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Metrology

Electrical / electromagnetic metrology

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Displaying 276 - 300 of 458

A Multi-Frequency 4-Terminal-Pair AC Bridge

May 1, 2000
Author(s)
Anne-Marie Jeffery, John Q. Shields, Scott H. Shields
A 4-terminal-pair ac bridge, capable of a relative uncertainty of 2 x 10^-9^, has been constructed at NIST. The bridge is a multi-ratio bridge (10:1, 2:1 and 1:1) and operates in the range from 100 Hz to 2000 Hz. The design and initial testing of this

A New Fabrication Process for Planar Thin-Film Multijunction Thermal Converters

May 1, 2000
Author(s)
Thomas F. Wunsch, Joseph R. Kinard Jr., Ronald R. Manginell, O. M. Solomon, Thomas E. Lipe Jr.
Advanced thin flm processing and packaging technologies are employed in the fabrication of new planar thin-film multijunction thermal converters. The processing packaging, and design features build on experience gained from prior NIST demonstrations of

Comparison of High Frequency AC-DC Voltage Transfer Standards at NRC, VSL, PTB, and NIST

May 1, 2000
Author(s)
Piotr S. Filipski, C. J. van Mullem, D. Janik, M. Klonz, Joseph R. Kinard Jr., Thomas E. Lipe Jr., Bryan C. Waltrip
The paper summarizes results of two international comparisons relating TVC RF voltage transfer standards of the National Research Council of Canada (NRC) to the standards of three National Metrology Institutes (NMIs): NMi Van Swinden Laboratorium (VSL)

Long-Term Charge Offset and Glassy Dynamics in SET Transistors

May 1, 2000
Author(s)
Neil M. Zimmerman, William Huber
We report long-term measurements of the charge offset Q 0 in SET (single-electron tunneling) transistors, made of Al/AlO x/Al tunnel junctions. In one case, we saw a Q 0 which was constant (within 0.1 e) over a twelve-day period, except for one excursion

Noise-Source Stability Measurements

May 1, 2000
Author(s)
James P. Randa, L. A. Terrell, Lawrence P. Dunleavy
We report results of stability tests on several noise sources for selected frequencies between 12 and 26.5 GHz. Measurements covered intervals of about 1 week and about 1 year or more. Drifts in noise temperature were typically less than the uncertainty of

Reconstruction and Preliminary Tests of the NIST Electronic Kilogram Experiment

May 1, 2000
Author(s)
Richard L. Steiner, David B. Newell, J. Schwarz, Edwin R. Williams, Ruimin Liu
The NIST electronic kilogram experiment is being completely rebuilt into a vaccum chamber within a specially designed laboratory room. Major renovations include reference mass positioning equipment, structural alignment flexures, and a redesigned inductive

Switched-Coupler Measurements for High Power FR Calibrations

March 1, 2000
Author(s)
J. W. Allen
Calibration of RF power sensors at levels greater than 10 mW and uncertainties on the order of 2 % need not require complex calorimetric methods. Using a series of cascaded directional couplers makes it possible to compare a high-power RF sensor against a

Comparison of Quantum Hall Effect Resistance Standards of the NIST and the BIPM

January 1, 2000
Author(s)
F. Delahay, Thomas J. Witt, Randolph Elmquist, Ronald F. Dziuba
An on-site comparison of the quantum Hall effect (QHE) resistance standards of the National Institute of Standards and Technology (NIST) and of the Bureau International des Poids et Mesures (BIPM) was made in April 1999. Measurements of a 100 ω standard in

Electrical Measurements for Electronic Interconnections at NIST

August 1, 1999
Author(s)
Dylan Williams, Donald C. DeGroot
The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the

Reference Standards, Uncertainties, and the Future of the NIST Electronic Kilogram

July 1, 1999
Author(s)
Richard L. Steiner, David B. Newell, J. Schwarz, Edwin R. Williams
The National Institute of Standards and Technology (NIST) watt balance experiment recently made a new determination of Planck's constant with a relative standard uncertainty of 87 x 10 -9 (k = 1), concurrently with an upper limit on the drift rate of the

1 Volt DC Programmable Josephson Voltage Standard System

June 1, 1999
Author(s)
Charles J. Burroughs, Samuel Benz, Todd E. Harvey, Clark A. Hamilton
NIST has developed a programmable Josephson voltage standard (JVS) that produces intrinsically stable voltages that are programmable from -1.1 V to +1.1 V.

Behavior of a Charged Two-Level Fluctuator in Al-AlO x -Al Single-Electron Transistor

June 1, 1999
Author(s)
M. Kenyon, J. L. Cobb, A. Amar, D. Song, C. J. Lobb, Neil M. Zimmerman, F. C. Wellstood
We have studied the behavior of a charged two-level fluctuator in an Al-AlO x -Al single-electron transistor (SET) in the normal state over a temperature range from 85 mK to 3K. The fluctuator caused the SET's island charge to shift by δQ0= 0.11 0.025 e
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