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Chip-based devices known as frequency combs, which measure the frequency of light waves with unparalleled precision, have revolutionized time keeping, the
The Office of Weights and Measures (OWM) welcomes four 2023 NIST Summer Undergraduate Research Fellowship (SURF) Program research fellows to our Gaithersburg
Scope of Work: The primary goal of this effort is to develop and publish methods to establish traceability to the International System of Units (SI) for EVSE electrical metering and to ensure the accuracy within a specified uncertainty for economic and commercial purposes. These guidelines shall be
We have a number of opportunities to collaborate with us. See below for details. What does this project aim to do for the chemical industry? Many industrial processes depend on the intermolecular environment- the solvents and ions that surround a molecule. These interactions impact separations
The increasingly complex device requirements for next-generation computing architectures such as neuromorphic computing or nanoelectronic machine learning accelerators present challenges for researchers across the spectrum of institutions, from small businesses and universities to government
MBE System Our fabrication system is composed of ultra-high vacuum (UHV) chambers that support the in-vacuum exchange of 75 mm wafers without exposure to air as seen in Figure 1. These chambers are: (1) a deposition chamber with electron gun deposition, UHV compatible sputter guns, in situ shadow
We present a study of power spectral density (PSD) estimation from data sampled in the time domain. This work was motivated by our recent development of digital
S Norimoto, P See, N Schoinas, I Rungger, Tommy Boykin, Michael Stewart, J. P. Griffiths, C. Chen, D. A. Ritchie, M. Kataoka
Increasing electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of
Frank Seifert, Lorenz Keck, David B. Newell, Darine El Haddad
The National Institute of Standards and Technology (NIST) is building a robust open-source hardware and software Quantum Electro-Mechanical Metrology Suite
Description High-throughput (combinatorial) metrologies have evolved as a useful approach to rapidly determine the composition-structure-property relationships
Description The Seebeck coefficient is a widely measured transport property that provides fundamental information on charge carrier transport and the electronic
The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor