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Projects/Programs

Displaying 1 - 24 of 24

AC-DC Difference

Ongoing
The NIST Ac-dc2 Difference Project performs leading edge measurement services and research for ac-dc difference measurements and dc voltage metrology. We

Advanced High Frequency Devices

Ongoing
The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at high

Advanced Materials Metrology

Ongoing
In this project we measure the fundamental electrical properties of materials from bulk to nanoscale from 1 MHz to 0.3 THz. Understanding the interaction of

Advanced Microwave Photonics

Ongoing
Research on quantum information (QI) seeks to control and exploit exotic properties of quantum mechanics, and researchers are already generating "unbreakable"

Amplifiers

Ongoing
To process quantum information it is important to have amplifiers with wide bandwidth, high dynamic range, and low noise.

Electronic Material Characterization

Ongoing
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Fabrication

Ongoing
The application of modern micro- and nanofabrication techniques to superconducting and cryogenic electronics is enabling new capabilities and applications.

Farad and Impedance Metrology

Ongoing
This project aims to provide the world's best basis for accurate impedance measurements by tying the U.S. legal system of electrical units to the International

Hierarchical Materials

Ongoing
Nature utilizes a hierarchy of length scales and tiered structure to build lightweight, strong, and tough materials. Engineers look to exploit the advantage of

High-Speed Electronics

Ongoing
This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of high-frequency

Metrology of the Ohm

Ongoing
Resistance standards traceable to NIST provide references for measurements of current at levels from 3000 A to below 20 fA and are used to support a wide

Nanoelectromagnetics

Ongoing
The core activities in this program are the development and application of metrology for quantitative characterization of hetero-structured materials and

Precision Materials for Quantum Devices

Ongoing
Tunnel junctions, single electron transistors and superconducting resonators are fabricated using ultra-high vacuum metals’ deposition and in situ low energy

Quantum Conductance

Ongoing
Graphene, the two-dimensional honeycomb carbon lattice isolated in 2004, has enabled significant advancement in a variety of subfields in physics due to its

Quantum Voltage Project

Ongoing
Goal: To develop Josephson voltage standard (JVS) systems to improve the dissemination of primary standards and the accuracy of voltage measurements from DC to

Quantum Waveform Metrology

Ongoing
Practically all measurable physical phenomena are eventually transformed into corresponding electrical representations. The transduction of a signal into its

Thermal Noise Metrology

Ongoing
This project develops methods for very accurate measurements of thermal noise and provides support for such measurements in the communications and electronics