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Boulder

Advancing Power Electronics with Defect Metrology

The exponential growth in the power electronics market requires efficient devices based on wide bandgap (WBG) semiconductors. The yield of power devices is

Nanoscale, Element-Specific X-ray Imaging for Integrated Circuit Metrology

A current lack of 3D characterization tools that meet semiconductor industry needs is hampering manufacturing fidelity and supply chain security. Developing new

Non-Destructive Semiconductor Structure Function and Process Optimization for future Microelectronics Manufacturing at the NIST NSLS-II Beamline for XAFS and Diffraction

NIST Synchrotron beamline characterization of advanced semiconductor materials structure, chemical, electronic, and strain properties has been an ongoing

Shrinking Technology, Expanding Horizons: Compact Chips Advance Precision Timing for Communications, Navigation and Other Applications

March 6, 2024

This technology shrinks a tabletop system into a chip-sized format, reducing power usage and making it more applicable for use in everyday devices.

Boulder

Advancing Power Electronics with Defect Metrology

Nanoscale, Element-Specific X-ray Imaging for Integrated Circuit Metrology

Non-Destructive Semiconductor Structure Function and Process Optimization for future Microelectronics Manufacturing at the NIST NSLS-II Beamline for XAFS and Diffraction

Shrinking Technology, Expanding Horizons: Compact Chips Advance Precision Timing for Communications, Navigation and Other Applications

Postdoctoral position: Superconducting single-photon detector design, fabrication and testing

Postdoctoral position: Magnetics-based imaging and/or sensing

NIST Physicist Sae Woo Nam, Pioneer in Single-Photon Detectors, Passes Away

Kinetic Inductance Spectrophotometry

ACMD Seminar: Toward Parameter-free Restoration of Noisy Orientation Maps

WWVB 2023 Antenna Configuration and Power Outages

2023 WWVB Broadcast Outages

NIST Researchers Use Cellphone Compass to Measure Tiny Concentrations of Compounds Important for Human Health

Overcoming Barriers: Nanoscale Interface Metrology and Electrical Characterization for Advanced Electronics

Strain Measurement for Semiconductor Devices and Packages

Electron-Solid Interactions

Accurate Mapping of Thermal Properties at the Nanoscale

Advanced Metrology to Enable Next Generation EUV Photoresists

Critical Dimension Small Angle X-Ray Scattering (CDSAXS) for Next Generation in-line Metrology

Job Opportunity: Research Associate Position, Long Wavelength Sensors and Applications

Job Opportunity: Research Associate Position, Scientific Software and Firmware Development

Job Opportunity: Research Associate Position, Boulder Cryogenic Quantum Testbed

Job Opportunity: Research Associate Position, Design and Fabricate Micro- and Nano-Electronics

Job Opportunity: Research Associate Position, Development of Quantum Calorimeters

Quantum Sensors Division Staffing Opportunities

Detector Readout Project

Metrology Program

CTL Collaborates with Korea Research Institute of Standards and Science on Quantum Computing

Summer High School Internships with the Communications Technology Laboratory

ACMD Seminar: Representing and Classifying Data with Optimal Transport

Microwave Detectors and Multiplexing: NIST Researchers Help Astronomers Examine the Early Universe