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The National Institute of Standards and Technology's (NIST) Material Measurement Laboratory's (MML) Additive Manufacturing Program (AM) studies the fundamental behaviors of materials under various conditions to produce reference standards that support U.S. commerce. These reference standards benefit U.S. manufacturing and competitiveness. The following are MML AM projects dedicated to the metrology of AM materials and several material types (metals, polymers, ceramics, & biomaterials). Feel free to contact us with questions or opportunities to collaborate.
NIST’s Material Measurement Laboratory is developing prototype “breath in a bottle” reference materials and a breath surrogate delivery system to create matrix
The clock is the latest demonstration that a much more precise definition of the official second is possible and that new applications of clocks are feasible.
Microcombs – chip-scale devices that generate and measure frequencies of light with exquisite accuracy – have transformed timekeeping and boosted optical
An accurate characterization of how the wireless signal propagates through different environments and frequency bands, is key to developing radio frequency (RF)
The power electronics and radio frequency (RF) communications industries increasingly rely on semiconductors in the GaN/AlGaN family, where performance is
Advanced methods to measure the thermal properties of thin films and interfaces are required to understand and improve microelectronic device fabrication
A comprehensive understanding of how current and next-generation materials impact the performance of semiconductor devices is critical to U.S. Semiconductor
Heat management in semiconductor devices is a crucial problem currently limiting device performance and essentially all progress involving reduction of device