Jargon, J.
, Marks, R.
and Rytting, D.
(1999),
Characterizing Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers, IEEE Transactions on Microwave Theory and Techniques
(Accessed May 30, 2023)
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Characterizing Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
Published
Author(s)
, , D. K. Rytting
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
47
Issue
10
Pub Type
Journals
Citation
Created September 30, 1999, Updated October 12, 2021