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Electrical / electromagnetic metrology

News and Updates

Measuring Up: Coming Out from the Cold

Researchers at the National Institute of Standards and Technology (NIST) have constructed and tested a system that allows commercial electronic components –

Projects and Programs

Electronic Material Characterization

Ongoing
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Publications

Modern RF Measurements with Hot Atoms

Author(s)
Aly Artusio-Glimpse, Matt Simons, Nik Prajapati, Christopher L. Holloway
Over a hundred years later, the classic antenna, first invented by Heinrich Hertz, in 1888, [1], is still the dominant technology used for the measurement of RF

Tools and Instruments

Molecular Beam Epitaxy (MBE) Facility

The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor