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Metrology

Electrical / electromagnetic metrology

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Displaying 226 - 250 of 458

Nonequilibrium Quasiparticles and Periodicity in Single-Cooper-Pair Transistors

February 13, 2004
Author(s)
Joe Aumentado, Mark W. Keller, John M. Martinis, Michel H. Devoret
We have made single-Cooper-pair transistors in which we control the spatial profile of the superconducting gap energy by oxygen doping. The profile dramatically affects the switching current vs. gate voltage curve of the transistor, changing its period

Time-Domain Measurements of Radiated and Conducted Ultrawideband Emissions

November 16, 2003
Author(s)
Robert T. Johnk, David R. Novotny, Chriss A. Grosvenor, Seturnino Canales, Jason Veneman
This paper summarizes results obtained from time-domain full-bandwidth emissions measurements of selected ultrawideband (UWB) transmitting devices. Brief descriptions of two NIST-developed measurement systems are provided. High-fidelity time-domain

Expanding Definitions of Gain by Taking Harmonic Content into Account

September 1, 2003
Author(s)
Jeffrey Jargon, Kuldip Gupta, Alessandro Cidronali, Donald C. DeGroot
We expand the definitions of power gain, transducer gain, and available gain by taking harmonic content into account. Furthermore, we show that under special conditions, these expanded definitions of gain can be expressed in terms of nonlinear large-signal

A Bridge for Scaling to Higher Resistance from the QHR

August 21, 2003
Author(s)
Randolph Elmquist, Dean G. Jarrett
A two-terminal bridge for resistance scaling directly from the quantum Hall resistance (QHR) to higher-resistance values now provides a secondary starting point in decade scaling at NIST, beginning at the 1 M(Ohm) resistance level. This cryogenic bridge

Stacked SNS Josephson Junctions for Quantum Voltage Applications

July 11, 2003
Author(s)
Paul Dresselhaus, Yonuk Chong, Samuel Benz
NIST is using SNS Josephson junctions as the basis of quantum voltage metrology. Planar junction technology limits the voltage and bandwidth of these systems due to parasitic inductances and the transit time of waveforms through the transmission line. By

4K Cryocooler Implementation of a DC Programmable Voltage Standard

June 1, 2003
Author(s)
Charles J. Burroughs, Robert J. Webber, Paul Dresselhaus, Samuel Benz
NIST and Hypres, Inc. have been collaborating to develop a 1 Volt DC programmable Josephson voltage standard (PJVS) that operates on a closed-cycle refrigerator. The goal of this work is to construct a platform that will allow the chip to work at 4 K

Stacked SNS Josephson Junction Arrays for Quantum Voltage Standards

June 1, 2003
Author(s)
Paul Dresselhaus, Yonuk Chong, J. Plantenberg, Samuel Benz
NIST is using and developing superconductor-normal metal-superconductor (SNS) Josephson arrays for both programmable DC and AC voltage standards. Increasing the output voltage is difficult because the output voltage per junction is small; hence series

VNA Calibration Software Manual

June 1, 2003
Author(s)
Dylan Williams, Jack Wang, Uwe Arz
This software algorithm combines a decade of experience in applying orthogonal distance regression and other iterative techniques to solving vector-network-analyzer (VNA) calibrations. The new software features a robust algorithm capable of finding

The IEEE Standard on Transitions, Pulses, and Related Waveforms, Std-181

May 1, 2003
Author(s)
Nicholas Paulter, Donald R. Larson, Jerome J. Blair
The IEEE has revised the now withdrawn IEEE standards on pulse techniques and definitions. This revision includes adding and deleting definitions, clarifying existing definitions, providing examples of different waveform types, updating text to reflect

AC Josephson Voltage Standard Error Measurements and Analysis

April 1, 2003
Author(s)
Charles J. Burroughs, Samuel Benz, Paul Dresselhaus
The Josephson arbitrary waveform synthesizer can be used as a precision voltage source for both ac and dc signals. Recent improvements in circuit designs have resulted in output voltages greater than 100 mVrms so that we can investigate ac metrology

An AC Josephson Source for Johnson Noise Thermometry

April 1, 2003
Author(s)
Samuel Benz, John M. Martinis, Paul Dresselhaus, Sae Woo Nam
We have adapted the Josephson arbitrary waveform synthesizer to create a quantized voltage noise source suitable for calibrating the cross-correlation electronics of a Johnson noise thermometer system. The requirements of long term stability and low

Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons with Conventional SIS Arrays

April 1, 2003
Author(s)
Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, Francois P. Piquemal, Ralf Behr, Charles J. Burroughs, H. Seppa
Three 1-V binary Josephson arrays developed by the NIST, the PTB, and the VTT, and using, respectively, superconductor-normal metal-superconductor (SNS), superconductor-insulator-normal metal-insulator-superconductor (SINIS), and externally shunted

A ratiometric method for Johnson noise thermometry using a quantized voltage noise source

January 1, 2003
Author(s)
Sae Woo Nam, Samuel Benz, John M. Martinis, Paul Dresselhaus, Weston L. Tew, David R. White
Johnson Noise Thermometry (JNT) involves the measurement of the statistical variance of a fluctuating voltage across a resistor in thermal equilibrium. Modern digital techniques make it now possible to perform many functions required for JNT in highly

Multiline TRL Revealed

December 5, 2002
Author(s)
Donald C. DeGroot, Jeffrey Jargon, Roger Marks
We reveal the techniques behind a successful implementation of the Multiline TRL calibration for vector network analyzers (VNAs). For the first time, this paper describes the inner workings of NIST's Multical software, an evolved, automated implementation

Stacked Nanoscale Josephson Junction Arrays for High-Performance Voltage Standards

December 4, 2002
Author(s)
Samuel Benz, Paul Dresselhaus, Yonuk Chong, Charles J. Burroughs
Superconducting Josephson voltage standard systems have replaced electrochemical cell (battery-like) artifact standards for voltage metrology because quantum-based systems produce precise and accurate voltages independent of any material parameters. The

Applications of Calibration Comparison in On-wafer Measurement

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams
In this paper we discuss several applications of calibration comparison in on-wafer measurement. This technique can be understood as an abstraction of the well-known two-tier deembedding scheme used in test-fixture characterization. The applications

Characteristic Impedance Measurement of Planar Transmission Lines

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and

Vector Corrected Noise Temperature Measurements

June 7, 2002
Author(s)
Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James P. Randa
A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using isolators

Error Measurements and Analysis for an AC Josephson Voltage Standard

June 1, 2002
Author(s)
Charles J. Burroughs, Samuel Benz, Paul Dresselhaus
The Josephson arbitrary waveform synthesizer can be used as a precision voltage source for both ac and dc signals. Recent improvements in circuit designs have have resulted in output voltages greater than 100 mV so that we can investigate ac metrology

All-NbN Digital-to-Analog Converters for a Programmable Voltage Standard

November 21, 2001
Author(s)
Hirotake Yamamori, M. Itoh, H. Sasaki, A. Shoji, Samuel Benz, Paul Dresselhaus
Five-bit all-NbN digital-to-analog converters (DACs) for a programmable voltage standard have been fabricated using NbN/TiNx/NbN Josephson junctions and their operation has been demonstrated. The DAC consists of six arrays of 128, 128, 256, 512, 1024 and
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