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Interlaboratory Comparison of Josephson Voltage Standards (JVS) Between NIST and Lockheed Martin Astronautics (LMA)

Published

Author(s)

Yi-hua D. Tang, W. Wyatt Miller

Abstract

Two JVS systems operated at the NIST and LMA were compared by using four traveling Zener standards. A MAP protocol was adopted for the comparison. The mean difference between the measurements of the two laboratories was found to be 0.059 5V with an expanded uncertainty of 1 0.218 5V with 95% confidence.
Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
May 14-19, 2000
Conference Location
Sydney, 1, AS

Keywords

effective degrees of freedom, Josephson voltage standard, Measurement Assurance Program, uncertainty, Welch-Satterthwaite formula, Zener pressure correction

Citation

Tang, Y. and Miller, W. (2000), Interlaboratory Comparison of Josephson Voltage Standards (JVS) Between NIST and Lockheed Martin Astronautics (LMA), Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=4886 (Accessed April 20, 2024)
Created April 30, 2000, Updated October 12, 2021