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In two new studies, researchers at the National Institute of Standards and Technology (NIST) have greatly improved the efficiency and power output of a series
Defective computer chips are the bane of the semiconductor industry. Even a seemingly minor flaw in a chip packed with billions of electrical connections might
A picture may be worth a thousand words, but for astronomers, simply recording images of stars and galaxies isn’t enough. To measure the true size and absolute
NIST’s Material Measurement Laboratory and Communications Technology Laboratory are developing a new spectroscopy for intermolecular interactions. The team is
With the rise of artificial intelligence and its insatiable demand for low-energy, high performance computing, research is accelerating into novel nanodevices
This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International
This project develops methods for very accurate measurements of thermal noise and provides support for such measurements in the communications and electronics
Aly Artusio-Glimpse, Christopher L. Holloway, Matt Simons, Nik Prajapati, Drew Rotunno, Samuel Berweger, Kaleb Campbell, Maitreyi Jayaseelan
Absolute electric field measurements present a "chicken-and-egg" situation where calibration of field probes relies on accurate knowledge of the field while
Elyse McEntee Wei, Richard Chamberlin, Nate Kilmer, Joshua Kast, Jake A. Connors, Dylan Williams
We describe a system for performing on-wafer vector-network-analyzer measurements from 100 MHz to 15 GHz at mK temperatures (i.e., less than 20 mK). We first
Linli Meng, Alireza Panna, Swapnil Mhatre, Albert Rigosi, Shamith Payagala, Dipanjan Saha, Ngoc Thanh Mai Tran, Ching-Chen Yeh, Randolph Elmquist, Angela R. Hight Walker, Dean G. Jarrett, David B. Newell, Yanfei Yang
Frank Seifert, Alireza Panna, Lorenz Keck, Leon Chao, Shamith Payagala, Dean G. Jarrett, Dipanjan Saha, Randolph Elmquist, Stephan Schlamminger, Albert Rigosi, David B. Newell, Darine El Haddad
The revision of the International System of Units (SI) on May 20th, 2019, has enabled new improved experiments to consolidate and simplify electrical and
Description High-throughput (combinatorial) metrologies have evolved as a useful approach to rapidly determine the composition-structure-property relationships
Description The Seebeck coefficient is a widely measured transport property that provides fundamental information on charge carrier transport and the electronic
The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor