Jargon, J.
, Marks, R.
and Rytting, D.
(1999),
Characterizing Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers, IEEE Transactions on Microwave Theory and Techniques
(Accessed May 11, 2025)
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Characterizing Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
Published
Author(s)
, , D. K. Rytting
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
47
Issue
10
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 30, 1999, Updated October 12, 2021