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Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices
Published
Author(s)
Ali L. Eichenberger, Mark W. Keller, John M. Martinis, Neil M. Zimmerman
Abstract
A new type of capacitance standrd based on counting electrons has been built. The operation of the standrd has already given very promising results for the determination of the value of a cryogenic vacuum-gap capacitor. The new capacitance standard operates at an effective frequency close to dc, whereas capacitance metrology usually implies the use of bridges operating at a fixed frequency around 1 kHz. Therefore, the frequency dependence of the cryogenic capacitor is critical to the practical application of this standard. We present measurements of this frequency dependence using a technique that involves the same single electron tunneling devices used in the capacitance standard.
Eichenberger, A.
, Keller, M.
, Martinis, J.
and Zimmerman, N.
(2000),
Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices, Journal of Low Temperature Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5874
(Accessed October 12, 2025)