Jargon, J.
, Marks, R.
and Rytting, D.
(1999),
Characterizing Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers, IEEE Transactions on Microwave Theory and Techniques
(Accessed April 16, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Characterizing Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
Published
Author(s)
, , D. K. Rytting
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
47
Issue
10
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created September 30, 1999, Updated October 12, 2021