Pratt, J.
, Newell, D.
, Williams, E.
, Smith, D.
and Kramar, J.
(2001),
Towards a Traceable Nanoscale Force Standard, Proc. 2nd Intl. Conf. European Soc. for Precision Engineering and Nanotechnology (EUSPEN), Undefined
(Accessed April 19, 2024)
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Towards a Traceable Nanoscale Force Standard
Published
Author(s)
, , , ,
Proceedings Title
Proc. 2nd Intl. Conf. European Soc. for Precision Engineering and Nanotechnology (EUSPEN)
Conference Location
Undefined
Pub Type
Conferences
Citation
Created April 30, 2001, Updated October 12, 2021