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Metrology

Electrical / electromagnetic metrology

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Displaying 251 - 275 of 458

Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines

October 1, 2001
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study

Novel High-Voltage Range Resistors for Ac-DC Thermal Converters

July 1, 2001
Author(s)
H. O. Wolcott, Joseph R. Kinard Jr., Thomas E. Lipe Jr.
This paper discusses the factors contributing to the ac-dc differences of high-voltage thermal converters. A novel resistor designed to minimize these contributions is described and measurements illustrating its performance are summarized.

Recent Developments in the NIST Cryogenic Thermal Transfer Standard Project

July 1, 2001
Author(s)
Thomas E. Lipe Jr., Joseph R. Kinard Jr., Carl D. Reintsema
We describe the development of a cryogenic thermal transfer standard (CTTS) from the first prototype in 1997 to the present version. A description of the superconducting transition-edge sensor (TES) and the development of a superconducting input

SI Traceability of Force at the Nanonewton Level

July 1, 2001
Author(s)
David B. Newell, Jon R. Pratt, John A. Kramar, Douglas T. Smith, L. A. Feeney, Edwin R. Williams
Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI) below one newton. The National Institute of Standards and Technology has launched a five-year

Comparison Between the SNS and SIS Josephson Voltage Standards at OFMET

April 1, 2001
Author(s)
Blaise Jeanneret, Alain Rufenacht, Charles J. Burroughs
Recently, a new Josephson voltage standard based on a lV programmable chip provided by the National Institute of Standards and Technology (NIST) was impemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson

Recent Advances in Ac-dc Transfer Measurements Using Thin-Film Thermal Converters

January 1, 2001
Author(s)
Thomas F. Wunsch, Joseph R. Kinard Jr., Ronald R. Manginell, Thomas E. Lipe Jr., O. P. Solomon, K. C. Jungling
New standards for ac current and voltage measurements, thin-film multijunction thermal converters (MJTCs), have been fabricated using thin-film and micro-electro-mechanical systems (MEMS) technology. Improved sensitivity and accuracy over single-junction

The Ampere and Electrical Standards

January 1, 2001
Author(s)
Randolph Elmquist, Marvin E. Cage, Yi-hua D. Tang, Anne-Marie Jeffery, Joseph R. Kinard Jr., Ronald F. Dziuba, Nile M. Oldham, Edwin R. Williams
This paper describes some of the major contributions to metrology and physics made by the NIST Electricity Division, which has existed since 1901. It was one of the six original divisions of the National Bureau of Standards. The Electricity Division

Radiated Power Measurements in Reverberation Chambers

December 1, 2000
Author(s)
Galen H. Koepke, John M. Ladbury
The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The chamber is also effective as a method to quantify the total radiated power from an emitter

1 Volt Josephson Fast Reversed DC Source

May 1, 2000
Author(s)
Charles J. Burroughs, Samuel Benz, Todd E. Harvey, H. Sasaki
We have made several improvements to the NIST Josephson FRDC (fast reversed dc) source so that it now operates at 1 Volt. We have made a precision comparison to a conventional semiconductor FRDC source by measuring the thermoelectric transfer difference of
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