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PUBLICATIONS

Comparison of Quantum Hall Effect Resistance Standards of the NIST and the BIPM

Published

Author(s)

F. Delahay, Thomas J. Witt, Randolph Elmquist, Ronald F. Dziuba

Abstract

An on-site comparison of the quantum Hall effect (QHE) resistance standards of the National Institute of Standards and Technology (NIST) and of the Bureau International des Poids et Mesures (BIPM) was made in April 1999. Measurements of a 100 ω standard in terms of the recommended value of the von Klitzing constant RK-90 agreed to 12 parts in 1010 with a relative combined standard uncertainty uc = 20 x 10-10. Measurements of 10 000 ω and 100 ω/1 ω ratios agreed to 59 parts in 1010 with uc = 55 x 10-10 and 38 parts in 1010 with uc = 35 x 10-10, respectively.
Citation
Metrologia
Volume
37
Pub Type
Journals

Download Paper

Local Download

Keywords

electrical resistance, quantum Hall effect, international comparison
Electrical / electromagnetic metrology

Citation

Delahay, F. , Witt, T. , Elmquist, R. and Dziuba, R. (2000), Comparison of Quantum Hall Effect Resistance Standards of the NIST and the BIPM, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7317 (Accessed October 20, 2025)

Issues

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Created December 31, 1999, Updated October 12, 2021
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