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Towards a Traceable Nanoscale Force Standard

Published

Author(s)

Jon R. Pratt, David B. Newell, Edwin R. Williams, Douglas T. Smith, John A. Kramar
Proceedings Title
Proc. 2nd Intl. Conf. European Soc. for Precision Engineering and Nanotechnology (EUSPEN)
Conference Location
Undefined

Citation

Pratt, J. , Newell, D. , Williams, E. , Smith, D. and Kramar, J. (2001), Towards a Traceable Nanoscale Force Standard, Proc. 2nd Intl. Conf. European Soc. for Precision Engineering and Nanotechnology (EUSPEN), Undefined (Accessed February 28, 2024)
Created April 30, 2001, Updated October 12, 2021