Lo-Hive, J.
, Djordjevic, S.
, Cancela, P.
, Piquemal, F.
, Behr, R.
, Burroughs, C.
and Seppa, H.
(2003),
Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons with Conventional SIS Arrays, IEEE Transactions on Instrumentation and Measurement
(Accessed April 19, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons with Conventional SIS Arrays
Published
Author(s)
Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, Francois P. Piquemal, Ralf Behr, , H. Seppa
Abstract
Three 1-V binary Josephson arrays developed by the NIST, the PTB, and the VTT, and using, respectively, superconductor-normal metal-superconductor (SNS), superconductor-insulator-normal metal-insulator-superconductor (SINIS), and externally shunted superconductor-insulator-superconductor (es-SIS) Josephson junctions, have been tested at BNM-LNE. The arrays have been found to work properly. Results from direct comparisons with conventional SIS arrays show a good agreement with deviations of less than 0.5 nV at any nominal voltage between 41 mV and 1.3 V.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
52
Issue
2
Pub Type
Journals
Keywords
binary Josephson arrays, electrical measurements, programmable voltage standard
Citation
Created March 31, 2003, Updated October 12, 2021