Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices

Published

December 1, 2000

Author(s)

Ali L. Eichenberger, Mark W. Keller, John M. Martinis, Neil M. Zimmerman

Abstract

A new type of capacitance standrd based on counting electrons has been built. The operation of the standrd has already given very promising results for the determination of the value of a cryogenic vacuum-gap capacitor. The new capacitance standard operates at an effective frequency close to dc, whereas capacitance metrology usually implies the use of bridges operating at a fixed frequency around 1 kHz. Therefore, the frequency dependence of the cryogenic capacitor is critical to the practical application of this standard. We present measurements of this frequency dependence using a technique that involves the same single electron tunneling devices used in the capacitance standard.

Citation

Journal of Low Temperature Physics

Volume

118

Issue

5/6

Pub Type

Journals

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Keywords

compacitance standard, cryogenic capacitor, cryogenic vacuum-gap capacitor

Citation

Eichenberger, A. , Keller, M. , Martinis, J. and Zimmerman, N. (2000), Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices, Journal of Low Temperature Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5874 (Accessed October 20, 2025)