a previously unknown but essential
The Toho Technology FLX-2320 stress measurement tool uses a laser interferometer to measure the curvature of a wafer before and after film deposition. It then
NIST's PV characterization laboratory is used to measure the electrical performance and opto-electronic properties of solar cells and modules. This facility