U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Metrology

Electrical / electromagnetic metrology

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
Published Date
Displaying 251 - 275 of 470

An AC Josephson Source for Johnson Noise Thermometry

April 1, 2003
Author(s)
Samuel Benz, John M. Martinis, Paul Dresselhaus, Sae Woo Nam
We have adapted the Josephson arbitrary waveform synthesizer to create a quantized voltage noise source suitable for calibrating the cross-correlation electronics of a Johnson noise thermometer system. The requirements of long term stability and low

Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons with Conventional SIS Arrays

April 1, 2003
Author(s)
Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, Francois P. Piquemal, Ralf Behr, Charles J. Burroughs, H. Seppa
Three 1-V binary Josephson arrays developed by the NIST, the PTB, and the VTT, and using, respectively, superconductor-normal metal-superconductor (SNS), superconductor-insulator-normal metal-insulator-superconductor (SINIS), and externally shunted

A ratiometric method for Johnson noise thermometry using a quantized voltage noise source

January 1, 2003
Author(s)
Sae Woo Nam, Samuel Benz, John M. Martinis, Paul Dresselhaus, Weston L. Tew, David R. White
Johnson Noise Thermometry (JNT) involves the measurement of the statistical variance of a fluctuating voltage across a resistor in thermal equilibrium. Modern digital techniques make it now possible to perform many functions required for JNT in highly

Multiline TRL Revealed

December 5, 2002
Author(s)
Donald C. DeGroot, Jeffrey Jargon, Roger Marks
We reveal the techniques behind a successful implementation of the Multiline TRL calibration for vector network analyzers (VNAs). For the first time, this paper describes the inner workings of NIST's Multical software, an evolved, automated implementation

Stacked Nanoscale Josephson Junction Arrays for High-Performance Voltage Standards

December 4, 2002
Author(s)
Samuel Benz, Paul Dresselhaus, Yonuk Chong, Charles J. Burroughs
Superconducting Josephson voltage standard systems have replaced electrochemical cell (battery-like) artifact standards for voltage metrology because quantum-based systems produce precise and accurate voltages independent of any material parameters. The

Applications of Calibration Comparison in On-wafer Measurement

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams
In this paper we discuss several applications of calibration comparison in on-wafer measurement. This technique can be understood as an abstraction of the well-known two-tier deembedding scheme used in test-fixture characterization. The applications

Characteristic Impedance Measurement of Planar Transmission Lines

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and

Vector Corrected Noise Temperature Measurements

June 7, 2002
Author(s)
Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James P. Randa
A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using isolators

Error Measurements and Analysis for an AC Josephson Voltage Standard

June 1, 2002
Author(s)
Charles J. Burroughs, Samuel Benz, Paul Dresselhaus
The Josephson arbitrary waveform synthesizer can be used as a precision voltage source for both ac and dc signals. Recent improvements in circuit designs have have resulted in output voltages greater than 100 mV so that we can investigate ac metrology

All-NbN Digital-to-Analog Converters for a Programmable Voltage Standard

November 21, 2001
Author(s)
Hirotake Yamamori, M. Itoh, H. Sasaki, A. Shoji, Samuel Benz, Paul Dresselhaus
Five-bit all-NbN digital-to-analog converters (DACs) for a programmable voltage standard have been fabricated using NbN/TiNx/NbN Josephson junctions and their operation has been demonstrated. The DAC consists of six arrays of 128, 128, 256, 512, 1024 and

Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines

October 1, 2001
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study

Novel High-Voltage Range Resistors for Ac-DC Thermal Converters

July 1, 2001
Author(s)
H. O. Wolcott, Joseph R. Kinard Jr., Thomas E. Lipe Jr.
This paper discusses the factors contributing to the ac-dc differences of high-voltage thermal converters. A novel resistor designed to minimize these contributions is described and measurements illustrating its performance are summarized.

Recent Developments in the NIST Cryogenic Thermal Transfer Standard Project

July 1, 2001
Author(s)
Thomas E. Lipe Jr., Joseph R. Kinard Jr., Carl D. Reintsema
We describe the development of a cryogenic thermal transfer standard (CTTS) from the first prototype in 1997 to the present version. A description of the superconducting transition-edge sensor (TES) and the development of a superconducting input

SI Traceability of Force at the Nanonewton Level

July 1, 2001
Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L. A. Feeney, Edwin R. Williams
Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI) below one newton. The National Institute of Standards and Technology has launched a five-year

Comparison Between the SNS and SIS Josephson Voltage Standards at OFMET

April 1, 2001
Author(s)
Blaise Jeanneret, Alain Rufenacht, Charles J. Burroughs
Recently, a new Josephson voltage standard based on a lV programmable chip provided by the National Institute of Standards and Technology (NIST) was impemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson
Was this page helpful?