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Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons with Conventional SIS Arrays

Published

Author(s)

Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, Francois P. Piquemal, Ralf Behr, Charles J. Burroughs, H. Seppa

Abstract

Three 1-V binary Josephson arrays developed by the NIST, the PTB, and the VTT, and using, respectively, superconductor-normal metal-superconductor (SNS), superconductor-insulator-normal metal-insulator-superconductor (SINIS), and externally shunted superconductor-insulator-superconductor (es-SIS) Josephson junctions, have been tested at BNM-LNE. The arrays have been found to work properly. Results from direct comparisons with conventional SIS arrays show a good agreement with deviations of less than 0.5 nV at any nominal voltage between 41 mV and 1.3 V.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
52
Issue
2

Keywords

binary Josephson arrays, electrical measurements, programmable voltage standard

Citation

Lo-Hive, J. , Djordjevic, S. , Cancela, P. , Piquemal, F. , Behr, R. , Burroughs, C. and Seppa, H. (2003), Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons with Conventional SIS Arrays, IEEE Transactions on Instrumentation and Measurement (Accessed June 25, 2024)

Issues

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Created March 31, 2003, Updated October 12, 2021