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Boulder

ACMD Seminar: Missing Data and Likelihood Geometry

John Cobb Ph.D. Candidate, Dept. of Mathematics, Univ. Wisconsin-Madison Tuesday, March 26, 2024, 3:00-4:00 PM ET (1:00-2:00 PM MT) A video...

Read more about FAQs – NIST SHIP Program

NIST Upgrades Tech for Monitoring Methane Emissions

January 16, 2024

Understanding and accurately measuring greenhouse gas emissions can help policymakers to craft better-informed policies to reduce them.

Accurate Cure Kinetics, Stress, Mechanical Properties and Warpage

Advanced packaging involves increasingly challenging requirements for heterogeneous integration and chiplet packaging. Needs such as fine pitch interconnects (

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Time-resolved-emission microscopy (TREM) is a workhorse of semiconductor circuit evaluation. However, as transistor dimensions and power-supply voltages have

Metal Additive Manufacturing Powder Consortium

The Metal Additive Manufacturing Powder (MAMP) Consortium brings together stakeholders to develop deeper understanding of additive manufacturing (AM) metal

A firefighter climbs a ladder into a shipping container, while a person to their left tracks their location.

Saving Seconds, Saving Lives: NIST-Funded Challenge Crowns Winners in 3D Tracking Technology

January 9, 2024

The ability to pinpoint a first responder’s precise location inside a building can be a matter of life and death.

Inside CHIPS Metrology: Research that Accelerates Innovation

Tue, Jan 16 2024, 1:00 - 2:00pm EST

Join us for a webinar hosted by the CHIPS Metrology Program. Marla Dowell, director of the CHIPS Metrology Program, will

2024 IEEE Conference on Computational Imaging Using Synthetic Apertures (CISA)

Mon, May 20 - Thu, May 23 2024

Join us for a co-hosted event with the IEEE Signal Processing Society, the IEEE Synthetic Aperture Standards Committee

Atom Probe Tomography: Nanostructured Semiconductor Materials, Interfaces, and Devices

The semiconductor industry requires sub-nanometer, 3-dimensional quantitative elemental mapping of materials, nanoscale structures, and devices with high

Direct comparison between the NIST SRI PJVS 6000 and the NIST Traveling PJVS used for certification

NIST Researchers Installed a New Quantum Voltage Standard in Spain

December 21, 2023

NIST  delivered the first NIST Standard Reference Instrument (SRI) to Spain’s oldest calibration laboratory, the  National Institute of Aerospace Technology

2024 PSCR UAS Portfolio Workshop

Wed, Feb 7 - Thu, Feb 8 2024

The NIST Public Safety Communications Research (PSCR) Division is hosting a workshop on the management of cybersecurity

ACMD Seminar: Computational Models as Integral Product Development Tools

Christine Parrish Vice President of Technology Solutions, Compact Membrane Systems Thursday, January 11, 2024, 3:00-4:00 PM ET (1:00-2:00 PM...

NIST Releases NextG Wireless R&D Gap Analysis

December 14, 2023

As the transition from fifth-generation wireless systems (5G) to next-generation communications systems (NextG) advances, research and development (R&D)

NIST’s Ultra-small, Shape-shifting GEMS Offer an Easier and Cheaper way to improve MRI Imaging

December 20, 2023

Microscopic magnetic probes that change shape in response to their environment may greatly enhance magnetic resonance imaging (MRI). However, producing the

Overview of the kilopixel thermally coupled imager (TCI)

2023 APL Rising Stars Collection - Adam McCaughan, Bakhrom Oripov and Sae Woo Nam

The Rising Stars Collection features notable APL papers by emerging investigators. These papers were identified by the editors and Rising

Photomicrograph of the linear ion trap with integrated SNSPD

2023 APL Rising Stars Collection - Benedikt Hampel, Daniel Slichter, Dietrich Leibfried, Richard Mirin, Sae Woo Nam, Varun Verma

The Rising Stars Collection features notable APL papers by emerging investigators. These papers were identified by the editors and Rising

Boulder

ACMD Seminar: Missing Data and Likelihood Geometry

NIST Upgrades Tech for Monitoring Methane Emissions

Accurate Cure Kinetics, Stress, Mechanical Properties and Warpage

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Metal Additive Manufacturing Powder Consortium

Saving Seconds, Saving Lives: NIST-Funded Challenge Crowns Winners in 3D Tracking Technology

Inside CHIPS Metrology: Research that Accelerates Innovation

2024 IEEE Conference on Computational Imaging Using Synthetic Apertures (CISA)

Atom Probe Tomography: Nanostructured Semiconductor Materials, Interfaces, and Devices

NIST Researchers Installed a New Quantum Voltage Standard in Spain

2024 PSCR UAS Portfolio Workshop

ACMD Seminar: Computational Models as Integral Product Development Tools

NIST Releases NextG Wireless R&D Gap Analysis

NIST’s Ultra-small, Shape-shifting GEMS Offer an Easier and Cheaper way to improve MRI Imaging

2023 APL Rising Stars Collection - Adam McCaughan, Bakhrom Oripov and Sae Woo Nam

2023 APL Rising Stars Collection - Benedikt Hampel, Daniel Slichter, Dietrich Leibfried, Richard Mirin, Sae Woo Nam, Varun Verma

METIS

PSCR Webinar: Privacy and Public Records: Perils and possible solutions of releasing public safety records

PSCR Webinar: Privacy and Public Records: Perils and possible solutions of releasing public safety records

ACMD Seminar: Topological Shape and Data Analysis

Application Tips

Magnetic Sensing and Metrology

2024 IEEE-RAS Response Robotics Seasonal School and Workshop

NIST Updates Guide on Communications Standards to Federal Agencies

ACMD Seminar: The Countoscope: measuring self and collective diffusion with fancy counting

Marla Dowell Recognized as a Distinguished Executive with 2023 Presidential Rank Award

Balancing Knowledge and Governance: Foundations for Effective Risk Management of Artificial Intelligence

NIST Team Develops Highest-Resolution Single-Photon Superconducting Camera

ACMD Seminar: Applications in Machine Learning for Structure Elucidation