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Metrology

Electrical / electromagnetic metrology

News and Updates

Projects and Programs

Schematic of digital impedance bridge.

Farad and Impedance Metrology

Ongoing
This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International

Thermal Noise Metrology

Ongoing
This project develops methods for very accurate measurements of thermal noise and provides support for such measurements in the communications and electronics

Publications

Rydberg Atoms for One-Step Traceability for Sensing Electric Fields

Author(s)
Aly Artusio-Glimpse, Christopher L. Holloway, Matt Simons, Nik Prajapati, Drew Rotunno, Samuel Berweger, Kaleb Campbell, Maitreyi Jayaseelan
Absolute electric field measurements present a "chicken-and-egg" situation where calibration of field probes relies on accurate knowledge of the field while

On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures

Author(s)
Elyse McEntee Wei, Richard Chamberlin, Nate Kilmer, Joshua Kast, Jake A. Connors, Dylan Williams
We describe a system for performing on-wafer vector-network-analyzer measurements from 100 MHz to 15 GHz at mK temperatures (i.e., less than 20 mK). We first

A Macroscopic Mass From Quantum Behavior In An Integrated Approach

Author(s)
Frank Seifert, Alireza Panna, Lorenz Keck, Leon Chao, Shamith Payagala, Dean G. Jarrett, Dipanjan Saha, Randolph Elmquist, Stephan Schlamminger, Albert Rigosi, David B. Newell, Darine El Haddad
The revision of the International System of Units (SI) on May 20th, 2019, has enabled new improved experiments to consolidate and simplify electrical and

Tools and Instruments

MBE Facility

Molecular Beam Epitaxy (MBE) Facility

The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor