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Stacked SNS Josephson Junctions for Quantum Voltage Applications
Published
Author(s)
Paul Dresselhaus, Yonuk Chong, Samuel Benz
Abstract
NIST is using SNS Josephson junctions as the basis of quantum voltage metrology. Planar junction technology limits the voltage and bandwidth of these systems due to parasitic inductances and the transit time of waveforms through the transmission line. By using stacked junctions, we are able to pack junctions more closely in a transmission line, while maintaining the uniformity needed for voltage standard applications. We discuss the technological advantages in stacking multiple junctions and present data from stacked junctions. The normal metal used for these stacked junction arrays is MoSi2. Stacked junctions using this barrier material have demonstrated excellent uniformity and similar etch characteristics to niobium. We present measurements of synthesized ac waveforms made with arrays of double junction stacks.
Dresselhaus, P.
, Chong, Y.
and Benz, S.
(2003),
Stacked SNS Josephson Junctions for Quantum Voltage Applications, Ext. Abstracts, 2003 Intl. Superconductive Electronics Conf. (ISEC), Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31365
(Accessed October 10, 2025)